Patents by Inventor Pierre CERVENKA

Pierre CERVENKA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for determining a location of a reflecting scatterer in a medium
    Patent number: 10042052
    Abstract: A method for determining a location of a reflecting scatterer (S) in a medium (M) including a transmitting step in which a transducer (4) emits a transmit wave (T), a receiving step in which a receive array (3) provide transducer signals in response to a reflected wave (R), a beam forming step in which beam formed signals are computed, an interferometric processing step during which a complex interferometric signal is determined as a function of products of beam formed signals and conjugate of beam formed signals and a location determining step in which interferometric beam samples are selected from the complex interferometric signal, based on their complex arguments. The selected interferometric beam samples are indicatives of the location of the reflecting scatterer (S).
    Type: Grant
    Filed: August 1, 2014
    Date of Patent: August 7, 2018
    Assignees: UNIVERSITE PIERRE ET MARIE CURIE (PARIS 6), CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE—CNRS
    Inventor: Pierre Cervenka
  • METHOD AND SYSTEM FOR DETERMINING A LOCATION OF A REFLECTING SCATTERER IN A MEDIUM
    Publication number: 20160187480
    Abstract: A method for determining a location of a reflecting scatterer (S) in a medium (M) including a transmitting step in which a transducer (4) emits a transmit wave (T), a receiving step in which a receive array (3) provide transducer signals in response to a reflected wave (R), a beam forming step in which beam formed signals are computed, an interferometric processing step during which a complex interferometric signal is determined as a function of products of beam formed signals and conjugate of beam formed signals and a location determining step in which interferometric beam samples are selected from the complex interferometric signal, based on their complex arguments. The selected interferometric beam samples are indicatives of the location of the reflecting scatterer (S).
    Type: Application
    Filed: August 1, 2014
    Publication date: June 30, 2016
    Inventor: Pierre CERVENKA