Patents by Inventor Pierre Langlois
Pierre Langlois has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10156548Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.Type: GrantFiled: July 31, 2013Date of Patent: December 18, 2018Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
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Publication number: 20180113100Abstract: Disclosed is an assisted analysis unit for facilitating phased array defect inspection. The analysis unit comprises an identification & merging module, and a sizing module. The modules are capable of displaying defect contours from multiple groups of indications, and of recommending defect merging candidates and defect sizing methods. However both modules also accept user input so that the final decisions rest with the operator.Type: ApplicationFiled: October 25, 2016Publication date: April 26, 2018Applicant: Olympus Scientific Solutions Americas Inc.Inventors: Martin St-Laurent, Jason Habermehl, Pierre Langlois, Benoit Lepage
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Patent number: 9638673Abstract: Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.Type: GrantFiled: October 18, 2012Date of Patent: May 2, 2017Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.Inventors: Pierre Langlois, Benoit Cournoyer
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Publication number: 20150039245Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.Type: ApplicationFiled: July 31, 2013Publication date: February 5, 2015Applicant: OLYMPUS NDT INC.Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
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Patent number: 8904872Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.Type: GrantFiled: December 29, 2010Date of Patent: December 9, 2014Assignee: Olympus NDTInventors: Pierre Langlois, Michael Drummy
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Publication number: 20140109675Abstract: Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.Type: ApplicationFiled: October 18, 2012Publication date: April 24, 2014Applicant: OLYMPUS NDT, INC.Inventors: Pierre Langlois, Benoit Cournoyer
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Patent number: 8371151Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.Type: GrantFiled: December 29, 2010Date of Patent: February 12, 2013Assignee: Olympus NDTInventors: Pierre Langlois, Michael Drummy
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Patent number: 8033172Abstract: The present invention relates to a flaw detector imaging apparatus for detecting and visualizing a flaw in a target material to be investigated, comprising an ultrasonic phase-array probe comprising an array of ultrasonic transducers and a flaw detector. The flaw detector includes at least one trigger channel to trigger ultrasonic emitting transducers of the array at respective time delays to produce an ultrasonic beam propagating through the target material, and a single receiver channel to receive echo signals produced by ultrasonic receiving transducers of the array in response to ultrasonic wave echoes reflected from a flaw in the target material. The single receiver channel comprises a delay circuit imparting to the received echo signals the respective time delays as used in the triggering of the ultrasonic emitting transducers and a combiner of the delayed echo signals.Type: GrantFiled: July 21, 2008Date of Patent: October 11, 2011Assignee: Olympus NDTInventors: Pierre Langlois, Agostino Abatte, Josefina R. Quiles, legal representative
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Patent number: 7958769Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.Type: GrantFiled: February 14, 2006Date of Patent: June 14, 2011Assignee: Olympus NDTInventors: Pierre Langlois, Michael Drummy
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Publication number: 20110100089Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.Type: ApplicationFiled: December 29, 2010Publication date: May 5, 2011Applicant: OLYMPUS NDTInventors: Pierre Langlois, Michael Drummy
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Publication number: 20110094304Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.Type: ApplicationFiled: December 29, 2010Publication date: April 28, 2011Applicant: OLYMPUS NDTInventors: Pierre Langlois, Michael Drummy
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Patent number: 7817076Abstract: A multiple mode digitization system for a non-destructive inspection instrument which makes use of a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from a plurality of inputs. In the preferred embodiment, each of the analog to digital converters in the system is driven with an independent and separate clock signal, allowing for propagation delay compensation among the plurality of test signals as well as interleaved sampling such that custom sampling rates can be used for each input without the need for more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are used only for interleave sampling, and digital filters are used to provide signal propagation delay compensation.Type: GrantFiled: August 15, 2008Date of Patent: October 19, 2010Assignee: Olympus NDTInventors: Michael Drummy, Andrew Thomas, Denys Laquerre, David Larochelle, Pierre Langlois, Steven Besser
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Publication number: 20090091318Abstract: A phased scanning method and phased scan eddy current array probe suitable for in-situ eddy current inspection of a structure without mechanical scanning. Overlapping subsets of the sensor elements within the array probe are dynamically connected in series and sequentially scanned to simulate the mechanical motion of a conventional array probe along a test surface. An algorithm to effectively balance the scan data is provided which comprises obtaining a reference scan at the time of probe installation, storing the measurement data from this reference scan in a memory device located within the probe, subtracting this reference curve from the curve obtained by all subsequent measurement scans to produce an adjusted curve, and processing the resulting adjusted curve through a high pass filter. A technique for verifying sensor elements of an eddy current array probe after permanent or semi-permanent installation against a test structure is also provided.Type: ApplicationFiled: September 9, 2008Publication date: April 9, 2009Inventors: Benoit Lepage, Pierre Langlois, Michael Drummy
