Patents by Inventor Pinhas Girshovitz

Pinhas Girshovitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10996214
    Abstract: Methods and systems for use in sperm analysis are described. A method for processing measured data comprising at least interferometric phase data of label-free sperm cell(s), the processing comprising determining topographic optical phase delay map of the label-free sperm, determining at least one physical parameter of the label-free sperm, and generating data indicative of sperm quality for the label-free sperm. A device comprising a flow channel comprising an inlet for receiving fluid containing cells, a selection zone and at least two outlets at said selection zone; and a flow-driving mechanism comprising a flow-driving unit configured and operable to generate flow of said fluid from said inlet towards at least first of said at least two outlets, and a collecting driving unit selectively operating along the direction of a second outlet of said at least two outlets to direct a portion of interest of said fluid towards said second outlet.
    Type: Grant
    Filed: January 31, 2017
    Date of Patent: May 4, 2021
    Assignee: TECHNOLOGY INNOVATION MOMENTUM FUND (ISRAEL) LIMITED PARTNERSHIP
    Inventors: Natan Tzvi Shaked, Pinhas Girshovitz, Itay Barnea, Michal Balberg, Simcha Mirsky, Pinkie Jacob Eravuchira
  • Patent number: 10337851
    Abstract: Techniques for extracting phase data of off-axis interferogram images are disclosed. At least one sample-related interferogram image associated with a sample is spectrally decomposed to obtain a set of frequency components thereof, and a portion of the set of frequency components is used to generate at least one complex image having a reduced size being smaller in size than the sample-related interferogram image and being indicative of the phase data of the at least one sample-related interferogram image. The reduced size complex image is then used to generate a phase image of the least one sample-related interferogram image.
    Type: Grant
    Filed: April 4, 2016
    Date of Patent: July 2, 2019
    Assignee: RAMOT AT TEL-AVIV UNIVERSITY LTD.
    Inventors: Pinhas Girshovitz, Natan Tzvi Shaked
  • Patent number: 9910256
    Abstract: The present invention provides a novel simple, portable, compact and inexpensive approach for interferometric optical thickness measurements that can be easily incorporated into an existing microscope (or other imaging systems) with existing cameras. According to the invention, the interferometric device provides a substantially stable, easy to align common path interferometric geometry, while eliminating a need for controllably changing the optical path of the beam. To this end, the inexpensive and easy to align interferometric device of the invention is configured such that it applies the principles of the interferometric measurements to a sample beam only, being a single input into the interferometric device.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: March 6, 2018
    Assignee: RAMOT AT TEL-AVIV UNIVERSITY LTD.
    Inventors: Natan Tzvi Shaked, Pinhas Girshovitz
  • Patent number: 9816801
    Abstract: The present invention provides a sample inspection and quantitative imaging system and method for performing off-axis interferometric imaging while enabling to record off-axis holograms in an extended field of view (FOV) than possible using a given camera and imaging setup, and thus to enlarge (e.g. double, triple, or even more than this) the interferometric FOV, without changing the imaging parameters, such as the magnification and the resolution.
    Type: Grant
    Filed: March 17, 2016
    Date of Patent: November 14, 2017
    Assignee: RAMOT AT TEL AVIV UNIVERSITY LTD
    Inventors: Pinhas Girshovitz, Natan Tzvi Shaked
  • Publication number: 20170205390
    Abstract: Methods and systems for use in sperm analysis are described. A method for processing measured data comprising at least interferometric phase data of label-free sperm cell(s), the processing comprising determining topographic optical phase delay map of the label-free sperm, determining at least one physical parameter of the label-free sperm, and generating data indicative of sperm quality for the label-free sperm. A device comprising a flow channel comprising an inlet for receiving fluid containing cells, a selection zone and at least two outlets at said selection zone; and a flow-driving mechanism comprising a flow-driving unit configured and operable to generate flow of said fluid from said inlet towards at least first of said at least two outlets, and a collecting driving unit selectively operating along the direction of a second outlet of said at least two outlets to direct a portion of interest of said fluid towards said second outlet.
