Abstract: An optical system comprises a first optical path configured to supply a first light with a first range of wavelengths; a second optical path configured to supply a second light with a second range of wavelengths shorter than the first range of wavelengths; a third optical path configured to supply a third light with a third range of wavelengths shorter than the second range of wavelengths; an optical I/O unit configured to emit the first light, the second light and the third light to a target and acquire a light from the target; a reference unit configured to split off a reference light from the third light; and a detector that includes a range of detection wavelengths shared with a CARS light and an interference light.

Abstract: There is provided a gas analyzer apparatus including: a sample chamber which is equipped with a dielectric wall structure and into which only sample gas to be measured is introduced; a plasma generation mechanism that generates plasma inside the sample chamber, which has been depressurized, using an electric field and/or a magnetic field applied through the dielectric wall structure; and an analyzer unit that analyzes the sample gas via the generated plasma. By doing so, it is possible to provide a gas analyzer apparatus capable of accurately analyzing sample gases, even those including corrosive gas, over a long period of time.

Abstract: There is provided a system (1) including a monitoring unit (50) that analyzes, using a sensor (51), components of a first gas which may include first components and a pre-separation unit (30) disposed upstream of the monitoring unit. The pre-separation unit includes a first supply line (31) that supplies the first gas (35) to the monitoring unit; a second supply line (32) that supplies a second gas (36), which includes components obtained by removing the first components from the first gas using a first separator (40), to the monitoring unit; and an automatic valve station (38) that periodically switches between the first supply line and the second supply line to alternately supply the first gas and the second gas to the monitoring unit.

Abstract: There is provided a monitoring system for an organism including an analyzer apparatus and an implant, which is embedded under the skin of the organism, is connected to blood vessels under the skin, and forms a blood flow to an inspection port disposed above the epidermis, within the epidermis, or directly below the epidermis. The analyzer apparatus includes an irradiation apparatus that emits one or more lasers onto the inspection port of the implant embedded under the skin of the organism, and a detector that detects scattered light from the inspection port.

Abstract: Provided is a monitor for monitoring the condition of the interior of a living organism from the surface of the living organism. The monitor is provided with: a probe which includes an observation window and is attached to the organism surface; a unit which irradiates, with a laser, at least a portion of an observation region; a unit which detects scattered light resulting from the laser irradiation; a Doppler analysis unit and a SORS analysis unit which narrow down the observation spots to a first observation spot; and a CARS analysis unit which obtains the optical spectrum for at least one component, and outputs first information indicating the condition of the organism interior on the basis of the intensity of the spectrum.

Abstract: There is provided a gas analyzer apparatus including: a sample chamber which is equipped with a dielectric wall structure and into which only sample gas to be measured is introduced; a plasma generation mechanism that generates plasma inside the sample chamber, which has been depressurized, using an electric field and/or a magnetic field applied through the dielectric wall structure; and an analyzer unit that analyzes the sample gas via the generated plasma. By doing so, it is possible to provide a gas analyzer apparatus capable of accurately analyzing sample gases, even those including corrosive gas, over a long period of time.

Abstract: A device of detecting a current from a sensor is disclosed. The device includes an integrating circuit including a network of capacitors for providing a gain setting and configured to convert the current to a voltage ramp over a length of integration time, the integrating circuit further including a reset switch configured to connect an input and an output of the network of capacitors; an ADC configured to digitize the voltage ramp into a plurality of voltage samples; and a set of modules including an analyzing module configured to analyze the plurality of voltage samples to determine a slope of the voltage ramp; an outputting module configured to determine a magnitude of the current based on the slope of the voltage ramp and the gain setting; and a reconfiguring module that is configured to reconfigure the network of capacitors and reset the voltage ramp via the reset switch.

Abstract: Provided is a monitor for monitoring the condition of the interior of a living organism from the surface of the living organism. The monitor is provided with: a probe which includes an observation window and is attached to the organism surface; a unit which irradiates, with a laser, at least a portion of an observation region; a unit which detects scattered light resulting from the laser irradiation; a Doppler analysis unit and a SORS analysis unit which narrow down the observation spots to a first observation spot; and a CARS analysis unit which obtains the optical spectrum for at least one component, and outputs first information indicating the condition of the organism interior on the basis of the intensity of the spectrum.

Abstract: There is provided a gas analyzer apparatus including: a sample chamber which is equipped with a dielectric wall structure and into which only sample gas to be measured is introduced; a plasma generation mechanism that generates plasma inside the sample chamber, which has been depressurized, using an electric field and/or a magnetic field applied through the dielectric wall structure; and an analyzer unit that analyzes the sample gas via the generated plasma. By doing so, it is possible to provide a gas analyzer apparatus capable of accurately analyzing sample gases, even those including corrosive gas, over a long period of time.

Abstract: A system for generating first data including content data includes an interface for outputting the content data, a conversion unit to convert an intensity change indicative of a detected chemical substance contained in data from a sensor into the content data. The sensor includes a mass spectrometric type sensor capable of controlling sensitivity, resolution or selectivity, and a hardware unit that is configured to carry out an analysis of the data with initial setting conditions designed for scanning in a first range using a test sample prepared in advance, change the setting conditions for the sensor for use with the conversion unit, based on the analysis carried out automatically and periodically, the setting conditions including at least one of a voltage for ionizing and a voltage for scanning a spectrum region for detecting a chemical substance requested by an application.

