Abstract: A semiconductor device includes a first diode, a second diode, a clamp circuit and a third diode. The first diode is coupled between an input/output (I/O) pad and a first voltage terminal. The second diode is coupled with the first diode, the I/O pad and a second voltage terminal. The clamp circuit is coupled between the first voltage terminal and the second voltage terminal. The second diode and the clamp circuit are configured to direct a first part of an electrostatic discharge (ESD) current flowing between the I/O pad and the first voltage terminal. The third diode, coupled to the first voltage terminal, and the second diode include a first semiconductor structure configured to direct a second part of the ESD current flowing between the I/O pad and the first voltage terminal.

Abstract: In some embodiments, a semiconductor device is provided, including a first doped region of a first conductivity type configured as a first terminal of a first diode, a second doped region of a second conductivity type configured as a second terminal of the first diode, wherein the first and second doped regions are coupled to a first voltage terminal; a first well of the first conductivity type surrounding the first and second doped regions in a layout view; a third doped region of the first conductivity type configured as a first terminal, coupled to an input/output pad, of a second diode; and a second well of the second conductivity type surrounding the third doped region in the layout view. The second and third doped regions, the first well, and the second well are configured as a first electrostatic discharge path between the I/O pad and the first voltage terminal.

Abstract: A flatness sensing device includes a pressure sensing unit and a controller. The pressure sensing unit includes a plate portion, and a pressure sensor fixed and exposed at an edge of the plate portion. A sensing surface of the pressure sensor is flush with the bottom surface of the plate portion. The pressure sensor senses a pressure or lack of pressure of an object to be tested when it touches the object to be tested. The controller receives the pressure value output from the pressure sensor and determines a flatness of the object to be tested, the controller can issue an alarm on finding non-flatness and cause the degree of flatness to be displayed to a user.

Abstract: A device to sense degree of twist in a screwdriver and the magnitude of force applied includes a contacting portion, a deformation portion, a sensing portion, and a processor. The contacting portion receives a grip and twist pressure through the deformation portion which is tiltedly fixed to the contacting portion. The deformation portion carries the sensing portion and elastically deforms under the force and/or the torsion. The sensing portion detects a deformation of the deformation portion and generates a corresponding electrical signal. The processor receives the signal and determines the values of the twist caused and the force applied.

Abstract: A speed reducer includes an input shaft, an output shaft, and a gear assembly coupled to the input shaft. The gear assembly includes a housing, an external gear, and at least two internal gears. The external gear is located within the housing and inscribes the at least two internal gears. One side of the at least two internal gears is rotatably coupled to the input shaft, and another side of the at least two internal gears is coupled to a connecting column of the output shaft. The at least two internal gears are offset on the input shaft, and the input shaft drives the at least two internal gears to maintain engagement with the external gear. The connecting column maintains transmission of the output shaft and the at least two internal gears.

Abstract: A device to sense degree of twist in a screwdriver and the magnitude of force applied includes a contacting portion, a deformation portion, a sensing portion, and a processor. The contacting portion receives a grip and twist pressure through the deformation portion which is tiltedly fixed to the contacting portion. The deformation portion carries the sensing portion and elastically deforms under the force and/or the torsion. The sensing portion detects a deformation of the deformation portion and generates a corresponding electrical signal. The processor receives the signal and determines the values of the twist caused and the force applied.

Abstract: A flatness sensing device includes a pressure sensing unit and a controller. The pressure sensing unit includes a plate portion, and a pressure sensor fixed and exposed at an edge of the plate portion. A sensing surface of the pressure sensor is flush with the bottom surface of the plate portion. The pressure sensor senses a pressure or lack of pressure of an object to be tested when it touches the object to be tested. The controller receives the pressure value output from the pressure sensor and determines a flatness of the object to be tested, the controller can issue an alarm on finding non-flatness and cause the degree of flatness to be displayed to a user.

Abstract: A speed reducer includes an input shaft, an output shaft, and a gear assembly coupled to the input shaft. The gear assembly includes a housing, an external gear, and at least two internal gears. The external gear is located within the housing and inscribes the at least two internal gears. One side of the at least two internal gears is rotatably coupled to the input shaft, and another side of the at least two internal gears is coupled to a connecting column of the output shaft. The at least two internal gears are offset on the input shaft, and the input shaft drives the at least two internal gears to maintain engagement with the external gear. The connecting column maintains transmission of the output shaft and the at least two internal gears.

Abstract: A machine for testing the parts and functions of a mobile phone includes a supporting mechanism, a platform, a receiving portion, and a detecting mechanism. The supporting mechanism is mounted in a box. The platform is slidably mounted on the supporting mechanism. The receiving portion is used to receive the mobile phone. The receiving portion is rotatably mounted on the platform. Devices within the machine are operated to test the mobile phone. A mobile phone testing system used in the testing machine is also described.

Abstract: A system for evaluating all functions of a mobile phone to benefit recycling purposes includes a robotic arm assembly, a camera test device, a touch test device, and a 3D Touch test device. The camera test device has a backlight screen and a target picture. The touch test device has at least one first stylus for applying input to a touch screen of a mobile phone. The 3D Touch test device has at least one second stylus for applying strong presses to the touch screen of the mobile phone. The robotic arm assembly can also move the mobile phone to enable image-capturing. A method for functionality-testing is also provided.

