Patents by Inventor Prasoon Joshi

Prasoon Joshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240219452
    Abstract: The disclosure is directed to a device interface, system and method for connecting a Tester Interface Unit (TIU) to an automated test equipment that enable data rates of over 1.0 Gbps over scalable high speed cables. The device interface includes at least one flange assembly connecting an electron beam probe (EBP) in a vacuum-controlled environment to an ambient environment, the flange assembly including a vacuum-controlled passthrough environment coupled to the EBP, a plurality of cables coupled to a plurality of connectors within the vacuum-controlled passthrough environment to provide power, control and signal connections to the ambient environment, the plurality cables including plurality of hermetically-sealed printed circuit boards (PCBs) carrying digital high speed signals from the TIU, a plurality of power cables supporting a plurality of power requirements, and a plurality of ATE communication control cables to direct the TIU.
    Type: Application
    Filed: December 28, 2022
    Publication date: July 4, 2024
    Inventors: Prasoon JOSHI, Joseph BASILE, Eric BRUMMER, Evan FLEDELL, Joshua FREIER, Brett GROSSMAN, Jennifer HUENING, Matthew KIRSCH, James NEEB, Robert NESTING, Charles PETERSON, Ashraf REZAIE, Ling Hong TAN, Xianghong TONG, Vladimir VLASYUK
  • Publication number: 20240219460
    Abstract: This disclosure describes systems, methods, and devices related to electron beam and nanoprobing techniques with probe tips for fault isolation in integrated circuits. A method may include generating a signal at a circuit device under test while a probe tip electrically interacts with a transistor of the circuit device under test; detecting, based on the signal and the laser at the transistor, an electrical output of the circuit device under test; and identifying, based on the electrical output, a location of a fault at the circuit device under test.
    Type: Application
    Filed: December 28, 2022
    Publication date: July 4, 2024
    Inventors: Xianghong TONG, Jennifer HUENING, Joshua KEVEK, Kimberlee CELIO, Tristan DEBORDE, Prasoon JOSHI, May Ling OH, Hyuk Ju RYU, Mitchell SENGER, Martin VON HAARTMAN, Yunfei WANG, Shuai ZHAO
  • Publication number: 20230317408
    Abstract: Pulsed beam prober systems, devices, and techniques are described herein related to providing a beam detection frequency that is less than a electrical test frequency. An electrical test signal at the electrical test frequency is provided to die under test. A pulsed beam is applied to the die such that the pulsed beam has packets of beam pulses or a frequency delta with respect to the electrical test frequency. The packets of beam pulses or the frequency delta elicits a detectable beam modulation in an imaging signal reflected from the die such that the imaging signal is modulated at a detection frequency less than the electrical test frequency.
    Type: Application
    Filed: April 1, 2022
    Publication date: October 5, 2023
    Applicant: Intel Corporation
    Inventors: Xianghong Tong, Martin Von Haartman, Wen-Hsien Chuang, Zhiyong Ma, Hyuk Ju Ryu, Prasoon Joshi, May Ling Oh, Jennifer Huening, Shuai Zhao, Charles Peterson, Ira Jewell, Hasan Faraby