Abstract: An improved Flash memory device is described with a protection register lock bit erase enable circuit. A bond pad coupled to the lock bit erase enable circuit of the improved Flash memory is not bonded when the individual Flash memory chip wafer is packaged. This allows the memory manufacturer to access the bond pad and erase the lock bits while the chip is still in wafer form via a test card probe, but makes the lock bits effectively uneraseable when the chip wafer is packaged. This enables the memory chip manufacturer to enhance reliability and fault tolerance of the Flash memory device by thoroughly testing the lock bits and protection register functionality. Additionally, the lock bit erase enable circuit increases manufacturing flexibility by allowing the memory chip manufacturer to reprogram the protection register and lock bits in case of organizational changes or inadvertent or erroneous programming of the protection register.

Abstract: A system and method for a write state machine for non-volatile memory is disclosed. The write state machine has an associated read only memory for storing instructions for operation of the non-volatile memory.

Abstract: A multiple partition memory array has a command user interface for each partition, and a logic interface. The logic interface receives signals from each of the command user interfaces to restrict executable commands in the command user interfaces to those commands that will not tax the system given the current status of each of the command user interfaces.

Abstract: A system and method for a write state machine for a non-volatile memory. The write state machine has an associated read only memory (ROM) for storing instructions for operation of the non-volatile memory. The ROM is coupled to an input of a write state machine. An instruction needed to perform an algorithm is stored as a micro-instruction in the ROM such that an instruction sequence is changed by only reprogramming the ROM.

Abstract: An improved Flash memory device is described with a protection register lock bit erase enable circuit. A bond pad coupled to the lock bit erase enable circuit of the improved Flash memory is not bonded when the individual Flash memory chip wafer is packaged. This allows the memory manufacturer to access the bond pad and erase the lock bits while the chip is still in wafer form via a test card probe, but makes the lock bits effectively uneraseable when the chip wafer is packaged. This enables the memory chip manufacturer to enhance reliability and fault tolerance of the Flash memory device by thoroughly testing the lock bits and protection register functionality. Additionally, the lock bit erase enable circuit increases manufacturing flexibility by allowing the memory chip manufacturer to reprogram the protection register and lock bits in case of organizational changes or inadvertent or erroneous programming of the protection register.

Abstract: An improved Flash memory device is described with a protection register lock bit erase enable circuit. A bond pad coupled to the lock bit erase enable circuit of the improved Flash memory is not bonded when the individual Flash memory chip wafer is packaged. This allows the memory manufacturer to access the bond pad and erase the lock bits while the chip is still in wafer form via a test card probe, but makes the lock bits effectively uneraseable when the chip wafer is packaged. This enables the memory chip manufacturer to enhance reliability and fault tolerance of the Flash memory device by thoroughly testing the lock bits and protection register functionality. Additionally, the lock bit erase enable circuit increases manufacturing flexibility by allowing the memory chip manufacturer to reprogram the protection register and lock bits in case of organizational changes or inadvertent or erroneous programming of the protection register.

Abstract: A system and method for a write state machine for non-volatile memory is disclosed. The write state machine has an associated read only memory for storing instructions for operation of the non-volatile memory.

Abstract: A method for making a memory device includes forming or fabricating on a first substrate a first array of memory cells, a first read only memory, and a first write state machine which receives instructions from the first read only memory for operating the first array of memory cells. The method further includes forming or fabricating on a second substrate, a second array of memory cells, a second read only memory, and a second write state machine which receives instructions from the second read only memory for operating the second array of memory cells.

Abstract: A system and method for a write state machine for non-volatile memory is disclosed. The write state machine has an associated read only memory for storing instructions for operation of the non-volatile memory.

Abstract: An improved Flash memory device is described with a protection register lock bit erase enable circuit. A bond pad coupled to the lock bit erase enable circuit of the improved Flash memory is not bonded when the individual Flash memory chip wafer is packaged. This allows the memory manufacturer to access the bond pad and erase the lock bits while the chip is still in wafer form via a test card probe, but makes the lock bits effectively uneraseable when the chip wafer is packaged. This enables the memory chip manufacturer to enhance reliability and fault tolerance of the Flash memory device by thoroughly testing the lock bits and protection register functionality. Additionally, the lock bit erase enable circuit increases manufacturing flexibility by allowing the memory chip manufacturer to reprogram the protection register and lock bits in case of organizational changes or inadvertent or erroneous programming of the protection register.

