Abstract: A semiconductor device includes a field effect transistor (FET). The FET includes a gate electrode in a gate layer. The gate electrode has a first gate length and a second gate length. The second gate length is greater than the first gate length. The FET also includes an active region in a active region layer. The active region includes a source region and a drain region. The active region layer is beneath the gate layer. The FET has a first channel under the gate electrode having the first gate length and between the source region and the drain region. The FET also has a second channel under the gate electrode having the second gate length and between the source region and the drain region.

Abstract: Circuits and methods for generating a bypass pulse to an RF circuit that increases the response time of the circuit to mode changes. Embodiments include a pulse generation circuit that it is self-initiated and self-terminated, generating a bypass pulse as a function of voltages V1 and V2 along a signal path. Voltage V3, a scaled version of V1, is compared to a voltage V4 derived from V2 and a pulse is output while V3>V4. The pulse temporarily lowers the signal path impedance, reducing the RC time constant of the signal path and allowing fast charging of components coupled to the signal path. The pulse may be used with any other circuit that needs a faster settling time after a mode change but is slowed down by an RC time constant. Usage also extends to providing for rapid discharge of the signal path by adding additional logic components.

Abstract: Circuits and methods for generating a bypass pulse to an RF circuit that increases the response time of the circuit to mode changes. Embodiments include a pulse generation circuit that it is self-initiated and self-terminated, generating a bypass pulse as a function of voltages V1 and V2 along a signal path. Voltage V3, a scaled version of V1, is compared to a voltage V4 derived from V2 and a pulse is output while V3>V4. The pulse temporarily lowers the signal path impedance, reducing the RC time constant of the signal path and allowing fast charging of components coupled to the signal path. The pulse may be used with any other circuit that needs a faster settling time after a mode change but is slowed down by an RC time constant. Usage also extends to providing for rapid discharge of the signal path by adding additional logic components.

Abstract: Circuits and methods for generating a bypass pulse to an RF circuit that increases the response time of the circuit to mode changes. Embodiments include a pulse generation circuit that it is self-initiated and self-terminated, generating a bypass pulse as a function of voltages V1 and V2 along a signal path. Voltage V3, a scaled version of V1, is compared to a voltage V4 derived from V2 and a pulse is output while V3>V4. The pulse temporarily lowers the signal path impedance, reducing the RC time constant of the signal path and allowing fast charging of components coupled to the signal path. The pulse may be used with any other circuit that needs a faster settling time after a mode change but is slowed down by an RC time constant. Usage also extends to providing for rapid discharge of the signal path by adding additional logic components.

Abstract: Circuits and methods for generating a bypass pulse to an RF circuit that increases the response time of the circuit to mode changes. Embodiments include a pulse generation circuit that it is self-initiated and self-terminated, generating a bypass pulse as a function of voltages V1 and V2 along a signal path. Voltage V3, a scaled version of V1, is compared to a voltage V4 derived from V2 and a pulse is output while V3>V4. The pulse temporarily lowers the signal path impedance, reducing the RC time constant of the signal path and allowing fast charging of components coupled to the signal path. The pulse may be used with any other circuit that needs a faster settling time after a mode change but is slowed down by an RC time constant. Usage also extends to providing for rapid discharge of the signal path by adding additional logic components.

Abstract: Circuits and methods for generating a bypass pulse to an RF circuit that increases the response time of the circuit to mode changes. Embodiments include a pulse generation circuit that it is self-initiated and self-terminated, generating a bypass pulse as a function of voltages V1 and V2 along a signal path. Voltage V3, a scaled version of V1, is compared to a voltage V4 derived from V2 and a pulse is output while V3>V4. The pulse temporarily lowers the signal path impedance, reducing the RC time constant of the signal path and allowing fast charging of components coupled to the signal path. The pulse may be used with any other circuit that needs a faster settling time after a mode change but is slowed down by an RC time constant. Usage also extends to providing for rapid discharge of the signal path by adding additional logic components.

Abstract: A communication circuit may include a first pair of digital-to-analog converters (DACs) coupled to an input of a first mixer and configured to generate first baseband signals. The communication circuit may further include a second pair of DACs coupled to an input of a second mixer and configured to generate second baseband signals. The second baseband signals may be shifted in phase relative to the first baseband signals.

Abstract: A communication circuit may include a first pair of digital-to-analog converters (DACs) coupled to an input of a first mixer and configured to generate first baseband signals. The communication circuit may further include a second pair of DACs coupled to an input of a second mixer and configured to generate second baseband signals. The second baseband signals may be shifted in phase relative to the first baseband signals.

Abstract: In an example, there is disclosed herein a digital-to-analog converter (DAC) including a correction circuit for a clock, including a differential clock. Error correction may take place within the DAC core, by means of replica cells that are substantially similar to conversion cells. Rather than contributing their output to the converted signal, the replica cells may be configured to provide a feedback signal to a clock receiver with information for correcting the clock signal. The feedback signal may be operable to correct errors, for example, in duty cycle and crosspoint, as measured at the DAC core.

Abstract: In an example, there is disclosed herein a digital-to-analog converter (DAC) including a correction circuit for a clock, including a differential clock. Error correction may take place within the DAC core, by means of replica cells that are substantially similar to conversion cells. Rather than contributing their output to the converted signal, the replica cells may be configured to provide a feedback signal to a clock receiver with information for correcting the clock signal. The feedback signal may be operable to correct errors, for example, in duty cycle and crosspoint, as measured at the DAC core.