Patents by Inventor Pieter Harpe

Pieter Harpe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11750206
    Abstract: Example embodiments relate to systems and methods for analog-to-digital signal conversion. One embodiment includes a system for analog-to-digital signal conversion. The system includes an analog input signal. The system also includes a digital-to-analog converter configured to generate a reference signal. Further, the system includes an amplifier configured to amplify an error signal that includes a difference between the analog input signal and the reference signal. Additionally, the system includes a level-crossing based sampling circuit that includes a first comparator configured to compare the error signal with respect to a first reference level, and a second comparator configured to compare the error signal with respect to a second reference level, thereby generating event-based reset signals corresponding to a plurality of sampling instances in order to reset the digital-to-analog converter.
    Type: Grant
    Filed: December 28, 2021
    Date of Patent: September 5, 2023
    Assignee: Stichting IMEC Nederland
    Inventors: Ming Ding, Martijn Timmermans, Pieter Harpe
  • Publication number: 20220216879
    Abstract: Example embodiments relate to systems and methods for analog-to-digital signal conversion. One embodiment includes a system for analog-to-digital signal conversion. The system includes an analog input signal. The system also includes a digital-to-analog converter configured to generate a reference signal. Further, the system includes an amplifier configured to amplify an error signal that includes a difference between the analog input signal and the reference signal. Additionally, the system includes a level-crossing based sampling circuit that includes a first comparator configured to compare the error signal with respect to a first reference level, and a second comparator configured to compare the error signal with respect to a second reference level, thereby generating event-based reset signals corresponding to a plurality of sampling instances in order to reset the digital-to-analog converter.
    Type: Application
    Filed: December 28, 2021
    Publication date: July 7, 2022
    Inventors: Ming Ding, Martijn Timmermans, Pieter Harpe
  • Patent number: 11096629
    Abstract: The present disclosure is directed to an impedance spectroscopy system for bio-impedance measurement. The impedance spectroscopy system includes a signal generator configured to generate a signal with a broadband frequency spectrum and to generate an analog injection current from the signal with the broadband frequency spectrum. The analog injection current has a high pass frequency characteristic. The impedance spectroscopy system also includes an amplifier configured to measure a voltage signal in response to the analog injection current and to simultaneously measure a biopotential signal. Further, the impedance spectroscopy system includes a processor configured to analyze the voltage signal to derive a bio-impedance spectrum as well to derive further information from the biopotential signal.
    Type: Grant
    Filed: August 25, 2016
    Date of Patent: August 24, 2021
    Assignee: Stichting IMEC Nederland
    Inventors: Pieter Harpe, Jiawei Xu
  • Patent number: 10230386
    Abstract: A method of offset calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration bit (B*LSB; B*MSB), analyzing a bit of the digital signal (COUT) and the calibration bit (B*LSB; B*MSB), determining an indication of a presence of offset error, and calibrating the offset error. As the determination of the calibration bit (B*LSB; B*MSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and thus can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: March 12, 2019
    Assignee: Stichting IMEC Nederland
    Inventors: Ming Ding, Hanyue Li, Pieter Harpe
  • Patent number: 10050638
    Abstract: A method of gain calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*RES) and a calibration bit (B*LSB), analyzing a least significant bit of the digital signal (COUT) and the calibration bit (B*LSB), determining an indication of a presence of gain error in the gain module, and calibrating the gain error. As the determination of the calibration bit (B*LSB) requires only one additional comparison, as compared to normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: August 14, 2018
    Assignee: Stichting IMEC Nederland
    Inventors: Ming Ding, Pieter Harpe, Hanyue Li
  • Patent number: 10027339
    Abstract: A method of DAC mismatch calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*RES) and a calibration bit (B*LSB), analyzing a least significant bit of the digital signal (COUT) and the calibration bit (B*LSB), determining an indication of a presence of DAC mismatch, and calibrating the DAC mismatch. As the determination of the calibration bit (B*LSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Grant
    Filed: December 6, 2017
    Date of Patent: July 17, 2018
    Assignee: Stichting IMEC Nederland
    Inventors: Ming Ding, Pieter Harpe, Hanyue Li
  • Publication number: 20180175874
    Abstract: A method of gain calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*RES) and a calibration bit (B*LSB), analyzing a least significant bit of the digital signal (COUT) and the calibration bit (B*LSB), determining an indication of a presence of gain error in the gain module, and calibrating the gain error. As the determination of the calibration bit (B*LSB) requires only one additional comparison, as compared to normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Application
