Patents by Inventor Piyush Dak

Piyush Dak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10984876
    Abstract: Various methods include receiving, by a controller, a temperature reading of a memory array, the temperature reading includes a temperature value; determining the temperature value is below a first threshold; in response, modifying a duration of a verify cycle of a write operation to create a modified verify cycle; then programming a first data into the memory array using the write operation that uses the modified verify cycle. Methods additionally include receiving a second temperature reading of the memory array, the second temperature reading includes a second temperature value; determining the second temperature value is below a second threshold, in response, decreasing the duration of a verify cycle of a verify cycle to create a second verify cycle, where the second verify cycle is shorter than the modified verify cycle; and then programming a second data into the memory array using the write operation that uses the second verify cycle.
    Type: Grant
    Filed: June 19, 2019
    Date of Patent: April 20, 2021
    Assignee: SanDiskTechnologies LLC
    Inventors: Piyush Dak, Mohan Dunga, Chao Qin, Muhammad Masuduzzaman, Xiang Yang
  • Publication number: 20200402594
    Abstract: Various methods include receiving, by a controller, a temperature reading of a memory array, the temperature reading includes a temperature value; determining the temperature value is below a first threshold; in response, modifying a duration of a verify cycle of a write operation to create a modified verify cycle; then programming a first data into the memory array using the write operation that uses the modified verify cycle. Methods additionally include receiving a second temperature reading of the memory array, the second temperature reading includes a second temperature value; determining the second temperature value is below a second threshold, in response, decreasing the duration of a verify cycle of a verify cycle to create a second verify cycle, where the second verify cycle is shorter than the modified verify cycle; and then programming a second data into the memory array using the write operation that uses the second verify cycle.
    Type: Application
    Filed: June 19, 2019
    Publication date: December 24, 2020
    Applicant: SanDisk Technologies LLC
    Inventors: Piyush Dak, Mohan Dunga, Chao Qin, Muhammad Masuduzzaman, Xiang Yang
  • Patent number: 10825827
    Abstract: A non-volatile storage apparatus comprises a non-volatile memory structure and an I/O interface. A portion of the memory die is used as a pool capacitor for the I/O interface.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: November 3, 2020
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: Mohan Dunga, James Kai, Venkatesh P. Ramachandra, Piyush Dak, Luisa Lin, Masaaki Higashitani
  • Patent number: 10818685
    Abstract: A non-volatile storage apparatus comprises a non-volatile memory structure and an I/O interface. A portion of the memory die is used as a pool capacitor for the I/O interface.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: October 27, 2020
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: Mohan Dunga, James Kai, Venkatesh P. Ramachandra, Piyush Dak, Luisa Lin, Masaaki Higashitani
  • Publication number: 20200248230
    Abstract: A process and device for electrostatically controlling an ionic environment in a droplet, such as in a droplet-based platform including polymerase-chain reaction (PCR) applications. The process includes providing a chip that comprises at least a pair of electrodes, placing a salt-containing droplet on the chip, and then applying a bias across the electrodes to accumulate ions near surfaces of the electrodes, thereby depleting a bulk salt concentration in regions of the droplet away from the electrodes.
    Type: Application
    Filed: September 4, 2019
    Publication date: August 6, 2020
    Applicant: PURDUE RESEARCH FOUNDATION
    Inventors: Muhammad Ashraful Alam, Piyush Dak
  • Patent number: 10559370
    Abstract: A circuit includes a detection circuit configured to determine a capacitance delay (RC-delay) in an initial stage of a read or program operation and to adjust timing for detecting data in a subsequent stage, or portion of a stage, of the same read or programming operation. In particular, during a program operation a detection circuit may be configured to detect a pre-charge time for a bit line and adjust a timing of subsequent verify stages of the bit line during the same program operation based on the detected pre-charge time. Additionally, a word line circuit may be configured to detect a pre-charge time for a word line during an initial stage of a read operation and adjust read timing for a subsequent portion of the same read stage, or subsequent read stage of the read operation based on the detected word line pre-charge time.
    Type: Grant
    Filed: March 22, 2018
    Date of Patent: February 11, 2020
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: Xiang Yang, Piyush Dak, Wei Zhao, Huai-Yuan Tseng, Deepanshu Dutta, Mohan Dunga
  • Patent number: 10541031
    Abstract: A program circuit may two-dimensionally program data into cells by applying different selected bit line or channel voltages to different bit lines or channels located in different bit line zones of a block during a program operation. The block may be further separated or divided into word line zones. The program circuit may adjust the different bit line or channel voltages as it programs in different word line zones of the block. In accordance with the two-dimensional programming, the program circuit may perform single-pulse program-only SLC program operations.
    Type: Grant
    Filed: June 15, 2018
    Date of Patent: January 21, 2020
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: Mohan Vamsi Dunga, Piyush Dak, Pitamber Shukla
  • Publication number: 20200013794
    Abstract: A non-volatile storage apparatus comprises a non-volatile memory structure and an I/O interface. A portion of the memory die is used as a pool capacitor for the I/O interface.