Abstract: A system for measurement is provided. The system includes a first optical path configured to supply first light pulses with a first range of wavelengths; a second optical path configured to supply second light pulses with a second range of wavelengths shorter than the first range of wavelengths; an optical I/O unit configured to emit the first light pulses and the second light pulses to a target and acquire a light from the target to detect CARS light pluses from the target by a detector; and a first phase modulating unit configured to vary phase differences between the first light pulses and the second light pulses as the first light pulses and the second light pulses are emitted via the optical I/O unit.

Abstract: A device of detecting a current from a sensor is disclosed. The device includes an integrating circuit including a network of capacitors for providing a gain setting and configured to convert the current to a voltage ramp over a length of integration time, the integrating circuit further including a reset switch configured to connect an input and an output of the network of capacitors; an ADC configured to digitize the voltage ramp into a plurality of voltage samples; and a set of modules including an analyzing module configured to analyze the plurality of voltage samples to determine a slope of the voltage ramp; an outputting module configured to determine a magnitude of the current based on the slope of the voltage ramp and the gain setting; and a reconfiguring module that is configured to reconfigure the network of capacitors and reset the voltage ramp via the reset switch.

Abstract: A device of detecting a current from a sensor is disclosed. The device includes an integrating circuit including a network of capacitors for providing a gain setting and configured to convert the current to a voltage ramp over a length of integration time, the integrating circuit further including a reset switch configured to connect an input and an output of the network of capacitors; an ADC configured to digitize the voltage ramp into a plurality of voltage samples; and a set of modules including an analyzing module configured to analyze the plurality of voltage samples to determine a slope of the voltage ramp; an outputting module configured to determine a magnitude of the current based on the slope of the voltage ramp and the gain setting; and a reconfiguring module that is configured to reconfigure the network of capacitors and reset the voltage ramp via the reset switch.

Abstract: There is provided a gas analyzer apparatus that analyzes inflowing sample gas. The gas analyzer apparatus includes a filter unit that filters the sample gas, a detector unit that detects the result of filtering, a housing that houses these elements, and a control unit that controls the respective potentials of these elements. The control unit includes a cleaning control unit that sets the respective potentials of the filter unit, the detector unit, and the housing to cleaning potentials that draws in, as plasma for cleaning purposes, process plasma from a source that supplies the sample gas or plasma generated by a plasma generation unit.

Abstract: An analyzer apparatus (1) includes: an ionization unit (11) that ionizes molecules to analyze; a filter unit (13) that forms a field for selectively passing ions generated by the ionization unit; a detector unit (14) that detects ions that have passed through the filter unit; an ion drive circuitry (61) that electrically drives the ionization unit; a field drive circuitry (62) that electrically drives the filter unit; and a control unit (22) that controls outputs of the ion drive circuitry and the field drive circuitry, wherein the control unit controls the ion drive circuitry to ramp up and down a filament voltage supplied to a filament of the ionization unit when the analyzer apparatus starts and stops.

Abstract: A system for measurement is provided. The system comprises a core optical module and a scanning interface module. The core optical module is configured to generate a light for generating signals for analyzing an object through the scanning interface module and detect a light including the signals from the object through the scanning interface module. The scanning interface module is changeable for each application and configured to connect with the core optical module by a light transferring unit to scan the object with the transferred light from the core optical module and to receive the light from the object to transfer to the core optical module.

Abstract: There is provided an apparatus including a chip containing metal bodies capable of exciting localized surface plasmon resonance at a first surface, and an analyzer unit that performs a scan of the first surface of the chip, in a state where the first surface is in contact with a sample, with a laser in at least a one-dimensional direction and records scattered light, which has been enhanced at the first surface, in association with the scan. The chip includes a substrate, a first layer where concave and convex structures are repeatedly provided on the first surface of the substrate; and a second layer that contains the metal bodies and is provided via the first layer.

Abstract: There is provided a gas analyzer apparatus that analyzes inflowing sample gas. The gas analyzer apparatus includes a filter unit that filters the sample gas, a detector unit that detects the result of filtering, a housing that houses these elements, and a control unit that controls the respective potentials of these elements. The control unit includes a cleaning control unit that sets the respective potentials of the filter unit, the detector unit, and the housing to cleaning potentials that draws in, as plasma for cleaning purposes, process plasma from a source that supplies the sample gas or plasma generated by a plasma generation unit.

Abstract: An optical system comprises a first optical path configured to supply a first light with a first range of wavelengths; a second optical path configured to supply a second light with a second range of wavelengths shorter than the first range of wavelengths; a third optical path configured to supply a third light with a third range of wavelengths shorter than the second range of wavelengths; an optical I/O unit configured to emit the first light, the second light and the third light to a target and acquire a light from the target; a reference unit configured to split off a reference light from the third light; and a detector that includes a range of detection wavelengths shared with a CARS light and an interference light.

Abstract: There is provided a system (1) including a monitoring unit (50) that analyzes, using a sensor (51), components of a first gas which may include first components and a pre-separation unit (30) disposed upstream of the monitoring unit. The pre-separation unit includes: a first supply line (31) that supplies the first gas (35) to the monitoring unit; a second supply line (32) that supplies a second gas (36), which includes components obtained by removing the first components from the first gas using a first separator (40), to the monitoring unit; and an automatic valve station (38) that periodically switches between the first supply line and the second supply line to alternately supply the first gas and the second gas to the monitoring unit.