Patents by Inventor Pierre LAVENUS

Pierre LAVENUS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11757408
    Abstract: An electrical field detector includes an electromechanical oscillator, part of which is included of a piezoelectric element, a frequency measuring device which is coupled to the oscillator so as to measure the oscillation frequency, and an electrical masking assembly. The electrical masking assembly is arranged close to the piezoelectric element so that, during an use of the detector, the piezoelectric element moves by vibrating relative to the electrical masking assembly. A variable part of the piezoelectric element is thus exposed to the electrical field to be measured. A change in the oscillating frequency then forms an electrical field measurement result.
    Type: Grant
    Filed: March 8, 2021
    Date of Patent: September 12, 2023
    Assignee: OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AÉROSPATIALES
    Inventors: Raphael Levy, Thomas Perrier, Pierre Lavenus, Jean Guerard, Vincent Gaudineau
  • Publication number: 20230112323
    Abstract: An electrical field detector includes an electromechanical oscillator, part of which is included of a piezoelectric element, a frequency measuring device which is coupled to the oscillator so as to measure the oscillation frequency, and an electrical masking assembly. The electrical masking assembly is arranged close to the piezoelectric element so that, during an use of the detector, the piezoelectric element moves by vibrating relative to the electrical masking assembly. A variable part of the piezoelectric element is thus exposed to the electrical field to be measured. A change in the oscillating frequency then forms an electrical field measurement result.
    Type: Application
    Filed: March 8, 2021
    Publication date: April 13, 2023
    Inventors: Raphael LEVY, Thomas PERRIER, Pierre LAVENUS, Jean GUERARD, Vincent GAUDINEAU
  • Patent number: 11307230
    Abstract: Disclosed is a system and method that provide an amplitude value and a phase delay value which relate to a sinusoidal signal to be measured. For this purpose, phase values of a reference signal, at which the signal to be measured exceeds or falls below the reference signal, are collected and transmitted to a computation unit. The computation unit determines the amplitude and delay values from the collected phase values. The system can be implemented in a cost-effective manner, in particular using an ASIC circuit or an FPGA circuit.
    Type: Grant
    Filed: June 9, 2017
    Date of Patent: April 19, 2022
    Assignee: OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AÉROSPATIALES
    Inventors: Jean Guerard, Béatrice Verlhac, Pierre Lavenus, Raphaël Levy
  • Publication number: 20190310294
    Abstract: Disclosed is a system and method that provide an amplitude value and a phase delay value which relate to a sinusoidal signal to be measured. For this purpose, phase values of a reference signal, at which the signal to be measured exceeds or falls below the reference signal, are collected and transmitted to a computation unit. The computation unit determines the amplitude and delay values from the collected phase values. The system can be implemented in a cost-effective manner, in particular using an ASIC circuit or an FPGA circuit.
    Type: Application
    Filed: June 9, 2017
    Publication date: October 10, 2019
    Applicant: Office National d'Etudes et de Recherches Aérospatiales
    Inventors: Jean GUERARD, Béatrice VERLHAC, Pierre LAVENUS, Raphaël LEVY