    Type: Application
    Filed: September 25, 2018
    Publication date: January 9, 2020
    Applicant: SANDISK TECHNOLOGIES LLC
    Inventors: Mohan Dunga, James Kai, Venkatesh P. Ramachandra, Piyush Dak, Luisa Lin, Masaaki Higashitani
  • Publication number: 20200013795
    Abstract: A non-volatile storage apparatus comprises a non-volatile memory structure and an I/O interface. A portion of the memory die is used as a pool capacitor for the I/O interface.
    Type: Application
    Filed: September 25, 2018
    Publication date: January 9, 2020
    Applicant: SANDISK TECHNOLOGIES LLC
    Inventors: Mohan Dunga, James Kai, Venkatesh P. Ramachandra, Piyush Dak, Luisa Lin, Masaaki Higashitani
  • Publication number: 20190385680
    Abstract: A program circuit may two-dimensionally program data into cells by applying different selected bit line or channel voltages to different bit lines or channels located in different bit line zones of a block during a program operation. The block may be further separated or divided into word line zones. The program circuit may adjust the different bit line or channel voltages as it programs in different word line zones of the block. In accordance with the two-dimensional programming, the program circuit may perform single-pulse program-only SLC program operations.
    Type: Application
    Filed: June 15, 2018
    Publication date: December 19, 2019
    Applicant: SanDisk Technologies LLC
    Inventors: Mohan Vamsi Dunga, Piyush Dak, Pitamber Shukla
  • Patent number: 10460814
    Abstract: Embodiments of the present disclosure generally relate to non-volatile memory devices, such as flash memory, and sensing operation methods including locking out high conduction current memory cells of the memory devices. In one embodiment, a method of sensing a plurality of memory cells in an array includes conducting a lower page read of one or more demarcation threshold voltages. Each memory cell is programmable to a threshold voltage corresponding to one of multiple memory states. A middle page read of one or more demarcation threshold voltages is conducted. Memory cells identified from the lower page read are selectively locked out during the middle page read. An upper page read of one or more demarcation threshold voltages is conducted. Memory cells identified from a prior page read are selectively locked out during the upper page read.
    Type: Grant
    Filed: December 12, 2017
    Date of Patent: October 29, 2019
    Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
    Inventors: Piyush Dak, Mohan Vamsi Dunga, Pitamber Shukla
  • Publication number: 20190295669
    Abstract: A circuit includes a detection circuit configured to determine a capacitance delay (RC-delay) in an initial stage of a read or program operation and to adjust timing for detecting data in a subsequent stage, or portion of a stage, of the same read or programing operation. In particular, during a program operation a detection circuit may be configured to detect a pre-charge time for a bit line and adjust a timing of subsequent verify stages of the bit line during the same program operation based on the detected pre-charge time. Additionally, a word line circuit may be configured to detect a pre-charge time for a word line during an initial stage of a read operation and adjust read timing for a subsequent portion of the same read stage, or subsequent read stage of the read operation based on the detected word line pre-charge time.
    Type: Application
    Filed: March 22, 2018
    Publication date: September 26, 2019
    Applicant: SanDisk Technologies LLC
    Inventors: Xiang Yang, Piyush Dak, Wei Zhao, Huai-Yuan Tseng, Deepanshu Dutta, Mohan Dunga
  • Publication number: 20190180823
    Abstract: Embodiments of the present disclosure generally relate to non-volatile memory devices, such as flash memory, and sensing operation methods including locking out high conduction current memory cells of the memory devices. In one embodiment, a method of sensing a plurality of memory cells in an array includes conducting a lower page read of one or more demarcation threshold voltages. Each memory cell is programmable to a threshold voltage corresponding to one of multiple memory states. A middle page read of one or more demarcation threshold voltages is conducted. Memory cells identified from the lower page read are selectively locked out during the middle page read. An upper page read of one or more demarcation threshold voltages is conducted. Memory cells identified from a prior page read are selectively locked out during the upper page read.
    Type: Application
    Filed: December 12, 2017
    Publication date: June 13, 2019
    Inventors: Piyush DAK, Mohan Vamsi DUNGA, Pitamber SHUKLA
  • Publication number: 20160251699
    Abstract: A process and device for electrostatically controlling an ionic environment in a droplet, such as in a droplet-based platform including polymerase-chain reaction (PCR) applications. The process includes providing a chip that comprises at least a pair of electrodes, placing a salt-containing droplet on the chip, and then applying a bias across the electrodes to accumulate ions near surfaces of the electrodes, thereby depleting a bulk salt concentration in regions of the droplet away from the electrodes.
    Type: Application
    Filed: February 26, 2016
    Publication date: September 1, 2016
    Applicant: PURDUE RESEARCH FOUNDATION
    Inventors: Muhammad Ashraful Alam, Piyush Dak