Patents by Inventor Prabhat Pal

Prabhat Pal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11146439
    Abstract: A method for determining coarse carrier phase and frequency offsets of an initial block of received M-QAM symbols includes creating a grid of discrete candidate phase offset values and for each candidate value: applying the candidate value to each symbol, applying a respective hard decision to each applied symbol, and computing a figure of merit based thereon. The candidate value having the best figure of merit is selected as an initial phase offset estimate. An initial frequency offset estimate is computed using the symbols updated with the initial phase offset estimate, their respective hard decisions, and an approximation of the complex exponential function. To track carrier phase and frequency offsets associated with a series of symbol blocks, for each symbol of a current block, set a binary trust weight based on comparison of a computed parameter with a threshold and use the binary trust weights to compute a phase offset error and a frequency offset error for the current block.
    Type: Grant
    Filed: December 4, 2019
    Date of Patent: October 12, 2021
    Assignee: National Instruments Corporation
    Inventors: Prabhat Pal, Aayush Verma
  • Publication number: 20210176109
    Abstract: A method for determining coarse carrier phase and frequency offsets of an initial block of received M-QAM symbols includes creating a grid of discrete candidate phase offset values and for each candidate value: applying the candidate value to each symbol, applying a respective hard decision to each applied symbol, and computing a figure of merit based thereon. The candidate value having the best figure of merit is selected as an initial phase offset estimate. An initial frequency offset estimate is computed using the symbols updated with the initial phase offset estimate, their respective hard decisions, and an approximation of the complex exponential function. To track carrier phase and frequency offsets associated with a series of symbol blocks, for each symbol of a current block, set a binary trust weight based on comparison of a computed parameter with a threshold and use the binary trust weights to compute a phase offset error and a frequency offset error for the current block.
    Type: Application
    Filed: December 4, 2019
    Publication date: June 10, 2021
    Inventors: Prabhat Pal, Aayush Verma
  • Patent number: 10371733
    Abstract: The noise figure for a radio frequency device may be obtained through power measurements. A signal flow graph based upon the S-parameter information of the entire RF system may be constructed. The S-parameter information may be representative of the microwave termination, the device, the measurement instrument and any losses due to additional components such as connecting cables/attenuators/switches, etc. The signal flow graph includes proper placement and values of the source nodes corresponding to each RF sub-system enumerated above. Noise figure measurements may include a calibration step and a measurement step. During the calibration step the noise figure and the noise temperature of the measurement instrument used for the measurement may be obtained. During the measurement step, the noise figure and the noise temperature of the device may be obtained based at least on the noise figure and noise temperature of the measurement instrument obtained during the calibration step.
    Type: Grant
    Filed: January 4, 2017
    Date of Patent: August 6, 2019
    Assignee: National Instruments Corporation
    Inventors: Prabhat Pal, Vinay Kumar Velkuru, Brian J. Avenell
  • Publication number: 20180188306
    Abstract: The noise figure for a radio frequency device may be obtained through power measurements. A signal flow graph based upon the S-parameter information of the entire RF system may be constructed. The S-parameter information may be representative of the microwave termination, the device, the measurement instrument and any losses due to additional components such as connecting cables/attenuators/switches, etc. The signal flow graph includes proper placement and values of the source nodes corresponding to each RF sub-system enumerated above. Noise figure measurements may include a calibration step and a measurement step. During the calibration step the noise figure and the noise temperature of the measurement instrument used for the measurement may be obtained. During the measurement step, the noise figure and the noise temperature of the device may be obtained based at least on the noise figure and noise temperature of the measurement instrument obtained during the calibration step.
    Type: Application
    Filed: January 4, 2017
    Publication date: July 5, 2018
    Inventors: Prabhat Pal, Vinay Kumar Velkuru, Brian J. Avenell