Abstract: A method provides testing of an electronic circuit test system that includes a test fixture having headed and headless test probes, a shorting plate and a test probe verification plate with apertures. A probe verification test includes: moving the test probe verification plate and the shorting plate into position, where the shorting plate engages any test probe that extends through an aperture of the verification plate; and transmitting an electrical signal to each of the test probes. The electricity flow associated with each of the test probes is analyzed to determine if any of the headless test probes have an open circuit. In response to detecting an open circuit: one or more of the headless test probes are indicated as (a) defective in the test fixture or (b) missing from the test fixture; and the specific locations in the test fixture of the defective or missing test probes are identified.

Abstract: A method provides testing of an electronic circuit test system that includes a test fixture having headed and headless test probes, a shorting plate and a test probe verification plate with apertures. A probe verification test includes: moving the test probe verification plate and the shorting plate into position, where the shorting plate engages any test probe that extends through an aperture of the verification plate; and transmitting an electrical signal to each of the test probes. The electricity flow associated with each of the test probes is analyzed to determine if any of the headless test probes have an open circuit. In response to detecting an open circuit: one or more of the headless test probes are indicated as (a) defective in the test fixture or (b) missing from the test fixture; and the specific locations in the test fixture of the defective or missing test probes are identified.