Patents by Inventor Pradeep PASUMARTHY

Pradeep PASUMARTHY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11311871
    Abstract: Misalignment of intersecting devices on a diagnostic instrument may be detected and remediated using a system comprising components such as an accelerometer, a plurality of strain gauges and a device comprising a processor and a memory (e.g., a computer). In such a system, the accelerometer may be adapted to detect movement of the diagnostic instrument. The device comprising the processor and the memory may be configured to, for each of the structural elements of the diagnostic instrument, determine whether an alignment change has taken place in that structural element based on analyzing measurements made by the plurality of strain gauges. The device comprising the processor and the memory may also be configured to, for each structural element where an alignment change is determined to have taken place, trigger a remediation for each device from a set of devices impacted by the alignment change of that structural element.
    Type: Grant
    Filed: February 21, 2020
    Date of Patent: April 26, 2022
    Assignee: Beckman Coulter, Inc.
    Inventors: Brian J. Littman, Pradeep Pasumarthy
  • Publication number: 20210346882
    Abstract: Misalignment of intersecting devices on a diagnostic instrument may be detected and remediated using a system comprising components such as an accelerometer, a plurality of strain gauges and a device comprising a processor and a memory (e.g., a computer). In such a system, the accelerometer may be adapted to detect movement of the diagnostic instrument. The device comprising the processor and the memory may be configured to, for each of the structural elements of the diagnostic instrument, determine whether an alignment change has taken place in that structural element based on analyzing measurements made by the plurality of strain gauges. The device comprising the processor and the memory may also be configured to, for each structural element where an alignment change is determined to have taken place, trigger a remediation for each device from a set of devices impacted by the alignment change of that structural element.
    Type: Application
    Filed: February 21, 2020
    Publication date: November 11, 2021
    Inventors: Brian J. LITTMAN, Pradeep PASUMARTHY