Abstract: Examples of techniques for projection of images on reflective displays is described. In an example implementation, an image is projected on a reflective display. Regions of a first predefined color of the projected image are identified, and a first set of pixels of the reflective display that overlap the identified regions is biased to display a second predefined color by the first set of pixels.

Abstract: Examples of techniques for projection of images on reflective displays is described. In an example implementation, an image is projected on a reflective display. Regions of a first predefined color of the projected image are identified, and a first set of pixels of the reflective display that overlap the identified regions is biased to display a second predefined color by the first set of pixels.

Abstract: An inspection apparatus is capable for inspecting at least one light-emitting device. The inspection apparatus includes a working machine and an inspection light source. The inspection light source is disposed on the working machine and located above the light-emitting device. A dominant wavelength of the inspection light source is smaller than a dominant wavelength of the light-emitting device so as to excite the light-emitting device and get an optical property of the light-emitting device.

Abstract: A detection apparatus for light-emitting diode chip comprising a substrate with the function of photoelectric conversion and a probing device is disclosed. The substrate is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two conductive elements. The two ends of the conductive elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Some of the light beams are emitted from the light-emitting diode chip toward the substrate such that the light beams emitted by the light-emitting diode chip are converted into an electric signal by the substrate.

Abstract: An image-capturing device having an image identification mechanism is provided. The image-capturing device comprises a first and a second flashlight modules, a processing module and an image-capturing module. The first and the second flashlight modules generate a first and a second color lights respectively according to a first and a second currents. The processing module controls the first and the second flashlight modules to flash light at an object sequentially within a time interval. The image-capturing module generates a first frame according to the object and the first color light and generates a second frame according to the object and the second color light. The processing module subtracts the pixels in the first and the second frames to retrieve a foreground area. A color difference between the first and the second frames for each the pixels in the foreground area is larger than a threshold value.

Abstract: An inspection apparatus is capable for inspecting at least one light-emitting device. The inspection apparatus includes a working machine and an inspection light source. The inspection light source is disposed on the working machine and located above the light-emitting device. A dominant wavelength of the inspection light source is smaller than a dominant wavelength of the light-emitting device so as to excite the light-emitting device and get an optical property of the light-emitting device.

Abstract: An image-capturing device having an image identification mechanism is provided. The image-capturing device comprises a first and a second flashlight modules, a processing module and an image-capturing module. The first and the second flashlight modules generate a first and a second color lights respectively according to a first and a second currents. The processing module controls the first and the second flashlight modules to flash light at an object sequentially within a time interval. The image-capturing module generates a first frame according to the object and the first color light and generates a second frame according to the object and the second color light. The processing module subtracts the pixels in the first and the second frames to retrieve a foreground area. A color difference between the first and the second frames for each the pixels in the foreground area is larger than a threshold value.

Abstract: A detection apparatus for light-emitting diode chip comprising a substrate with the function of photoelectric conversion and a probing device is disclosed. The substrate is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two conductive elements. The two ends of the conductive elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Some of the light beams are emitted from the light-emitting diode chip toward the substrate such that the light beams emitted by the light-emitting diode chip are converted into an electric signal by the substrate.

Abstract: A detection apparatus for light-emitting diode chip comprising a light-collecting apparatus having an opening, a bracing component and a probing device is disclosed. The bracing component is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two flexible current-transporting elements. The two ends of the current-transporting elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Besides, the detection apparatus for light-emitting diode chip of the present invention further comprises a thimble to push the light-emitting diode chip into the inside of the light-collecting apparatus via the opening such that the light beams emitted by the light-emitting diode chip are collected by the light-collecting apparatus.