Abstract: Method and system for performing close-loop analysis to electronic component failures are provided. The system establishes an electronic component fault tree of physics of failure (FTPF), converts the FTPF into a failure locating fault tree, establishes an electronic component fault dictionary with the cause of failure mechanism corresponding to failure characteristics, and performs close-loop analysis to the electronic component according to the fault tree and the fault dictionary.

Abstract: Method and system for performing close-loop analysis to electronic component failures are provided. The system establishes an electronic component fault tree of physics of failure (FTPF), converts the FTPF into a failure locating fault tree, establishes an electronic component fault dictionary with the cause of failure mechanism corresponding to failure characteristics, and performs close-loop analysis to the electronic component according to the fault tree and the fault dictionary.

Abstract: A method and system for performing component fault problem close loop analysis are provided. The system establishes a component failure physics fault tree, converts the failure physics fault tree into a failure locating fault tree, establishes, a component fault dictionary with failure mechanism cause corresponding to failure characteristics and performs fault problem close loop analysis to the component according to the fault tree and the fault dictionary. By the method and system of the present disclosure, it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree.