Abstract: A device for the interferometric measuring of an object, including a light source to generate an emitted beam, a beam splitting device for splitting the emitted beam into a measuring beam and at least first and second reference beams, an optic interference device, and first and second detectors, with the interference device and the first detector being embodied cooperating such that the measuring beam, at least partially reflected by the object, and the first reference beam are interfered on at least one detector area of the first detector. The interference device and the second detector are embodied cooperating such that the measuring beam, at least partially scattered by the object, and the second reference beam are interfered on at least one detector area of the second detector. A method is also provided for the interferometric measuring of an object.

Abstract: A coherence grid—interferometer for spatially resolved optic measurement of an object, with a light source, an interferometer, a path length—altering unit, and camera with a detection area. The interferometer cooperates with the light source and camera such that an outgoing beam is split into a measuring beam and a reference beam, the measuring beam is at least partially reflected by the object to the detection area of the camera and overlapped via a beam splitter with the reference beam such that the overlapped beams overlap the photo sensors in a planar fashion, and the optic path length—altering unit changes the optic path length of the measuring and/or reference beams. The path length—altering unit has a path scale and a path detector which detect a changing length of the optic path of the measuring and/or reference beams and the interferogram records are synchronized with the path measurement.