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Publication number: 20090045994Abstract: A multiple mode digitization system for a non-destructive inspection instrument which makes use of a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from a plurality of inputs. In the preferred embodiment, each of the analog to digital converters in the system is driven with an independent and separate clock signal, allowing for propagation delay compensation among the plurality of test signals as well as interleaved sampling such that custom sampling rates can be used for each input without the need for more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are used only for interleave sampling, and digital filters are used to provide signal propagation delay compensation.Type: ApplicationFiled: August 15, 2008Publication date: February 19, 2009Inventors: Michael DRUMMY, Andrew THOMAS, Denys LAQUERRE, David LAROCHELLE, Pierre LANGLOIS, Steven BESSER
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Publication number: 20080314153Abstract: The present invention relates to a flaw detector imaging apparatus for detecting and visualizing a flaw in a target material to be investigated, comprising an ultrasonic phase-array probe comprising an array of ultrasonic transducers and a flaw detector. The flaw detector includes at least one trigger channel to trigger ultrasonic emitting transducers of the array at respective time delays to produce an ultrasonic beam propagating through the target material, and a single receiver channel to receive echo signals produced by ultrasonic receiving transducers of the array in response to ultrasonic wave echoes reflected from a flaw in the target material. The single receiver channel comprises a delay circuit imparting to the received echo signals the respective time delays as used in the triggering of the ultrasonic emitting transducers and a combiner of the delayed echo signals.Type: ApplicationFiled: July 21, 2008Publication date: December 25, 2008Applicant: OLYMPUS NDTInventors: Pierre Langlois, Agostino Abatte, Josefina R. Quiles
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Publication number: 20070034010Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.Type: ApplicationFiled: February 14, 2006Publication date: February 15, 2007Applicant: Olympus NDTInventors: Pierre Langlois, Michael Drummy
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Publication number: 20060254359Abstract: The present invention relates to a flaw detector imaging apparatus for detecting and visualizing a flaw in a target material to be investigated, comprising an ultrasonic phase-array probe comprising an array of ultrasonic transducers and a flaw detector. The flaw detector includes at least one trigger channel to trigger ultrasonic emitting transducers of the array at respective time delays to produce an ultrasonic beam propagating through the target material, and at least one receiver channel to receive echo signals produced by ultrasonic receiving transducers of the array in response to ultrasonic wave echoes reflected from a flaw in the target material. The receiver channel comprises a delay circuit imparting to the received echo signals the respective time delays as used in the triggering of the ultrasonic emitting transducers and a combiner of the delayed echo signals.Type: ApplicationFiled: January 17, 2006Publication date: November 16, 2006Inventors: Pierre Langlois, Agostino Abatte, Josefina Quiles
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Patent number: 6657573Abstract: A phase-to-sinusoid-amplitude conversion system and method for use in, for example, direct digital frequency synthesizer applications. The system and method convert phase data to signal amplitude data using an approximation of the first quadrant of a sine function using a plurality of linear line segments of preferably equal length. Each segment is defined with a lower horizontal-axis bound; a lower vertical-axis bound; and a slope represented as a sum of a plurality of slope elements. Based on the approximation and for a given phase angle a set of values are evaluated, for each linear line segment, representing a product of (i) a horizontal displacement representing a difference between the prescribed phase angle and the lower horizontal-axis bound xi of a selected linear line segment where, for example, xi<X<xi+1 and (ii) each one of the slope elements of the selected linear line segment.Type: GrantFiled: August 14, 2002Date of Patent: December 2, 2003Assignee: Her Majesty the Queen in right of Canada, as represented by the Minister of National DefenceInventors: Joseph Mathieu Pierre Langlois, Dhamin Al-Khalili
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Publication number: 20030062929Abstract: A phase-to-sinusoid-amplitude conversion system and method for use in, for example, direct digital frequency synthesizer applications. The system and method convert phase data to signal amplitude data using an approximation of the first quadrant of a sine function using a plurality of linear line segments of preferably equal length. Each segment is defined with a lower horizontal-axis bound; a lower vertical-axis bound; and a slope represented as a sum of a plurality of slope elements. Based on the approximation and for a given phase angle a set of values are evaluated, for each linear line segment, representing a product of (i) a horizontal displacement representing a difference between the prescribed phase angle and the lower horizontal-axis bound xi of a selected linear line segment where, for example, xi<X<xi+1 and (ii) each one of the slope elements of the selected linear line segment.Type: ApplicationFiled: August 14, 2002Publication date: April 3, 2003Applicant: HER MAJESTY THE QUEEN IN RIGHT OF CANADA...Inventors: Joseph Mathieu Pierre Langlois, Dhamin Al-Khalili
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Patent number: 6437886Abstract: A device and method for recording holographic gratings by the use of a single illuminating beam, two diffraction gratings, light detectors and a slit-scanning system. The beam illuminates two slits that then define two beams that are incident on the gratings. One diffracted order from one beam and one diffracted order from the other beam then interfere on a recording plane to produce sinusoidal variations of intensity. The interfering region may instantaneously be limited by a third slit. Also, another order of diffraction from one beam may be directed toward its own light detector and so is another order of diffraction from the other beam. These two detectors allow real time monitoring of the light intensity of each beam. By moving the slits in a direction parallel to the recording plane, an area larger than the slits' width can be exposed by the interfering pattern.Type: GrantFiled: April 13, 2000Date of Patent: August 20, 2002Assignee: Institut National d'OptiqueInventors: Francois Trepanier, Pierre Langlois