Patents by Inventor Pravin Dasharth GAIKWAD

Pravin Dasharth GAIKWAD has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240154788
    Abstract: A method and system are directed to generating on-chip bitstreams on reconfigurable hardware. The system comprises a built-in bitstream initialization (BIBI) module configured to generate one or more bitstreams on a semiconductor device. The BIBI module comprising a sequence generator configured to generate a sequence of values for each of the one or more bitstreams, a masking module configured to convert the sequence of values to a given precision of bits, an encryption module configured to apply an encryption scheme to the sequence of values, and an error correction module configured to apply error correction on the sequence of values, wherein the one or more bitstreams are transmitted to a routing network configured to map the one or more bitstreams to input positions of one or more compute blocks.
    Type: Application
    Filed: October 27, 2023
    Publication date: May 9, 2024
    Inventors: Swarup Bhunia, Pravin Dasharth Gaikwad
  • Patent number: 11953548
    Abstract: Various embodiments of the present disclosure provide a scan-based architecture for register-transfer-level (RTL) or gate-level designs that improves the security of scan chain-based design-for-testability (DFT) structures. In various embodiments, the scan-based architecture includes invisible scan chains that are hidden in such a way that an attacker cannot easily identify or locate the invisible scan chains for exploitation and revealing internal secure information of the design. The invisible scan chains are dynamically configurable into a scan chain with select flip-flops, such that scan paths of the invisible scan chains may be different between different designs, chips, or testing operations. Various embodiments further employ key-based obfuscation by combining a scan control finite state machine with existing state machines within a design, which improves design security against unauthorized use and increases confidentiality.
    Type: Grant
    Filed: January 10, 2023
    Date of Patent: April 9, 2024
    Assignee: University of Florida Research Foundation, Incorporated
    Inventors: Swarup Bhunia, Pravin Dasharth Gaikwad, Jonathan William Cruz, Sudipta Paria
  • Publication number: 20230228815
    Abstract: Various embodiments of the present disclosure provide a scan-based architecture for register-transfer-level (RTL) or gate-level designs that improves the security of scan chain-based design-for-testability (DFT) structures. In various embodiments, the scan-based architecture includes invisible scan chains that are hidden in such a way that an attacker cannot easily identify or locate the invisible scan chains for exploitation and revealing internal secure information of the design. The invisible scan chains are dynamically configurable into a scan chain with select flip-flops, such that scan paths of the invisible scan chains may be different between different designs, chips, or testing operations. Various embodiments further employ key-based obfuscation by combining a scan control finite state machine with existing state machines within a design, which improves design security against unauthorized use and increases confidentiality.
    Type: Application
    Filed: January 10, 2023
    Publication date: July 20, 2023
    Inventors: Swarup BHUNIA, Pravin Dasharth GAIKWAD, Jonathan William CRUZ, Sudipta PARIA