Patents by Inventor Prashant Pandurang SHINDE

Prashant Pandurang SHINDE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250238919
    Abstract: A method for training a second Machine Learning (ML) system to determine semiconductor wafer defects includes: receiving a first set of semiconductor wafer images for which defect detection failed in a first ML system; generating a first dataset based on the received first set of images and corresponding prediction results of the first ML system; modifying the images in the first dataset using predefined image adjustment parameters to generate a second set of images; identifying, using the first ML system, defects in the second set of images; assigning ground truths to the second set of images based on the identified defects; generating a second dataset based on the first dataset, the second set of images, and the ground truths associated therewith; and training, based on the generated second dataset, the second ML system to determine semiconductor wafer defects.
    Type: Application
    Filed: January 17, 2025
    Publication date: July 24, 2025
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Priyadarshini Panemangalore PAI, Prashant Pandurang SHINDE, Shashishekara Parampalli ADIGA
  • Publication number: 20250225617
    Abstract: Disclosed is a method for advanced image processing using physics-informed learning for artificial intelligence (AI) based applications using a Physics Informed Neural Operator Based Learning (PINOBL) model in semiconductor manufacturing. The method includes determining a attributes based on functional units associated with input images. The method also includes selecting, based on the set of attributes, a set of physics-based mathematical solvers corresponding to an image-processing task. The method also includes generating according to the set of physics-based mathematical solvers, a set of intermediate images corresponding to the set of input images.
    Type: Application
    Filed: January 10, 2025
    Publication date: July 10, 2025
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Priyadarshini Panemangalore PAI, Shubham Sambhaji PATIL, Prashant Pandurang SHINDE, Shashishekara Parampalli ADIGA
  • Publication number: 20250148585
    Abstract: Disclosed is a multi-level defect detection method and system for detecting one or more defects in semiconductor wafers, including forming, among input images of the semiconductor wafers, a first image set of input images in which defects were not detected and a second image set of input images in which defects were detected; extracting image parameters from the first image set and determining whether the first image set can be enhanced; generating an image enhancement profile for the first image set and modifying the first image set based on the image enhancement profile and detecting one or more defects in the modified image set by performing a defect detection process thereon.
    Type: Application
    Filed: November 5, 2024
    Publication date: May 8, 2025
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Priyadarshini Panemangalore PAI, Prashant Pandurang SHINDE, Shashishekara Parampalli ADIGA
  • Publication number: 20240193758
    Abstract: A processor-implemented method with image generation includes: receiving a plurality of input parameters for a plurality of images to be generated; generating a plurality of defect profiles comprising a size and location of one or more defects to be formed in an image; and generating the plurality of images comprising defect information based on the plurality of defect profiles and the plurality of input parameters using an image rendering operation.
    Type: Application
    Filed: November 2, 2023
    Publication date: June 13, 2024
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Prashant Pandurang SHINDE, Shashishekara Parampalli ADIGA, Priyadarshini Panemangalore PAI
  • Publication number: 20240185385
    Abstract: A method and system for screening a plurality of images for performing super-resolution (SR) are provided. The method includes using a multitask learning model (MLM) determining at least one of a plurality of image properties related to each of a plurality of images having a resolution lower than a predefined threshold; and selecting, based on the at least one of the plurality of image properties, a first set of images among the plurality of images to each be respectively suitable for upscaling; recommending, using a recommendation model, at least one parameter based on the at least one of the plurality of image properties; and generating at least one super-resolution image by respectively performing a super-resolution upscaling operation on at least one image of the first set of images based on the at least one parameter and the at least one of the plurality of image properties.
    Type: Application
    Filed: December 5, 2023
    Publication date: June 6, 2024
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Priyadarshini Panemangalore PAI, Shashishekara Parampalli ADIGA, Prashant Pandurang SHINDE
  • Publication number: 20230054119
    Abstract: A method and device with defect detection are included. In one general aspect, a method performed by an electronic device includes determining, by the electronic device, an operation mode among different operation modes, wherein the electronic device is configured to implement the operation modes for determining wafer defects by processing semiconductor wafer images, and determining, by the electronic device, based on an indication of the determined operation mode, whether a semiconductor image, among the semiconductor wafer images, is defective.
    Type: Application
    Filed: August 12, 2022
    Publication date: February 23, 2023
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Priyadarshini Panemangalore PAI, Prashant Pandurang SHINDE, Shashishekara Parampalli ADIGA