Abstract: A switching activity report of simulated switching activities of a semiconductor circuit is accessed. A plurality of glitch bottleneck ratios corresponding to a plurality of pins in the semiconductor circuit are determined, comprising by: setting an initial bottleneck ratio on a leaf output pin; and backward traversing the semiconductor circuit to determine a plurality of glitch bottleneck ratios of pins in a fan-in cone of the leaf output pin. A plurality of total glitch powers associated with the plurality of pins is determined, a total glitch power of the plurality of total glitch powers being determined based on a glitch bottleneck ratio and a glitch power of a corresponding pin. One or more critical bottleneck pins among the plurality of pins are identified based on the plurality of total glitch powers. One or more gates associated with the one or more critical bottleneck pins are adjusted to reduce corresponding one or more total glitch powers of the one or more gates.

Abstract: A signoff process includes: accessing circuit information of a circuit; performing, using an analysis and optimization engine, power analysis and optimization on the circuit to generate an optimized circuit, the power analysis and optimization being performed using an input pattern; performing, using a simulator, a simulation on at least a portion of an optimized circuit, the simulation being performed using the input pattern used in the power analysis and optimization; and outputting a simulation result to the analysis and optimization engine; wherein the analysis and optimization engine and the simulator are integrated.

Abstract: A signoff process includes: accessing circuit information of a circuit; performing, using an analysis and optimization engine, power analysis and optimization on the circuit to generate an optimized circuit, the power analysis and optimization being performed using an input pattern; performing, using a simulator, a simulation on at least a portion of an optimized circuit, the simulation being performed using the same input pattern; and outputting a simulation result to the analysis and optimization engine; wherein the analysis and optimization engine and the simulator are integrated.

Abstract: A switching activity report of simulated switching activities of a semiconductor circuit is accessed. A plurality of glitch bottleneck ratios corresponding to a plurality of pins in the semiconductor circuit are determined, comprising by: setting an initial bottleneck ratio on a leaf output pin; and backward traversing the semiconductor circuit to determine a plurality of glitch bottleneck ratios of pins in a fan-in cone of the leaf output pin. A plurality of total glitch powers associated with the plurality of pins is determined, a total glitch power of the plurality of total glitch powers being determined based on a glitch bottleneck ratio and a glitch power of a corresponding pin. One or more critical bottleneck pins among the plurality of pins are identified based on the plurality of total glitch powers. One or more gates associated with the one or more critical bottleneck pins are adjusted to reduce corresponding one or more total glitch powers of the one or more gates.

Abstract: Improving an initial via in a circuit comprises: obtaining layout information associated with an initial via structure in a circuit, the initial via comprising an initial lower metal enclosure and an initial upper metal enclosure connected by an initial cut; determining layout information associated with a multiconnection via structure comprising a plurality of sibling vias having at least one additional upper metal enclosure and at least one additional lower metal enclosure; updating the layout information associated with the initial via with the layout information associated with the multiconnection via structure; and outputting the updated layout information. The plurality of sibling vias are connected by a plurality of corresponding sibling cuts, and the multiconnection via structure has lower resistance than the initial via structure. In some embodiments, the multiconnection via is efficiently represented in using a master template.

Abstract: Improving an initial via in a circuit comprises: obtaining layout information associated with an initial via structure in a circuit, the initial via comprising an initial lower metal enclosure and an initial upper metal enclosure connected by an initial cut; determining layout information associated with a multiconnection via structure comprising a plurality of sibling vias having at least one additional upper metal enclosure and at least one additional lower metal enclosure; updating the layout information associated with the initial via with the layout information associated with the multiconnection via structure; and outputting the updated layout information. The plurality of sibling vias are connected by a plurality of corresponding sibling cuts, and the multiconnection via structure has lower resistance than the initial via structure. In some embodiments, the multiconnection via is efficiently represented in using a master template.

Abstract: A placed netlist is routed. A circuit is obtained that implements the placed netlist. A net in the circuit is identified to be enhanced. Space adjacent to a wire associated with the net that would accommodate a parallel wire is reserved.

Abstract: A set of multi-corner multimode (MCMM) databases that correspond to a set of working scenarios are accessed. A full timing update on the set of MCMM databases, for the set of working scenarios, is applied. A graph based analysis (GBA) timing calibration is performed on the databases, for the set of working scenarios to obtain a set of GBA-calibrated databases. Multiphase optimizations on the set of GBA-calibrated databases are iteratively performed to generate a set of optimized databases, including: performing a phase-specific optimization on the set of GBA-calibrated database to obtain an improved set of databases, and recalibrating GBA timing on the set of improved databases prior to a next phase-specific optimization.