    Filed: December 7, 2017
    Publication date: June 21, 2018
    Inventors: Ming DING, Pieter Harpe, Hanyue Li
  • Publication number: 20180167079
    Abstract: A method of offset calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration bit (B*LSB; B*MSB), analyzing a bit of the digital signal (COUT) and the calibration bit (B*LSB; B*MSB), determining an indication of a presence of offset error, and calibrating the offset error. As the determination of the calibration bit (B*LSB; B*MSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and thus can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Application
    Filed: December 7, 2017
    Publication date: June 14, 2018
    Inventors: Ming Ding, Hanyue Li, Pieter HARPE
  • Publication number: 20180167078
    Abstract: A method of DAC mismatch calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*RES) and a calibration bit (B*LSB), analyzing a least significant bit of the digital signal (COUT) and the calibration bit (B*LSB), determining an indication of a presence of DAC mismatch, and calibrating the DAC mismatch. As the determination of the calibration bit (B*LSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Application
    Filed: December 6, 2017
    Publication date: June 14, 2018
    Inventors: Ming Ding, Pieter Harpe, Hanyue Li
  • Publication number: 20170071552
    Abstract: The present disclosure is directed to an impedance spectroscopy system for bio-impedance measurement. The impedance spectroscopy system includes a signal generator configured to generate a signal with a broadband frequency spectrum and to generate an analog injection current from the signal with the broadband frequency spectrum. The analog injection current has a high pass frequency characteristic. The impedance spectroscopy system also includes an amplifier configured to measure a voltage signal in response to the analog injection current and to simultaneously measure a biopotential signal. Further, the impedance spectroscopy system includes a processor configured to analyze the voltage signal to derive a bio-impedance spectrum as well to derive further information from the biopotential signal.
    Type: Application
    Filed: August 25, 2016
    Publication date: March 16, 2017
    Applicant: Stichting IMEC Nederland
    Inventors: Pieter Harpe, Jiawei Xu
  • Patent number: 9537499
    Abstract: A method includes sampling an input voltage signal applied to an ADC, comparing the sampled input voltage signal with an output signal of a feedback DAC, and determining in a search logic block a digital code representation for the comparison result. The method may also include performing a calibration by: performing an additional cycle, wherein a last comparison carried out for determining a least significant bit of the digital code representation is repeated with a second comparator resolution mode different from a first comparator resolution mode, so obtaining an additional comparison; determining from a difference between results of the additional comparison and the last comparison a sign of a comparator offset error between the comparator resolution modes; and tuning, in accordance with a sign of the comparator offset error, a programmable capacitor connected at an input of the comparator, thereby inducing a voltage step to counteract the comparator offset error.
    Type: Grant
    Filed: February 19, 2016
    Date of Patent: January 3, 2017
    Assignee: Stichting IMEC Nederland
    Inventor: Pieter Harpe
  • Publication number: 20160248435
    Abstract: A method includes sampling an input voltage signal applied to an ADC, comparing the sampled input voltage signal with an output signal of a feedback DAC, and determining in a search logic block a digital code representation for the comparison result. The method may also include performing a calibration by: performing an additional cycle, wherein a last comparison carried out for determining a least significant bit of the digital code representation is repeated with a second comparator resolution mode different from a first comparator resolution mode, so obtaining an additional comparison; determining from a difference between results of the additional comparison and the last comparison a sign of a comparator offset error between the comparator resolution modes; and tuning, in accordance with a sign of the comparator offset error, a programmable capacitor connected at an input of the comparator, thereby inducing a voltage step to counteract the comparator offset error.
    Type: Application
    Filed: February 19, 2016
    Publication date: August 25, 2016
    Applicant: Stichting IMEC Nederland
    Inventor: Pieter Harpe
  • Patent number: 9397679
    Abstract: A method comprises sampling an input voltage signal, comparing the sampled input voltage signal with an output signal of a feedback DAC, and determining an (N+1) bit code representation for a comparison result, the (N+1) bit code yielding the N bit output signal. On detection of the (N+1) bit code being equal to a predefined calibration trigger code, performing a calibration for a most significant bit of the (N+1) bit code by replacing the (N+1) bit code by an alternative (N+1) bit code that yields the same N bit output signal, performing an additional comparison cycle using the alternative (N+1) bit code, determining, using comparison results of the additional comparison cycle and the preceding (N+1)th cycle, a sign of a DAC capacitor mismatch error, and tuning programmable binary scaled calibration capacitors in parallel to a capacitor corresponding to the one of the most significant bits of the (N+1) bit code.
