Patents by Inventor Pranay G. Sinha

Pranay G. Sinha has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6781698
    Abstract: A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase &phgr; of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase &phgr; of the optical component using a scanning laser having a scanning step size &Dgr;&ohgr; and a modulation frequency &ohgr;m such that &Dgr;&ohgr;/&ohgr;m≦2. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency &ohgr; is constructed where H(&ohgr;)=R(&ohgr;)exp[j&phgr;(&ohgr;)], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.
    Type: Grant
    Filed: September 9, 2002
    Date of Patent: August 24, 2004
    Assignee: 3M Innovative Properties Company
    Inventors: Xudong Fan, James F. Brennan, III, Michael R. Matthews, Pranay G. Sinha, Jerome C. Porque
  • Patent number: 6741773
    Abstract: A device including a chirped Bragg grating, said grating having (a) a reflection bandwidth having a full-width at half maximum that is greater than 6 nm, and (b) a reflection delay ripple amplitude of less than ±50 ps.
    Type: Grant
    Filed: January 3, 2003
    Date of Patent: May 25, 2004
    Assignee: 3M Innovative Properties Company
    Inventors: James F. Brennan, III, Edward Hernadez, John A. Valenti, Pranay G. Sinha, Michael R. Matthews, Dale E. Elder, Gerald A. Beauchesne, Chad H. Byrd
  • Publication number: 20030133659
    Abstract: A device including a chirped Bragg grating, said grating having (a) a reflection bandwidth having a full-width at half maximum that is greater than 6 nm, and (b) a reflection delay ripple amplitude of less than ±50 ps.
    Type: Application
    Filed: January 30, 2003
    Publication date: July 17, 2003
    Applicant: 3M Innovative Properties Company
    Inventors: James F. Brennan, Edward Hernandez, John A. Valenti, Pranay G. Sinha, Michael R. Matthews, Dale E. Elder, Gerald A. Beauchesne, Chad H. Byrd
  • Patent number: 6577792
    Abstract: A device including a chirped Bragg grating, said grating having (a) a reflection bandwidth having a full-width at half maximum that is greater than 6 nm, and (b) a reflection delay ripple amplitude of less than ±50 ps.
    Type: Grant
    Filed: March 15, 2001
    Date of Patent: June 10, 2003
    Assignee: 3M Innovative Properties Company
    Inventors: James F. Brennen, III, Edward Hernandez, John A. Valenti, Pranay G. Sinha, Michael R. Matthews, Dale E. Elder, Gerad A. Beauchesne, Chad H. Byrd
  • Publication number: 20030063286
    Abstract: A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase &phgr; of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase &phgr; of the optical component using a scanning laser having a scanning step size &Dgr;&ohgr; and a modulation frequency &ohgr;m such that &Dgr;&ohgr;/&ohgr;m≦2. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency co is constructed where H(&ohgr;)=R(&ohgr;)exp[j&phgr;(&ohgr;)], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.
    Type: Application
    Filed: September 9, 2002
    Publication date: April 3, 2003
    Inventors: Xudong Fan, James F. Brennan, Michael R. Matthews, Pranay G. Sinha, Jerome C. Porque
  • Publication number: 20030053070
    Abstract: A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase &phgr; of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase &phgr; of the optical component using a scanning laser having a scanning step size &Dgr;&ohgr; and a modulation frequency &ohgr;m such that &Dgr;&ohgr;/&ohgr;m≦2. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency &ohgr; is constructed where H(&ohgr;)=R(&ohgr;)exp[j&phgr;(&ohgr;)], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.
    Type: Application
    Filed: June 28, 2002
    Publication date: March 20, 2003
    Applicant: 3M Innovative Properties Company
    Inventors: Xudong Fan, James F. Brennan, Michael R. Matthews, Pranay G. Sinha, Jerome Porque
  • Publication number: 20020164121
    Abstract: A device including a chirped Bragg grating, said grating having (a) a reflection bandwidth having a full-width at half maximum that is greater than 6 nm, and (b) a reflection delay ripple amplitude of less than ±50 ps.
    Type: Application
    Filed: March 15, 2001
    Publication date: November 7, 2002
    Applicant: 3M Innovative Properties Company
    Inventors: James F. Brennan, Edward Hernandez, John A. Valenti, Pranay G. Sinha, Michael R. Matthews, Dale E. Elder, Gerard A. Beauchesne, Chad H. Byrd