Abstract: A database is constructed based on a batch PBA performed on a plurality of paths of an integrated circuit. A local PBA is performed on a portion of a selected path. A selected optimization move is identified on the portion of the selected path, based on a result of the local PBA that best meets a set of constraints. A path-wide PBA is performed for an updated path that is based on the selected path incorporating the selected optimization move. The selected optimization move is committed in a netlist associated with the integrated circuit.

Abstract: A graph-based analysis (GBA) output is obtained comprising timing information pertaining to a plurality of paths in an integrated circuit. A path-based analysis (PBA) is performed on the GBA output to analyze timing of the plurality of paths and generate a set of improved timing results; wherein the physical measurements used by the PBA are more accurate than the physical measurements used by the GBA. The PBA result is output to an optimizer to automatically adjust the circuit.

Abstract: A plurality of multi-corner multimode (MCMM) databases are accessed, wherein at least one of the plurality of MCMM databases corresponds to a first optimization scenario, and at least one of the plurality of MCMM databases corresponds to a second optimization scenario. A first optimization move is performed on paths in the first optimization scenario. The first optimization move is verified using GBA on paths in the second optimization scenario to determine that the first optimization move does not cause timing violations outside an MCMM database associated with the first optimization scenario.

Abstract: Performing RC analysis in a hierarchical circuit design includes: accessing hierarchical circuit data in the hierarchical circuit design, the hierarchical circuit data comprising top-level data and lower-level block data; obtaining hierarchical RC information; combining RC information on boundary paths between blocks and RC information on boundary paths within blocks to generate boundary RC information; performing RC analysis using the boundary RC information to determine a timing delay; and comparing the timing delay with a desired delay to determine whether an RC timing is closed.

Abstract: Modifying a hierarchical circuit design includes accessing hierarchical circuit data in a hierarchical circuit design comprising top level block data and lower level block data; performing timing analysis on a selected portion of the hierarchical circuit data to determine whether timing closure is achieved; and in the event that timing closure is not achieved, determining, within a top level design process, an optimization move on the selected portion of the hierarchical circuit data; wherein the selected portion of the hierarchical circuit data includes a selected portion of the top level block data and a selected portion of the lower level block data.

Abstract: A route technique includes: receiving an input specifying a plurality of semiconductor device components and their logical connections; determining route information pertaining to a plurality of routes that connect in one or more metal layers the semiconductor device components according to their logical connections, the determination being based at least in part on a plurality of predefined tracks associated with a metal layer; and outputting at least a portion of the route information. A first portion of the plurality of predefined tracks corresponds to a first color and a second portion of the plurality of predefined tracks corresponds to a second color.

Abstract: Modifying a hierarchical circuit design includes: accessing hierarchical circuit data in the hierarchical circuit design; performing timing analysis on a selected portion of the hierarchical circuit data to determine whether inter-block timing closure is achieved; and in the event that inter-block timing closure is not achieved, performing a set of one or more fixes on the selected portion of the hierarchical circuit data to achieve inter-block timing closure. The selected portion of the hierarchical circuit data includes a selected portion of top-level block data and a selected portion of lower-level block data. Accessing hierarchical circuit data, performing timing analysis, and in the event that inter-block timing closure is not achieved, performing the set of one or more fixes are performed within a top-level design process.

Abstract: Modifying a hierarchical circuit design includes accessing hierarchical circuit data in the hierarchical circuit design; performing timing analysis and modifications on a selected portion of the hierarchical circuit data to achieve inter-block timing closure; and performing timing analysis and modifications on the hierarchical circuit data, while accounting for a modification made on the selected portion of the hierarchical circuit data, to achieve intra-block timing closure.

Abstract: A method of identifying potential clock qualifiers in netlist description of an integrated circuit, the netlist comprising logic elements. The method comprises the steps of initializing every net of the netlist to a speed of zero, identifying all potential clock nets so that all signals with a path to a clock source has a speed of one, computing the maximum speed of each output net of each of the logic elements in the netlist, and marking as a potential clock qualifier any net of the netlist that is input to the logic elements in the netlist that is slower than the maximum speed of any net that is input to the logic elements.