Patents by Inventor Po-Ting Yeh

Po-Ting Yeh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12217498
    Abstract: A defect inspection system is disclosed, and comprises a linear light source, N number of cameras, a display device, a tag reader, and a modular electronic device, in which the linear light source, the cameras and the modular electronic device are used for conducting a defect inspection of an article. On the other hand, the display device, the tag reader and the modular electronic device are adopted for conducting in production of at least one labeled example. Therefore, the modular electronic device is allowed to apply a machine learning process to an image classifier under using a training dataset containing the labeled examples, thereby producing at least one new defect recognition model or updating the existing defect recognition model.
    Type: Grant
    Filed: August 15, 2022
    Date of Patent: February 4, 2025
    Assignees: Kapito Inc.
    Inventors: Feng-Tso Sun, Yi-Ting Yeh, Feng-Yu Sun, Jyun-Tang Huang, Po-Han Chou
  • Patent number: 11854854
    Abstract: A method for calibrating the alignment of a wafer is provided. A plurality of alignment position deviation (APD) simulation results are obtained form a plurality of mark profiles. An alignment analysis is performed on a mark region of the wafer with a light beam. A measured APD of the mark region of the wafer is obtained in response to the light beam. The measured APD is compared with the APD simulation results to obtain alignment calibration data. An exposure process is performed on the wafer with a mask according to the alignment calibration data.
    Type: Grant
    Filed: July 23, 2021
    Date of Patent: December 26, 2023
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Chang-Jen Chen, Wen-Yun Wang, Yen-Chun Chen, Po-Ting Yeh
  • Publication number: 20230024673
    Abstract: A method for calibrating the alignment of a wafer is provided. A plurality of alignment position deviation (APD) simulation results are obtained form a plurality of mark profiles. An alignment analysis is performed on a mark region of the wafer with a light beam. A measured APD of the mark region of the wafer is obtained in response to the light beam. The measured APD is compared with the APD simulation results to obtain alignment calibration data. An exposure process is performed on the wafer with a mask according to the alignment calibration data.
    Type: Application
    Filed: July 23, 2021
    Publication date: January 26, 2023
    Inventors: Chang-Jen CHEN, Wen-Yun WANG, Yen-Chun CHEN, Po-Ting YEH
  • Patent number: 10164547
    Abstract: A method and a system for controlling a rectifier can obtain a predicted switching interval. The method includes steps of: receiving frequency information and line information of a power generator, the line information including a switching point where a voltage or current crosses zero and a switching interval based on the frequency information; obtaining a predicted switching interval according to the frequency information and the line information, and obtaining a feedback signal according to two terminals of at least one component of the rectifier; and switching a switching signal of the rectifier within the predicted switching interval according to the feedback signal.
    Type: Grant
    Filed: August 3, 2017
    Date of Patent: December 25, 2018
    Assignee: Industrial Technology Research Institute
    Inventors: Po-Ting Yeh, Yuan-Tai Chang, Kai-Cheung Juang
  • Publication number: 20180301992
    Abstract: A method and a system for controlling a rectifier can obtain a predicted switching interval. The method includes steps of: receiving frequency information and line information of a power generator, the line information including a switching point where a voltage or current crosses zero and a switching interval based on the frequency information; obtaining a predicted switching interval according to the frequency information and the line information, and obtaining a feedback signal according to two terminals of at least one component of the rectifier; and switching a switching signal of the rectifier within the predicted switching interval according to the feedback signal.
    Type: Application
    Filed: August 3, 2017
    Publication date: October 18, 2018
    Inventors: Po-Ting Yeh, Yuan-Tai Chang, Kai-Cheung Juang