Patents by Inventor Ping-Cheng Wen

Ping-Cheng Wen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for detecting electronic device testing socket
    Patent number: 7615992
    Abstract: An apparatus for detecting an electronic device testing socket including a testing base, a detecting circuit board, a depth gauge, and a conductive pressing block is provided. The detecting circuit board disposed on the testing base has a carrying surface for carrying an electronic device testing socket. The electronic device testing socket includes a plurality of pin units, and each of the pin units includes an S-shaped pin and a pair of elastic rods accommodated within recesses thereof. The depth gauge disposed on the testing base presses against a top surface of the conductive pressing block, and presses with a bottom surface thereof against the electronic device testing socket. The depth gauge is adapted to adjust a distance between the top surface of the conductive pressing block and the carrying surface. The detecting circuit board is electrically connected to the pin units for detecting the status of the pin units.
    Type: Grant
    Filed: March 26, 2008
    Date of Patent: November 10, 2009
    Assignee: Advanced Semiconductor Engineering, Inc.
    Inventors: Ping-Cheng Wen, Wei-Jen Hsueh, Jen-Kuei Li, Chiu-Cheng Lin
  • APPARATUS AND METHOD FOR DETECTING ELECTRONIC DEVICE TESTING SOCKET
    Publication number: 20090189626
    Abstract: An apparatus for detecting an electronic device testing socket including a testing base, a detecting circuit board, a depth gauge, and a conductive pressing block is provided. The detecting circuit board disposed on the testing base has a carrying surface for carrying an electronic device testing socket. The electronic device testing socket includes a plurality of pin units, and each of the pin units includes an S-shaped pin and a pair of elastic rods accommodated within recesses thereof. The depth gauge disposed on the testing base presses against a top surface of the conductive pressing block, and presses with a bottom surface thereof against the electronic device testing socket. The depth gauge is adapted to adjust a distance between the top surface of the conductive pressing block and the carrying surface. The detecting circuit board is electrically connected to the pin units for detecting the status of the pin units.
    Type: Application
    Filed: March 26, 2008
    Publication date: July 30, 2009
    Applicant: Advanced Semiconductor Engineering, Inc.
    Inventors: Ping-Cheng Wen, Wei-Jen Hsueh, Jen-Kuei Li, Chiu-Cheng Lin