Patents by Inventor Pin-Yan TSAI

Pin-Yan TSAI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Image test system, test assembly and image capture card
    Patent number: 11693042
    Abstract: An image test system includes a test assembly and an image capture card. The test assembly is provided for obtaining a test signal from a test object, and includes an interface conversion circuit for converting signal transmission form of the test signal. The image capture card is provided for obtaining the test signal from the test assembly, and obtaining an image data from the test signal. The image test system further includes a test signal clock generation circuit for obtaining a test signal clock from the test signal, or the image capture card further includes a pair of clock input pins for obtaining the test signal clock directly from the test object.
    Type: Grant
    Filed: September 13, 2021
    Date of Patent: July 4, 2023
    Assignee: KING YUAN ELECTRONICS CO, LTD.
    Inventors: Pin-Yan Tsai, Kuang-Che Cheng
  • IMAGE TEST SYSTEM, TEST ASSEMBLY AND IMAGE CAPTURE CARD
    Publication number: 20220155361
    Abstract: An image test system includes a test assembly and an image capture card. The test assembly is provided for obtaining a test signal from a test object, and includes an interface conversion circuit for converting signal transmission form of the test signal. The image capture card is provided for obtaining the test signal from the test assembly, and obtaining an image data from the test signal. The image test system further includes a test signal clock generation circuit for obtaining a test signal clock from the test signal, or the image capture card further includes a pair of clock input pins for obtaining the test signal clock directly from the test object.
    Type: Application
    Filed: September 13, 2021
    Publication date: May 19, 2022
    Inventors: Pin-Yan TSAI, Kuang-Che CHENG
  • Image test system and test assembly thereof
    Patent number: 11300611
    Abstract: An image test system includes a test assembly and an image capture card. The test assembly is provided for capturing test signals from test objects, and incudes a first transmission interface, a second transmission interface, and an interface conversion circuit. The interface conversion circuit is connected with the first transmission interface, and converts signal transmission forms of the test signals. The second transmission interface is connected with the interface conversion circuit. Besides, the image capture card is provided for connecting with the second transmission interface, and captures image data from the test signals.
    Type: Grant
    Filed: March 23, 2020
    Date of Patent: April 12, 2022
    Assignee: KING YUAN ELECTRONICS CO, LTD.
    Inventors: Pin-Yan Tsai, Po-Kuan Sung, Kuang-Che Cheng, Hung-Chan Lin
  • IMAGE TEST SYSTEM AND TEST ASSEMBLY THEREOF
    Publication number: 20210132146
    Abstract: An image test system includes a test assembly and an image capture card. The test assembly is provided for capturing test signals from test objects, and incudes a first transmission interface, a second transmission interface, and an interface conversion circuit. The interface conversion circuit is connected with the first transmission interface, and converts signal transmission forms of the test signals. The second transmission interface is connected with the interface conversion circuit. Besides, the image capture card is provided for connecting with the second transmission interface, and captures image data from the test signals.
    Type: Application
    Filed: March 23, 2020
    Publication date: May 6, 2021
    Inventors: Pin-Yan TSAI, Po-Kuan SUNG, Kuang-Che CHENG, Hung-Chan LIN