Patents by Inventor Pierre M. Companion

Pierre M. Companion has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of analyzing visual inspection image data to find defects on a device
    Patent number: 6330354
    Abstract: A method for analyzing image data is disclosed that will find defects on a multi-layer device having solder pads, such as a semiconductor computer chip. The method provides a device template image, a theoretical image created from data from several real images, for comparison to an image of a device to be tested after the solder pad data is segmented. The parameter values of the device to be tested are recorded and compared to the parameter values of the device template, forming a difference image. The difference image and the solder pad data are then run through a series of tests, wherein the device is determined defective or not defective.
    Type: Grant
    Filed: May 1, 1997
    Date of Patent: December 11, 2001
    Assignee: International Business Machines Corporation
    Inventors: Pierre M. Companion, Karl K. Moody, III, Brenda M. Wilson