Abstract: A system and method for a write state machine for non-volatile memory is disclosed. The write state machine has an associated read only memory for storing instructions for operation of the non-volatile memory.

Abstract: A system and method for a write state machine for non-volatile memory is disclosed. The system includes an array of memory cells and a write state machine for controlling operations on the array of memory cells. The write state machine has an associated read only memory for storing instructions for operation of the non-volatile memory. The write state machine is adapted to suspend an execution of one of the operations during an action on a block in the non-volatile memory which is not being accessed by the write state machine.

Abstract: A multiple partition memory array has a command user interface for each partition, and a logic interface. The logic interface receives signals from each of the command user interfaces to restrict executable commands in the command user interfaces to those commands that will not tax the system given the current status of each of the command user interfaces.

Abstract: A system and method for a write state machine for non-volatile memory is disclosed. The write state machine has an associated read only memory for storing instructions for operation of the non-volatile memory.

Abstract: A charge pump 1 for operation in an integrated circuit having a power source Vdd. The pump is made of a plurality of pump cells 10 connected together. Each pump cell includes an inverter 50 having a port 42 to receive a negative bias input, a port 44 to receive a positive bias input, a port 38 to receive a clock input, and a port 40 to output an output clock signal at the same frequency of the clock input, but phase shifted by a predetermined amount determined by the signal levels of the negative bias and said positive bias. Also included in each pump cell is a capacitor 26. A circuit 20, 22, 24, for coupling the output clock signal to one port of the capacitor is also provided, as is a pair of diodes 28, 30, connected serially together, one end of the pair being connected to the power source and the other end 48 of the pair providing the output signal of the pump cell, the common point of the pair being connected to the other port of the capacitor.

Abstract: A non-volatile, integrated circuit memory, such as a Flash EPROM, including an array 1 of memory cells 10, each cell having a floating gate 14 for programming the cell and a control gate 11 for reading the cell, the array having a plurality of row lines 15, a plurality of column lines 25 and a plurality of output lines 18. Included is a decoder circuit 16 having a plurality of input lines 94, 96, for each row in the array, and having as outputs the row lines 15. The decoder circuit includes a decoder logic circuit associated with each row line, the decoder logic circuit including a plurality of low power logic devices 84-90 interconnected to perform a predetermined decoding function on the signals on the input lines for the associated row line to apply a signal to an associated row node when the decoder logic circuit determines that the associated row line is selected.

Abstract: A method for selectibly erasing one or more non-volatile programmable memory cells in an integrated circuit. The method is applicable to an array 1 of memory cells 10 fabricated in a semiconductor substrate 30 of a first conductivity type semiconductor material, each cell having a floating gate 14 for programming the cell and a control gate 11 for reading the cell, the array having a plurality of row lines 15, a plurality of column lines 25 and a plurality of output lines 18. The cells should be formed in a first well 33 of said first conductivity type semiconductor material, the first wells being formed in second wells 31 of a second conductivity type semiconductor material, the first wells including cells in groups of one or more. The method involves the steps of applying a high voltage source to a selected one or more column lines, applying a zero voltage source to a selected one or more row lines; and applying the high voltage source to non-selected row lines.

Abstract: A non-volatile, integrated circuit memory, such as a Flash EPROM, including an array 1 of memory cells 10, each cell having a floating gate 14 for programming the cell and a control gate 11 for reading the cell, the array having a plurality of row lines 15, a plurality of column lines 25 and a plurality of output lines 18. Included is a decoder circuit 16 having a plurality of input lines 94, 96, for each row in the array, and having as outputs the row lines 15. The decoder circuit includes a decoder logic circuit associated with each row line, the decoder logic circuit including a plurality of low power logic devices 84-90 interconnected to perform a predetermined decoding function on the signals on the input lines for the associated row line to apply a signal to an associated row node when the decoder logic circuit determines that the associated row line is selected.

Abstract: A method for automatically detecting and correcting the underprogramming of a memory cell 10 in a non-volatile, progrommable memory array 1, the array having a plurality of such cells, each such cell being programmable by a progromming step that stores charge therein and being erasable by an erasing step that removes charge therefrom, and each such cell being readable to determine whether such cell is in a progrommed state or in an erased state. First, charge is stored in a selected cell therein 74. Then the selected cell is read to determine whether the selected cell is programmed 78. If the step of reading does not determine such cell to be programmed 80, the steps of storing and reading are automatically repeated until either the step of sensing indicates a sufficiently programmed cell or, alternatively, until a predermined number of iterations of the steps has been performed 86.