Patents by Inventor Prashant Balakrishnan

Prashant Balakrishnan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7788414
    Abstract: A memory controller includes a control circuit configured to provide a control signal, an output interface unit, and a command storage unit coupled to the control circuit and the output interface. The command storage unit is configured to store a plurality of commands, receive the control signal, and provide, in response to the control signal, a selected command of the plurality of commands to the output interface unit.
    Type: Grant
    Filed: January 16, 2007
    Date of Patent: August 31, 2010
    Assignee: Lantiq Deutschland GmbH
    Inventors: Rashmi H. Nagabhushana, Ravi Ranjan Kumar, Prashant Balakrishnan
  • Patent number: 7778253
    Abstract: A preferred embodiment comprising a data switch includes a first processor for routing data packets including a MAC address, using a MAC address table stored in a writable memory. The switch further includes a second processor for routing data packets including an IP address using an IP address look-up table stored in the writable memory. The writable memory consists of a single memory fabric that is allocated between the MAC address table and the look-up table by a memory control unit according to a setting stored in a non-erasable memory unit.
    Type: Grant
    Filed: February 28, 2006
    Date of Patent: August 17, 2010
    Assignee: Infineon Technologies AG
    Inventors: Prashant Balakrishnan, Guruprasad Ardhanari
  • Publication number: 20080172534
    Abstract: A memory controller includes a control circuit configured to provide a control signal, an output interface unit, and a command storage unit coupled to the control circuit and the output interface. The command storage unit is configured to store a plurality of commands, receive the control signal, and provide, in response to the control signal, a selected command of the plurality of commands to the output interface unit.
    Type: Application
    Filed: January 16, 2007
    Publication date: July 17, 2008
    Inventors: Rashmi H. Nagabhushana, Ravi Ranjan Kumar, Prashant Balakrishnan
  • Patent number: 7340659
    Abstract: An integrated circuit (20) comprises a plurality of processing modules (3, 5, 7) which interact during the normal operation of the integrated circuit. Switches (13, 15) are provided on the integrated circuit (20) and operated during a testing procedure to isolate a single module (3) or a group of modules (5, 7) from the other modules, so that that the isolated module or group of modules can be tested. During the testing procedure, the switches (13, 15) provide defined signals at inputs of the isolated module(s) which, when the integrated circuit is in normal operation, are controlled by outputs of the other modules.
    Type: Grant
    Filed: May 15, 2003
    Date of Patent: March 4, 2008
    Assignee: Infineon Technologies, A.G.
    Inventor: Prashant Balakrishnan
  • Publication number: 20060146819
    Abstract: A preferred embodiment comprising a data switch includes a first processor for routing data packets including a MAC address, using a MAC address table stored in a writable memory. The switch further includes a second processor for routing data packets including an IP address using an IP address look-up table stored in the writable memory. The writable memory consists of a single memory fabric that is allocated between the MAC address table and the look-up table by a memory control unit according to a setting stored in a non-erasable memory unit.
    Type: Application
    Filed: February 28, 2006
    Publication date: July 6, 2006
    Inventors: Prashant Balakrishnan, Guruprasad Ardhanari
  • Publication number: 20030221150
    Abstract: Method of testing multiple modules on an integrated circuit An integrated circuit (20) comprises a plurality of processing modules (3, 5, 7) which interact during the normal operation of the integrated circuit. Switches (13, 15) are provided on the integrated circuit (20) and operated during a testing procedure to isolate a single module (3) or a group of modules (5, 7) from the other modules, so that that the isolated module or group of modules can be tested. During the testing procedure, the switches (13, 15) provide defined signals at inputs of the isolated module(s) which, when the integrated circuit is in normal operation, are controlled by outputs of the other modules.
    Type: Application
    Filed: May 15, 2003
    Publication date: November 27, 2003
    Applicant: Infineon Technologies AG
    Inventor: Prashant Balakrishnan