Patents by Inventor Pierre Tran-van

Pierre Tran-van has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining characteristics of a photoconverter without contact
    Patent number: 9297764
    Abstract: The invention relates to a method for determining the maximum open circuit voltage and the power that can be output by a photoconverter material subject to a measurement light intensity, the method including the following steps: measuring the photoluminescent intensity of the material, measuring the absorption rate of the photoconverter material at a second wavelength substantially equal to the photoluminescent wavelength of the photoconverter material, determining the maximum open circuit voltage of the photoconverter material with the measurement light intensity by means of the absorption rate and the photoluminescent intensity measured at substantially the same wavelength; said invention being characterized in that the light source and the photoconverter material are arranged such that the angular distributions of the rays incident on and emitted by the lit surface of the material and collected by the detector are substantially identical.
    Type: Grant
    Filed: February 7, 2011
    Date of Patent: March 29, 2016
    Assignees: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE—CNRS—, ELECTRICITE DE FRANCE, UNIVERSITE DE VERSAILLES SAINT-QUENTIN-EN-YVELINES
    Inventors: Jean-François Guillemoles, Arnaud Etcheberry, Isabelle Gerard, Pierre Tran-Van
  • Method for Determining Characteristics of a Photoconverter Without Contact
    Publication number: 20130066574
    Abstract: The invention relates to a method for determining the maximum open circuit voltage and the power that can be output by a photoconverter material subject to a measurement light intensity, the method including the following steps: measuring the photoluminescent intensity of the material, measuring the absorption rate of the photoconverter material at a second wavelength substantially equal to the photoluminescent wavelength of the photoconverter material, determining the maximum open circuit voltage of the photoconverter material with the measurement light intensity by means of the absorption rate and the photoluminescent intensity measured at substantially the same wavelength; said invention being characterised in that the light source and the photoconverter material are arranged such that the angular distributions of the rays incident on and emitted by the lit surface of the material and collected by the detector are substantially identical.
    Type: Application
    Filed: February 7, 2011
    Publication date: March 14, 2013
    Applicants: Centre National de la Recherche Scientifique-CNRS-, Universite de Versailles Saint-Quentin-en- Yvelines, Electricite de France
    Inventors: Jean-François Guillemoles, Arnaud Etcheberry, Isabelle Gerard, Pierre Tran-van