Abstract: A method and a device for analysis of a profile of a real form of a surface of a part. The device determines and divides into subsections a deviation between the real form and the theoretical form. Then, for each subsection, a sinusoidal wave characterized by an amplitude b and a half-length of wave a is identified. When b is smaller than a predetermined value bmin or when a is smaller than a predetermined value amin, then the device stops the analysis, otherwise a new iteration of the analysis is carried out, considering the sinusoidal wave identified as a new profile of a theoretical form of the surface. Upon completion of the analysis phase, an alert message is generated if the values b and/or b/a do not comply with a manufacturing tolerance criterion.

Abstract: The present invention relates to chemical sensor and biosensor probes for measuring low concentration of metals and metal ions in complex samples such as biological fluids, living cells, and environmental samples. More particularly the present invention relates to a gel-based Indo-1 and Fura-2 chemical sensor probes for the measurement of low concentrations of calcium, cadmium, magnesium and the like. Also disclosed is a detector device using the sensors of the present invention.