Patents by Inventor Pierre Langlois

Pierre Langlois has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10156548
    Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: December 18, 2018
    Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
  • Publication number: 20180113100
    Abstract: Disclosed is an assisted analysis unit for facilitating phased array defect inspection. The analysis unit comprises an identification & merging module, and a sizing module. The modules are capable of displaying defect contours from multiple groups of indications, and of recommending defect merging candidates and defect sizing methods. However both modules also accept user input so that the final decisions rest with the operator.
    Type: Application
    Filed: October 25, 2016
    Publication date: April 26, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Martin St-Laurent, Jason Habermehl, Pierre Langlois, Benoit Lepage
  • Patent number: 9638673
    Abstract: Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.
    Type: Grant
    Filed: October 18, 2012
    Date of Patent: May 2, 2017
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Pierre Langlois, Benoit Cournoyer
  • Publication number: 20150039245
    Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.
    Type: Application
    Filed: July 31, 2013
    Publication date: February 5, 2015
    Applicant: OLYMPUS NDT INC.
    Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
  • Patent number: 8904872
    Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.
    Type: Grant
    Filed: December 29, 2010
    Date of Patent: December 9, 2014
    Assignee: Olympus NDT
    Inventors: Pierre Langlois, Michael Drummy
  • Publication number: 20140109675
    Abstract: Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.
    Type: Application
    Filed: October 18, 2012
    Publication date: April 24, 2014
    Applicant: OLYMPUS NDT, INC.
    Inventors: Pierre Langlois, Benoit Cournoyer
  • Patent number: 8371151
    Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.
    Type: Grant
    Filed: December 29, 2010
    Date of Patent: February 12, 2013
    Assignee: Olympus NDT
    Inventors: Pierre Langlois, Michael Drummy
  • Patent number: 8033172
    Abstract: The present invention relates to a flaw detector imaging apparatus for detecting and visualizing a flaw in a target material to be investigated, comprising an ultrasonic phase-array probe comprising an array of ultrasonic transducers and a flaw detector. The flaw detector includes at least one trigger channel to trigger ultrasonic emitting transducers of the array at respective time delays to produce an ultrasonic beam propagating through the target material, and a single receiver channel to receive echo signals produced by ultrasonic receiving transducers of the array in response to ultrasonic wave echoes reflected from a flaw in the target material. The single receiver channel comprises a delay circuit imparting to the received echo signals the respective time delays as used in the triggering of the ultrasonic emitting transducers and a combiner of the delayed echo signals.
    Type: Grant
    Filed: July 21, 2008
    Date of Patent: October 11, 2011
    Assignee: Olympus NDT
    Inventors: Pierre Langlois, Agostino Abatte, Josefina R. Quiles, legal representative
  • Patent number: 7958769
    Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.
    Type: Grant
    Filed: February 14, 2006
    Date of Patent: June 14, 2011
    Assignee: Olympus NDT
    Inventors: Pierre Langlois, Michael Drummy
  • Publication number: 20110100089
    Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.
    Type: Application
    Filed: December 29, 2010
    Publication date: May 5, 2011
    Applicant: OLYMPUS NDT
    Inventors: Pierre Langlois, Michael Drummy
  • Publication number: 20110094304
    Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.
    Type: Application
    Filed: December 29, 2010
    Publication date: April 28, 2011
    Applicant: OLYMPUS NDT
    Inventors: Pierre Langlois, Michael Drummy
  • Patent number: 7817076
    Abstract: A multiple mode digitization system for a non-destructive inspection instrument which makes use of a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from a plurality of inputs. In the preferred embodiment, each of the analog to digital converters in the system is driven with an independent and separate clock signal, allowing for propagation delay compensation among the plurality of test signals as well as interleaved sampling such that custom sampling rates can be used for each input without the need for more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are used only for interleave sampling, and digital filters are used to provide signal propagation delay compensation.
    Type: Grant
    Filed: August 15, 2008
    Date of Patent: October 19, 2010
    Assignee: Olympus NDT
    Inventors: Michael Drummy, Andrew Thomas, Denys Laquerre, David Larochelle, Pierre Langlois, Steven Besser
  • Publication number: 20090091318
    Abstract: A phased scanning method and phased scan eddy current array probe suitable for in-situ eddy current inspection of a structure without mechanical scanning. Overlapping subsets of the sensor elements within the array probe are dynamically connected in series and sequentially scanned to simulate the mechanical motion of a conventional array probe along a test surface. An algorithm to effectively balance the scan data is provided which comprises obtaining a reference scan at the time of probe installation, storing the measurement data from this reference scan in a memory device located within the probe, subtracting this reference curve from the curve obtained by all subsequent measurement scans to produce an adjusted curve, and processing the resulting adjusted curve through a high pass filter. A technique for verifying sensor elements of an eddy current array probe after permanent or semi-permanent installation against a test structure is also provided.
    Type: Application
    Filed: September 9, 2008
    Publication date: April 9, 2009
    Inventors: Benoit Lepage, Pierre Langlois, Michael Drummy
  • Publication number: 20090045994
    Abstract: A multiple mode digitization system for a non-destructive inspection instrument which makes use of a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from a plurality of inputs. In the preferred embodiment, each of the analog to digital converters in the system is driven with an independent and separate clock signal, allowing for propagation delay compensation among the plurality of test signals as well as interleaved sampling such that custom sampling rates can be used for each input without the need for more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are used only for interleave sampling, and digital filters are used to provide signal propagation delay compensation.
