Abstract: According to one general aspect, an apparatus may include a global bit line, and a plurality of memory banks. The global bit line may be configured to facilitate a memory access. Each memory bank may include a local keeper-precharge circuit coupled between a power supply and the global bit line, and a control circuit configured to control, at least in part, the local keeper-precharge circuit.

Abstract: According to one general aspect, an apparatus may include a global bit line, and a plurality of memory banks. The global bit line may be configured to facilitate a memory access. Each memory bank may include a local keeper-precharge circuit coupled between a power supply and the global bit line, and a control circuit configured to control, at least in part, the local keeper-precharge circuit.

Abstract: According to one general aspect, an apparatus may include a power header and a logic circuit. The power header may include a gate terminal, a first channel terminal, a second channel terminal, and a bulk terminal coupled with a first voltage power signal. The power header may be configured to perform one of dynamically coupling or decoupling a logic circuit with the first voltage power signal. The logic circuit may include a bulk terminal coupled with a second voltage power signal and a power terminal that is either dynamically coupled or decoupled, as determined by the power header, with the first voltage power signal. A power sequencing signal may be included in the apparatus and may be configured to control the power header such that, when active, the power header couples the logic circuit with the first voltage power signal after the second voltage power signal is high.

Abstract: According to one general aspect, an apparatus may include a power header and a logic circuit. The power header may include a gate terminal, a first channel terminal, a second channel terminal, and a bulk terminal coupled with a first voltage power signal. The power header may be configured to perform one of dynamically coupling or decoupling a logic circuit with the first voltage power signal. The logic circuit may include a bulk terminal coupled with a second voltage power signal and a power terminal that is either dynamically coupled or decoupled, as determined by the power header, with the first voltage power signal. A power sequencing signal may be included in the apparatus and may be configured to control the power header such that, when active, the power header couples the logic circuit with the first voltage power signal after the second voltage power signal is high.

Abstract: According to one general aspect, an apparatus may include a first power supply configured to generate a first power signal having one of a plurality of voltages, and a second power supply configured to generate a second power signal that includes a voltage equal to or higher than a voltage of the first power signal. The apparatus may include a first electrical circuit configured to be powered by the first power supply. The apparatus may also include a power mode controller configured to: determine the voltage of the first power signal during the next power state, and generate a selector control signal based upon the voltage of the first power signal. The apparatus may also include a power supply selector configured to dynamically electrically couple a second electrical circuit with either the first power signal or the second power signal, based upon the selector control signal.

Abstract: According to the inventive concepts disclosed herein, a level shifter can include an input node in a first voltage domain and an output node in a second voltage domain, higher than the first voltage domain. The input node receives an input signal in the first, lower-voltage domain, and the output node is configured to output a representation of the input signal in the second, higher-voltage domain. A lower-voltage control circuit can control a supply of the lower-voltage level to a boundary node arranged at a boundary between the first and second domains. A higher-voltage control circuit can also be provided to control a supply of the higher-voltage level to the boundary node. The lower-voltage control circuit can cut off the lower-voltage supply to the boundary node when the higher-voltage control circuit supplies the higher-voltage level to the boundary node. The higher-voltage control circuit can, for instance, include logic circuitry that enables and disables a connection to the higher-voltage supply.

Abstract: A wordline driver supply block supporting multiple operation modes of a memory of a microprocessor in a device for reducing power consumption thereof.

Abstract: A semiconductor circuit includes: a first circuit configured to provide first voltage to an output node when a voltage level of an input node is at a first level; a second circuit configured to provide second voltage to the output node when the voltage level of the input node is at a second level; and a third circuit configured to provide third voltage to the output node when the second voltage is provided to the output node, where the second circuit is turned off when the third voltage is provided to the output node.

Abstract: A semiconductor circuit includes: a first circuit configured to provide first voltage to an output node when a voltage level of an input node is at a first level; a second circuit configured to provide second voltage to the output node when the voltage level of the input node is at a second level; and a third circuit configured to provide third voltage to the output node when the second voltage is provided to the output node, where the second circuit is turned off when the third voltage is provided to the output node.

Abstract: A wordline driver supply block supporting multiple operation modes of a memory of a microprocessor in a device for reducing power consumption thereof.

Abstract: According to one general aspect, an apparatus may include a first power supply configured to generate a first power signal having one of a plurality of voltages, and a second power supply configured to generate a second power signal that includes a voltage equal to or higher than a voltage of the first power signal. The apparatus may include a first electrical circuit configured to be powered by the first power supply. The apparatus may also include a power mode controller configured to: determine the voltage of the first power signal during the next power state, and generate a selector control signal based upon the voltage of the first power signal. The apparatus may also include a power supply selector configured to dynamically electrically couple a second electrical circuit with either the first power signal or the second power signal, based upon the selector control signal.

Abstract: According to the inventive concepts disclosed herein, a level shifter can include an input node in a first voltage domain and an output node in a second voltage domain, higher than the first voltage domain. The input node receives an input signal in the first, lower-voltage domain, and the output node is configured to output a representation of the input signal in the second, higher-voltage domain. A lower-voltage control circuit can control a supply of the lower-voltage level to a boundary node arranged at a boundary between the first and second domains. A higher-voltage control circuit can also be provided to control a supply of the higher-voltage level to the boundary node. The lower-voltage control circuit can cut off the lower-voltage supply to the boundary node when the higher-voltage control circuit supplies the higher-voltage level to the boundary node. The higher-voltage control circuit can, for instance, include logic circuitry that enables and disables a connection to the higher-voltage supply.