Abstract: A robot control system on a platform which can carry target objects employs a coordinate system including X, Y, and Z axes. A plane including the X and Y axis is parallel with a panel including the platform. After the coordinate system is created, a reminder is displayed and a guiding tool is placed in a position on the platform where the target objects are located, and a fastening tool for use with the guiding tool is arranged on hand of the robot. A location of the fastening tool relative to the guiding tool is adjusted according to a predefined rule. When the location of the fastening tool relative to the guiding tool is correctly adjusted, a position of the end effect of the robot is determined according to the location of the fastening tool and the relevant coordinates are stored as data.

Abstract: A testing apparatus for testing a circuit board is disclosed, which includes an upper plate, a lower plate, and an adaptor circuit board. A plurality of positioning units is received in the lower plate. Each positioning unit has a plurality of length-variable test probes secured therein. Each test probe has a shell and upper and lower probe ends at opposite ends of the shell. In test, the circuit board is put on the lower plate and the upper plate is lowered to push the circuit board and the lower plate toward the adaptor circuit board. The upper ends of the test probes engage with electrical connectors of the circuit board and the lower ends thereof engage with the adaptor circuit board whereby test of the circuit board can be automatically performed by the testing apparatus.

Abstract: A robot control system on a platform which can carry target objects employs a coordinate system including X, Y, and Z axes. A plane including the X and Y axis is parallel with a panel including the platform. After the coordinate system is created, a reminder is displayed and a guiding tool is placed in a position on the platform where the target objects are located, and a fastening tool for use with the guiding tool is arranged on hand of the robot. A location of the fastening tool relative to the guiding tool is adjusted according to a predefined rule. When the location of the fastening tool relative to the guiding tool is correctly adjusted, a position of the end effect of the robot is determined according to the location of the fastening tool and the relevant coordinates are stored as data.

Abstract: A machine for testing the parts and functions of a mobile phone includes a supporting mechanism, a platform, a receiving portion, and a detecting mechanism. The supporting mechanism is mounted in a box. The platform is slidably mounted on the supporting mechanism. The receiving portion is used to receive the mobile phone. The receiving portion is rotatably mounted on the platform. Devices within the machine are operated to test the mobile phone. A mobile phone testing system used in the testing machine is also described.

Abstract: A framework for tracking an electronic device includes at least one electronic device, a server in wireless communication with the at least one electronic device, and a tracking system implemented in the server and the at least one electronic device. The server stores personal identification information of the at least one electronic device, and a database. The tracking system is used to track the at least one electronic device after the at least one electronic device is lost or stolen. The server controls the at least one electronic device to obtain tracking information for tracking the at least one electronic device, and the at least one electronic device sends the tracking information to the server. The server tracks the at least one electronic device by searching for information in the database most closely matching the tracking information.

Abstract: A framework for tracking an electronic device includes at least one electronic device, a server in wireless communication with the at least one electronic device, and a tracking system implemented in the server and the at least one electronic device. The server stores personal identification information of the at least one electronic device, and a database. The tracking system is used to track the at least one electronic device after the at least one electronic device is lost or stolen. The server controls the at least one electronic device to obtain tracking information for tracking the at least one electronic device, and the at least one electronic device sends the tracking information to the server. The server tracks the at least one electronic device by searching for information in the database most closely matching the tracking information.

Abstract: A testing apparatus for testing a circuit board is disclosed, which includes an upper plate, a lower plate, and an adaptor circuit board. A plurality of positioning units is received in the lower plate. Each positioning unit has a plurality of length-variable test probes secured therein. Each test probe has a shell and upper and lower probe ends at opposite ends of the shell. In test, the circuit board is put on the lower plate and the upper plate is lowered to push the circuit board and the lower plate toward the adaptor circuit board. The upper ends of the test probes engage with electrical connectors of the circuit board and the lower ends thereof engage with the adaptor circuit board whereby test of the circuit board can be automatically performed by the testing apparatus.

Abstract: A method for monitoring operations of an electronic device is provided. The method includes: determining, at the electronic device, a data range of standard operations of the electronic device; storing, at the electronic device, the data range; obtaining, at the electronic device, motion data of the electronic device when the electronic device is in operation; determining, at the electronic device, whether the motion data is within the data range; and outputting, at the electronic device, an alert message representing current operation of the electronic device is unsatisfactory if the motion data is not within the data range.

Abstract: A fabricating method includes adhering an exposed surface of a first solid adhesive film to a first substrate. The second surface of the first solid adhesive film is exposed and adhered to a second substrate. A third substrate is adhered to a second substrate via a patterned second solid adhesive film, and a diaphragm layer is adhered to the third substrate via a patterned third solid adhesive film. A fourth solid adhesive film with a removable release film is adhered to the first substrate covered, followed by slicing to form wafer level lens modules.

Abstract: A fabricating method and structure form a wafer level module with a solid adhesive film. A first solid adhesive film includes a first release film and a second release film that respectively cover a first surface and a second surface of the first solid adhesive film. Openings are patterned through the first solid adhesive film. After removing parts of the first release film to expose the first surface of the first solid adhesive film, the exposed first surface of the first solid adhesive film is aligned and adhered to a first substrate.