    Type: Application
    Filed: August 15, 2008
    Publication date: February 19, 2009
    Inventors: Michael DRUMMY, Andrew THOMAS, Denys LAQUERRE, David LAROCHELLE, Pierre LANGLOIS, Steven BESSER
  • Publication number: 20080314153
    Abstract: The present invention relates to a flaw detector imaging apparatus for detecting and visualizing a flaw in a target material to be investigated, comprising an ultrasonic phase-array probe comprising an array of ultrasonic transducers and a flaw detector. The flaw detector includes at least one trigger channel to trigger ultrasonic emitting transducers of the array at respective time delays to produce an ultrasonic beam propagating through the target material, and a single receiver channel to receive echo signals produced by ultrasonic receiving transducers of the array in response to ultrasonic wave echoes reflected from a flaw in the target material. The single receiver channel comprises a delay circuit imparting to the received echo signals the respective time delays as used in the triggering of the ultrasonic emitting transducers and a combiner of the delayed echo signals.
    Type: Application
    Filed: July 21, 2008
    Publication date: December 25, 2008
    Applicant: OLYMPUS NDT
    Inventors: Pierre Langlois, Agostino Abatte, Josefina R. Quiles
  • Publication number: 20070034010
    Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.
    Type: Application
    Filed: February 14, 2006
    Publication date: February 15, 2007
    Applicant: Olympus NDT
    Inventors: Pierre Langlois, Michael Drummy
  • Publication number: 20060254359
    Abstract: The present invention relates to a flaw detector imaging apparatus for detecting and visualizing a flaw in a target material to be investigated, comprising an ultrasonic phase-array probe comprising an array of ultrasonic transducers and a flaw detector. The flaw detector includes at least one trigger channel to trigger ultrasonic emitting transducers of the array at respective time delays to produce an ultrasonic beam propagating through the target material, and at least one receiver channel to receive echo signals produced by ultrasonic receiving transducers of the array in response to ultrasonic wave echoes reflected from a flaw in the target material. The receiver channel comprises a delay circuit imparting to the received echo signals the respective time delays as used in the triggering of the ultrasonic emitting transducers and a combiner of the delayed echo signals.
    Type: Application
    Filed: January 17, 2006
    Publication date: November 16, 2006
    Inventors: Pierre Langlois, Agostino Abatte, Josefina Quiles
  • Patent number: 6657573
    Abstract: A phase-to-sinusoid-amplitude conversion system and method for use in, for example, direct digital frequency synthesizer applications. The system and method convert phase data to signal amplitude data using an approximation of the first quadrant of a sine function using a plurality of linear line segments of preferably equal length. Each segment is defined with a lower horizontal-axis bound; a lower vertical-axis bound; and a slope represented as a sum of a plurality of slope elements. Based on the approximation and for a given phase angle a set of values are evaluated, for each linear line segment, representing a product of (i) a horizontal displacement representing a difference between the prescribed phase angle and the lower horizontal-axis bound xi of a selected linear line segment where, for example, xi<X<xi+1 and (ii) each one of the slope elements of the selected linear line segment.
    Type: Grant
    Filed: August 14, 2002
    Date of Patent: December 2, 2003
    Assignee: Her Majesty the Queen in right of Canada, as represented by the Minister of National Defence
    Inventors: Joseph Mathieu Pierre Langlois, Dhamin Al-Khalili
  • Publication number: 20030062929
    Abstract: A phase-to-sinusoid-amplitude conversion system and method for use in, for example, direct digital frequency synthesizer applications. The system and method convert phase data to signal amplitude data using an approximation of the first quadrant of a sine function using a plurality of linear line segments of preferably equal length. Each segment is defined with a lower horizontal-axis bound; a lower vertical-axis bound; and a slope represented as a sum of a plurality of slope elements. Based on the approximation and for a given phase angle a set of values are evaluated, for each linear line segment, representing a product of (i) a horizontal displacement representing a difference between the prescribed phase angle and the lower horizontal-axis bound xi of a selected linear line segment where, for example, xi<X<xi+1 and (ii) each one of the slope elements of the selected linear line segment.
    Type: Application
    Filed: August 14, 2002
    Publication date: April 3, 2003
    Applicant: HER MAJESTY THE QUEEN IN RIGHT OF CANADA...
    Inventors: Joseph Mathieu Pierre Langlois, Dhamin Al-Khalili
  • Patent number: 6437886
    Abstract: A device and method for recording holographic gratings by the use of a single illuminating beam, two diffraction gratings, light detectors and a slit-scanning system. The beam illuminates two slits that then define two beams that are incident on the gratings. One diffracted order from one beam and one diffracted order from the other beam then interfere on a recording plane to produce sinusoidal variations of intensity. The interfering region may instantaneously be limited by a third slit. Also, another order of diffraction from one beam may be directed toward its own light detector and so is another order of diffraction from the other beam. These two detectors allow real time monitoring of the light intensity of each beam. By moving the slits in a direction parallel to the recording plane, an area larger than the slits' width can be exposed by the interfering pattern.
    Type: Grant
    Filed: April 13, 2000
    Date of Patent: August 20, 2002
    Assignee: Institut National d'Optique
    Inventors: Francois Trepanier, Pierre Langlois