    Type: Application
    Filed: January 31, 2017
    Publication date: July 20, 2017
    Inventors: Natan Tzvi SHAKED, Pinhas GIRSHOVITZ, Itay BARNEA, Michal BALBERG, Simcha MIRSKY, Pinkie Jacob ERAVUCHIRA
  • Publication number: 20170153434
    Abstract: The present invention provides a novel simple, portable, compact and inexpensive approach for interferometric optical thickness measurements that can be easily incorporated into an existing microscope (or other imaging systems) with existing cameras. According to the invention, the interferometric device provides a substantially stable, easy to align common path interferometric geometry, while eliminating a need for controllably changing the optical path of the beam. To this end, the inexpensive and easy to align interferometric device of the invention is configured such that it applies the principles of the interferometric measurements to a sample beam only, being a single input into the interferometric device.
    Type: Application
    Filed: December 14, 2016
    Publication date: June 1, 2017
    Inventors: Natan Tzvi SHAKED, Pinhas GIRSHOVITZ
  • Patent number: 9574868
    Abstract: The present invention provides a novel simple, portable, compact and inexpensive approach for interferometric optical thickness measurements that can be easily incorporated into an existing microscope (or other imaging systems) with existing cameras. According to the invention, the interferometric device provides a substantially stable, easy to align common path interferometric geometry, while eliminating a need for controllably changing the optical path of the beam. To this end, the inexpensive and easy to align interferometric device of the invention is configured such that it applies the principles of the interferometric measurements to a sample beam only, being a single input into the interferometric device.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: February 21, 2017
    Assignee: RAMOT AT TEL-AVIV UNIVERSITY LTD.
    Inventors: Natan Tzvi Shaked, Pinhas Girshovitz
  • Publication number: 20160305761
    Abstract: The present invention provides a sample inspection and quantitative imaging system and method for performing off-axis interferometric imaging while enabling to record off-axis holograms in an extended field of view (FOV) than possible using a given camera and imaging setup, and thus to enlarge (e.g. double, triple, or even more than this) the interferometric FOV, without changing the imaging parameters, such as the magnification and the resolution.
    Type: Application
    Filed: March 17, 2016
    Publication date: October 20, 2016
    Inventors: Pinhas GIRSHOVITZ, Natan Tzvi SHAKED
  • Publication number: 20160290782
    Abstract: Techniques for extracting phase data of off-axis interferogram images are disclosed. At least one sample-related interferogram image associated with a sample is spectrally decomposed to obtain a set of frequency components thereof, and a portion of the set of frequency components is used to generate at least one complex image having a reduced size being smaller in size than the sample-related interferogram image and being indicative of the phase data of the at least one sample-related interferogram image. The reduced size complex image is then used to generate a phase image of the least one sample-related interferogram image.
    Type: Application
    Filed: April 4, 2016
    Publication date: October 6, 2016
    Inventors: Pinhas GIRSHOVITZ, Natan Tzvi SHAKED
  • Publication number: 20160259158
    Abstract: The present invention discloses an optical arrangement to be associated with an optical system and an external imaging system, a sample inspection imaging system and a method for generating a differential interference contrast (DIC) image. The optical arrangement comprises a beam-shearing interference module including at least two optical elements being at least partially reflective. A first optical element is configured and operable for receiving an image from the imaging system including an input beam and splitting the input beam into first and second light beams of the same amplitude and phase modulation. A second optical element is accommodated in first and second optical paths of the first and second light beams. At least one of the first and second optical elements is configured and operable for creating a shear between the first and second light beams.
    Type: Application
    Filed: April 6, 2016
    Publication date: September 8, 2016
    Inventors: Pinhas GIRSHOVITZ, Natan Tzvi SHAKED
  • Publication number: 20150049343
    Abstract: The present invention provides a novel simple, portable, compact and inexpensive approach for interferometric optical thickness measurements that can be easily incorporated into an existing microscope (or other imaging systems) with existing cameras. According to the invention, the interferometric device provides a substantially stable, easy to align common path interferometric geometry, while eliminating a need for controllably changing the optical path of the beam. To this end, the inexpensive and easy to align interferometric device of the invention is configured such that it applies the principles of the interferometric measurements to a sample beam only, being a single input into the interferometric device.
    Type: Application
    Filed: March 14, 2013
    Publication date: February 19, 2015
    Inventors: Natan Tzvi Shaked, Pinhas Girshovitz