Abstract: A method for determining the operating state of a light-emitting implant implanted in the brain of a living being, the light-emitting implant including a light source responsible for emitting light into the brain of the living being, the method using a diagnosing device that includes a receiver of a light signal transmitted through a first eye of the living being and a device for determining the operating state of the light-emitting implant based on the received transmitted light signal.

Abstract: A method of investigating a specimen using X-ray tomography, comprising (a) mounting the specimen to a specimen holder, (b) irradiating the specimen with a beam of X-rays along a first line of sight through the specimen, and (c) detecting a flux of X-rays transmitted through the specimen and forming a first image. Then (d) repeating the steps (b) and (c) for a series of different lines of sight through the specimen, thereby producing a corresponding series of images.

Abstract: A method of investigating a specimen using X-ray tomography, comprising (a) mounting the specimen to a specimen holder, (b) irradiating the specimen with a beam of X-rays along a first line of sight through the specimen, and (c) detecting a flux of X-rays transmitted through the specimen and forming a first image. Then (d) repeating the steps (b) and (c) for a series of different lines of sight through the specimen, thereby producing a corresponding series of images.

Abstract: Method of determining a rotation axis of an object during acquisition of projections obtained by a tomography characterization system, comprising the following steps, starting from said projections: Select zones on the projections along the presumed rotation axis; Reconstruct a structure of the object using data in the selected zones, Make reprojections of the reconstruction; Determine a total offset for each selected zone; Determine the real rotation axis using total offsets determined for all zones.

Abstract: In the field of resolution test charts for analysis of the resolution of X-ray tomography systems, a test chart comprises a substrate bearing X-ray absorbent zones, with widths and spacings to allow measurement of the system resolution. To avoid shadow effects when the X-ray illumination beam is divergent and when the absorbent zones have a large height/width ratio (from 2 to 5 for example), the absorbent zones in the diverse points of the pattern have a shape of which a general direction of elevation with respect to the surface of the substrate is rotated toward a point of convergence which is the same for all absorbent zones. The X-ray source is placed at the convergence point, eliminating shadow effects. The oblique elevation can be obtained by specific etching steps, or curvature of the substrate after fabrication of the absorbent patterns, or else by use of two superimposed partial test charts.

Abstract: Method of determining a rotation axis of an object during acquisition of projections obtained by a tomography characterisation system, comprising the following steps, starting from said projections: Select zones on the projections along the presumed rotation axis; Reconstruct a structure of the object using data in the selected zones, Make reprojections of the reconstruction; Determine a total offset for each selected zone; Determine the real rotation axis using total offsets determined for all zones.

Abstract: A source of X-rays, and imaging device, and an imaging process are provided, including a source of electrons generating an electron beam of nanometric size and a target, the target being designed to send out an X-ray beam upon illumination by the electron beam, the target including one nanowire, for example made of silicon, and a nanowire catalyst, for example made of gold, covering the free end of the nanowire.

Abstract: In the field of resolution test charts for analysis of the resolution of X-ray tomography systems, a test chart comprises a substrate bearing X-ray absorbent zones, with widths and spacings to allow measurement of the system resolution. To avoid shadow effects when the X-ray illumination beam is divergent and when the absorbent zones have a large height/width ratio (from 2 to 5 for example), the absorbent zones in the diverse points of the pattern have a shape of which a general direction of elevation with respect to the surface of the substrate is rotated toward a point of convergence which is the same for all absorbent zones. The X-ray source is placed at the convergence point, eliminating shadow effects. The oblique elevation can be obtained by specific etching steps, or curvature of the substrate after fabrication of the absorbent patterns, or else by use of two superimposed partial test charts.

Abstract: An imaging system intended for imaging fast-moving objects, comprising an X-ray source, a scintillating screen, a shutter and a detector of the beam emitted by the shutter, and a processing unit connected to the detector, where the shutter is positioned between the scintillator screen and the detector, and a support for the object to be observed is positioned downstream from the X-ray source and upstream from the scintillator screen, where the shutter is a shutter which can be controlled at high frequencies, for example higher than approximately 1 kHz, where the shutter is fixed and the transmission of the signal originating from the scintillator screen towards the detector is controlled by electrical polarization means controlled by a control unit.

Abstract: Source of X-rays comprising a source of electrons generating an electron beam of nanometric size and a target, the target being designed to send out an X-ray beam by illumination by the electron beam, the target comprising one nanowire, for example made of silicon, and a nanowire catalyst, for example made of gold, covering the free end of the nanowire.

Abstract: The invention relates to a tomosynthesis method by illuminating an object by means of an X-ray source (1) with a linear trajectory (2), the method comprising breaking down a volume of the object into N fanned out planes (P) formed between the linear trajectory (2) and a detecting plane (4) parallel to the linear trajectory, each fanned out plane of said N planes includes the linear trajectory; and performing anisotropic regularization on at least one fanned out plane (P).

Abstract: An imaging system intended for imaging fast-moving objects, comprising an X-ray source, a scintillating screen, a shutter and a detector of the beam emitted by the shutter, and a processing unit connected to the detector, where the shutter is positioned between the scintillator screen and the detector, and a support for the object to be observed is positioned downstream from the X-ray source and upstream from the scintillator screen, where the shutter is a shutter which can be controlled at high frequencies, for example higher than approximately 1 kHz, where the shutter is fixed and the transmission of the signal originating from the scintillator screen towards the detector is controlled by electrical polarisation means controlled by a control unit.

Abstract: A method for measuring the orientation and deviatoric elastic strain of the crystal lattice of grains contained in a sample of polycrystalline material comprising a set of grains (G1, . . . Gi, . . . , Gn) comprises recording a series of Laue patterns and an operation for deinterlacing said Laue patterns, which deinterlacing operation may advantageously be combined with a tomography operation so as to furthermore identify the spatial extent of said grains.

Abstract: The invention relates to a tomosynthesis method by illuminating an object by means of an X-ray source (1) with a linear trajectory (2), the method comprising a breakdown step into n planes (P) fanning out between the linear trajectory (2) and a detector plane (4) parallel to the linear trajectory. The method comprises an anisotropic regularization step over at least one plane (P). The invention is applied to medical imaging, to the field of non-destructive object testing, and more generally to any field applying reconstruction of objects moving past an X-ray source.