Abstract: An integrated circuit (IC) is provided for in-situ anomaly detection. Sensors in the IC generates sensor datasets including information indicating conditions in the IC. A processing unit in the IC uses a sensor dataset and a model to detect and classify the anomaly. The processing unit may filter the sensor dataset, extract features from the filtered sensor dataset, and input the features into the model. The model outputs one or more classifications of the anomaly. A feature may be a distance vector that represents a difference between a data value in the filtered sensor dataset from a reference data value. The model may be a network of bit-cells in the IC. The model may be continuously trained in-situ, i.e., on the IC. The processing unit may provide the classifications to another processing unit in the IC. The other processing unit may mitigate the anomaly based on the classifications.