Patents by Inventor Poitr Strzyzewski

Poitr Strzyzewski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Quality surveillance of a production process
    Patent number: 6622101
    Abstract: Method for monitoring a quality of a plurality of particularly different technical product types which are produced in a quasi-parallel manufacturing process, the manufacturing method including several sequentially arranged manufacturing stations, and whereby a course of a state variable for at least one of the manufacturing stations is determined point-by-point and displayed, the method including determining as a first type number a number of product types to be monitored, determining technical product parameter which is affected in the at least one manufacturing station, allocating a measuring arrangement to the manufacturing station for measuring the technical product parameter for at least one of the monitored product types, taking a random sample of a product type whose physical state is modified in the manufacturing station, the random sample being taken the first type number of product types, determining measured values for the determined technical product parameter of the random sample, calculating an
    Type: Grant
    Filed: January 22, 2002
    Date of Patent: September 16, 2003
    Assignees: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung e.V., X-Fab Semiconductor Foundries AG.
    Inventors: Richard Oechsner, Thomas Tschaftary, Poitr Strzyzewski, Lothar Pfitzner, Claus Schneider, Peter Hennig