Patents by Inventor Ping-Chun Tai

Ping-Chun Tai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD AND SYSTEM FOR DETECTING POTENTIAL RELIABILITY FAILURES OF INTEGRATED CIRCUIT
    Publication number: 20060176067
    Abstract: A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether an undesired connection has occurred due to the bridging effect between the conducting lines.
    Type: Application
    Filed: April 17, 2006
    Publication date: August 10, 2006
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yue-Der Chih, Ping-Chun Tai
  • Method of detecting potential bridging effects between conducting lines in an integrated circuit
    Patent number: 7053647
    Abstract: A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether an undesired connection has occurred due to the bridging effect between the conducting lines.
    Type: Grant
    Filed: May 7, 2004
    Date of Patent: May 30, 2006
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yue-Der Chih, Ping-Chun Tai
  • Method and system for detecting potential reliability failures of integrated circuit
    Publication number: 20050248352
    Abstract: A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether an undesired connection has occurred due to the bridging effect between the conducting lines.
    Type: Application
    Filed: May 7, 2004
    Publication date: November 10, 2005
    Inventors: Yue-Der Chih, Ping-Chun Tai