Patents by Inventor Prasanna Chitturi

Prasanna Chitturi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD FOR IDENTIFYING A SPORT FIELD BOUNDARY OR FEATURE AND REALIZING REVENUE THEREFROM
    Publication number: 20090030791
    Abstract: Sport field's boundaries are divided into boundary sections according to their major function. The right to name each boundary is then sold to realize further revenue. Additionally, in exchange for the right to broadcast from the sport arena, the sport announcers are required to refer to the boundaries by the names chosen by the entities that purchased the right to name the boundaries. In this manner, the entities naming the boundaries may reach audience beyond the sport arena.
    Type: Application
    Filed: May 2, 2006
    Publication date: January 29, 2009
    Inventors: Prasanna Chitturi, Anand Kasukurthi
  • Method of measuring three-dimensional surface roughness of a structure
    Patent number: 7348556
    Abstract: An improved method of measuring the three-dimensional surface roughness of a structure. A focused ion beam is used to mill a succession of cross-sections or “slices” of the feature of interest at pre-selected intervals over a pre-selected measurement distance. As each cross-section is exposed, a scanning electron microscope is used to measure the relevant dimensions of the feature. Data from these successive “slices” is then used to determine the three-dimensional surface roughness for the feature.
    Type: Grant
    Filed: October 17, 2005
    Date of Patent: March 25, 2008
    Assignee: FEI Company
    Inventors: Prasanna Chitturi, Liang Hong, Craig Henry, John Notte
  • Method of measuring three-dimensional surface roughness of a structure
    Publication number: 20070018099
    Abstract: An improved method of measuring the three-dimensional surface roughness of a structure. A focused ion beam is used to mill a succession of cross-sections or “slices” of the feature of interest at pre-selected intervals over a pre-selected measurement distance. As each cross-section is exposed, a scanning electron microscope is used to measure the relevant dimensions of the feature. Data from these successive “slices” is then used to determine the three-dimensional surface roughness for the feature.
    Type: Application
    Filed: October 17, 2005
    Publication date: January 25, 2007
    Inventors: Prasanna Chitturi, Liang Hong, Craig Henry, John Notte