Abstract: A magnetic probe-based current measurement device and measurement method is disclosed. The device comprises a conductor for a current under test, a magnetic probe, a magnetic bias structure, and a programmable chip. A conductor has a first axis, a second axis, and a third axis. The conductor is provided with through holes. The direction of the through holes are parallel to the third axis. Vertical projections of the through holes on a first cross section are symmetric about the first axis. At least one of the through holes has a center position located on the first axis. And/or every pair of the through holes have center positions that are symmetric about the first axis. The magnetic probe is provided within the through holes, and is electrically connected to the programmable chip. A sensitive center position of the magnetic probe is located on the first cross section. A vertical projection of the magnetic probe on the first cross section is symmetric about the first axis.

Abstract: The embodiments of the present invention disclose a current sensor. The current sensor comprises a current conductor to be measured which comprises a first conductor section and a second conductor section with identical shapes. An area enclosed by the extended shape of the first conductor section and the second conductor section is a U shape, and the two conductor sections are symmetrically distributed about a geometric center line of the current conductor to be measured. A first magnetic sensor group is arranged at one or two sides of the first conductor section. A second magnetic sensor group is also arranged at one or two sides of the first conductor section. These two magnetic sensor groups are symmetrically distributed about the geometric center line of the current conductor to be measured and have the same sensing directions.

Abstract: A magnetic probe-based current measurement device and measurement method is disclosed. The device comprises a conductor for a current under test, a magnetic probe, a magnetic bias structure, and a programmable chip. A conductor has a first axis, a second axis, and a third axis. The conductor is provided with through holes. The direction of the through holes are parallel to the third axis. Vertical projections of the through holes on a first cross section are symmetric about the first axis. At least one of the through holes has a center position located on the first axis. And/or every pair of the through holes have center positions that are symmetric about the first axis. The magnetic probe is provided within the through holes, and is electrically connected to the programmable chip. A sensitive center position of the magnetic probe is located on the first cross section. A vertical projection of the magnetic probe on the first cross section is symmetric about the first axis.