    Type: Grant
    Filed: February 19, 2016
    Date of Patent: July 19, 2016
    Assignee: Stichting IMEC Nederland
    Inventor: Pieter Harpe
  • Patent number: 8368578
    Abstract: The present invention is related to an analog to digital converter circuit. The circuit comprises at least one input node for applying an analog input voltage signal (Vin), means for sampling said analog input voltage signal, a first array of capacitors arranged for receiving the sampled analog input voltage signal, a digital delay line connected to the first array of capacitors and arranged for being enabled by a clock generator and for generating a staircase or slope function by means of the first capacitor array, taking into account the sampled analog input voltage signal, a comparator arranged for comparing a converted signal with a reference voltage (Vref), said converted signal being a version of said sampled analog input voltage converted according to said staircase or slope function, and for generating a stop signal based on the comparison result thereby latching the digital delay line and thereby acquiring the digital code.
    Type: Grant
    Filed: May 23, 2011
    Date of Patent: February 5, 2013
    Assignee: IMEC
    Inventor: Pieter Harpe
  • Patent number: 8134487
    Abstract: An asynchronous analog to digital convertor for converting an analog input signal into a digital output is presented. According to an embodiment, the analog to digital convertor comprises a clock input operable to receive an external clock signal having a clock period, a comparator operable to compare the analog input signal to a reference signal, a digital to analog converter operable to generate the reference signal corresponding to a state of a successive approximation register, and a control block connected to the comparator and to the digital to analog converter. The control block is operable to generate and receive a sequence of control signals according to a successive approximation algorithm, to perform a plurality of comparisons, and to update the state of the successive approximation register thereby generating the digital output.
    Type: Grant
    Filed: September 9, 2010
    Date of Patent: March 13, 2012
    Assignee: Stichting IMEC Nederland
    Inventor: Pieter Harpe
  • Publication number: 20110285568
    Abstract: The present invention is related to an analog to digital converter circuit. The circuit comprises at least one input node for applying an analog input voltage signal (Vin), means for sampling said analog input voltage signal, a first array of capacitors arranged for receiving the sampled analog input voltage signal, a digital delay line connected to the first array of capacitors and arranged for being enabled by a clock generator and for generating a staircase or slope function by means of the first capacitor array, taking into account the sampled analog input voltage signal, a comparator arranged for comparing a converted signal with a reference voltage (Vref), said converted signal being a version of said sampled analog input voltage converted according to said staircase or slope function, and for generating a stop signal based on the comparison result thereby latching the digital delay line and thereby acquiring the digital code.
    Type: Application
    Filed: May 23, 2011
    Publication date: November 24, 2011
    Applicant: Stichting IMEC Nederland
    Inventor: Pieter Harpe
  • Publication number: 20110057823
    Abstract: An asynchronous analog to digital convertor for converting an analog input signal into a digital output is presented. According to an embodiment, the analog to digital convertor comprises a clock input operable to receive an external clock signal having a clock period, a comparator operable to compare the analog input signal to a reference signal, a digital to analog converter operable to generate the reference signal corresponding to a state of a successive approximation register, and a control block connected to the comparator and to the digital to analog converter. The control block is operable to generate and receive a sequence of control signals according to a successive approximation algorithm, to perform a plurality of comparisons, and to update the state of the successive approximation register thereby generating the digital output.
    Type: Application
    Filed: September 9, 2010
    Publication date: March 10, 2011
    Applicant: STICHTING IMEC NEDERLAND
    Inventor: Pieter Harpe
  • Publication number: 20070290906
    Abstract: Improved sigma-delta modulator (SDM) for 1-bit digital audio noise shaping. It is the object to produce a bit stream that is compatible with the Scarlet Book specification (Super Audio CD standard, SACD) and that achieves a higher lossless compression ratio when compressed and decompressed according to the standard. This goal is achieved by using a trellis-based SDM and/or a prediction filter within the SDM that is similar or identical to the prediction filter in the encoder. The trellis SDM is designed to produce a predicted signal from a range of candidate signals that is as close to the input signal as possible.
    Type: Application
    Filed: July 15, 2004
    Publication date: December 20, 2007
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Derk Reefman, Pieter Harpe, Erwin Janssen