Abstract: A memory includes a selection circuit and a write assist circuit. The selection circuit has a first input, a second input coupled to a first power supply voltage terminal, an output coupled to a power supply terminal of each of a plurality of memory cells, and a control input for receiving a write assist control signal. The write assist circuit is coupled to the first input of the selection circuit for reducing a voltage at the power supply terminal of each of the plurality of memory cells during a write operation and in response to an asserted write assist enable signal. The write assist circuit comprises a P-channel transistor and a bias voltage generator. The P-channel transistor is for reducing the voltage at the power supply terminal of each of the plurality of memory cells during the write operation. The bias voltage generator is for providing a variable bias voltage to the P-channel transistor.

Abstract: A memory includes a selection circuit and a write assist circuit. The selection circuit has a first input, a second input coupled to a first power supply voltage terminal, an output coupled to a power supply terminal of each of a plurality of memory cells, and a control input for receiving a write assist control signal. The write assist circuit is coupled to the first input of the selection circuit for reducing a voltage at the power supply terminal of each of the plurality of memory cells during a write operation and in response to an asserted write assist enable signal. The write assist circuit comprises a P-channel transistor and a bias voltage generator. The P-channel transistor is for reducing the voltage at the power supply terminal of each of the plurality of memory cells during the write operation. The bias voltage generator is for providing a variable bias voltage to the P-channel transistor.

Abstract: A device is disclosed having a low-voltage memory device. The device includes a first memory having a first memory topology and a second memory having a second memory topology, with both memories located in an integrated circuit. The first memory is a relatively high-density memory device, capable of storing large amounts of data relative to the second memory. The second memory is a low-voltage memory device capable of being accessed at low-voltages relative to the voltage at which the first memory can be accessed. Accordingly, the second memory is accessible when the integrated circuit is placed in a low-voltage mode of operation, which may represent a data retention state (sleep state) for the first memory or other portions of the integrated circuit. Thus, the device is able to store large amounts of data in the high density memory in a normal or active mode of operation, and also have access to the low-voltage memory during the low-voltage mode of operation.

Abstract: A method for pipelining a memory in an integrated circuit includes providing a first clock phase and providing a second clock phase, wherein the first clock phase and the second clock phase are at least partially non-overlapping. The method further includes providing a first memory array and providing a second memory array, wherein the second memory array shares a wordline with the first memory array. The method further includes using said wordline to select at least one row of the first memory array during the first clock phase. The method further includes using said wordline to select at least one row of the second memory array during the second clock phase.

Abstract: Storage circuits (180-183 and 280-281) may be used for low power operation while allowing fast read access. In one embodiment (e.g. circuit 100), shared complementary write bit lines (101, 102), separate read bit lines (103-106), a shared read word line (107), and separate write word lines (108-111) are used. In an alternate embodiment (e.g. circuit 200), shared complementary write bit lines (201, 202), a shared read bit line (203), separate read word lines (206-207), and separate write word lines (208-209) are used. The storage circuit may be used in a variety of contexts, such as, for example, a register file (17), a branch unit (15), an SRAM (19), other modules (20), a cache (18), a buffer (21), and/or a memory (14).

Abstract: A method for pipelining a memory in an integrated circuit includes providing a first clock phase and providing a second clock phase, wherein the first clock phase and the second clock phase are at least partially non-overlapping. The method further includes providing a first memory array and providing a second memory array, wherein the second memory array shares a wordline with the first memory array. The method further includes using said wordline to select at least one row of the first memory array during the first clock phase. The method further includes using said wordline to select at least one row of the second memory array during the second clock phase.

Abstract: An integrated circuit with a low voltage read/write operation is provided. The integrated circuit may include a processor and a plurality of memory cells organized in rows and columns and coupled to the processor, wherein a row of memory cells comprises a word line and all of the memory cells coupled to the word line, and wherein a column of memory cells comprises a bit line and all of the memory cells coupled to the bit line. The integrated circuit may further include a first power supply voltage terminal for receiving a first power supply voltage, wherein the first power supply voltage is provided to power the processor, and wherein the first power supply voltage is provided to power the plurality of memory cells during a first access operation of the plurality of memory cells.

Abstract: A device is disclosed having a low-voltage memory device. The device includes a first memory having a first memory topology and a second memory having a second memory topology, with both memories located in an integrated circuit. The first memory is a relatively high-density memory device, capable of storing large amounts of data relative to the second memory. The second memory is a low-voltage memory device capable of being accessed at low-voltages relative to the voltage at which the first memory can be accessed. Accordingly, the second memory is accessible when the integrated circuit is placed in a low-voltage mode of operation, which may represent a data retention state (sleep state) for the first memory or other portions of the integrated circuit. Thus, the device is able to store large amounts of data in the high density memory in a normal or active mode of operation, and also have access to the low-voltage memory during the low-voltage mode of operation.