Patents by Inventor Preston A. Thomson

Preston A. Thomson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11798601
    Abstract: A programmable memory device includes a ROM block to store instructions associated with functionality of the programmable memory device, a memory array having reserved pages to store updates to be performed on the ROM block, and a controller coupled to the ROM block and the memory array. The controller is to, in response to receipt of a remote command from a vendor server via a host system, execute the instructions to perform operations including: executing a set features command to access the set of reserved pages, as an extension to one time programmable mode; programming a set of sub-feature parameters to a specified feature address of the reserved pages, where the set of sub-feature parameters are to trigger operation within a ROM-emulated memory (REM) profile mode; and programming a REM-profiled page of the reserved pages with REM data received from the vendor server via the host system.
    Type: Grant
    Filed: December 2, 2021
    Date of Patent: October 24, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Jonathan Wen Jian Oh, Allison Jayne Olson, Fulvio Rori, Qisong Lin, Preston A. Thomson
  • Patent number: 11721404
    Abstract: Apparatuses and methods for operating mixed mode blocks. One example method can include tracking single level cell (SLC) mode cycles and extra level cell (XLC) mode cycles performed on the mixed mode blocks, maintaining a mixed mode cycle count corresponding to the mixed mode blocks, and adjusting the mixed mode cycle count differently for mixed mode blocks operated in a SLC mode than for mixed blocks operated in a XLC mode.
    Type: Grant
    Filed: September 24, 2021
    Date of Patent: August 8, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Kishore K. Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Gary F. Besinga, Scott A. Stoller, Sampath K. Ratnam, Renato C. Padilla, Peter Feeley
  • Patent number: 11688483
    Abstract: A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device further designates the block as a quarantined block, performs a stress test on the block, and depending on whether the stress test on the block satisfies a testing criterion, either designates the block as usable by the memory component or retires the block of the memory component.
    Type: Grant
    Filed: November 8, 2021
    Date of Patent: June 27, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Kishore Kumar Muchherla, Sampath K. Ratnam, Scott A. Stoller, Preston A. Thomson, Kevin R. Brandt, Marc S. Hamilton, Christopher S. Hale
  • Patent number: 11586357
    Abstract: The present disclosure includes memory blocks erasable in a single level cell mode. A number of embodiments include a memory comprising a plurality of mixed mode blocks and a controller. The controller may be configured to identify a particular mixed mode block for an erase operation and, responsive to a determined intent to subsequently write the particular mixed mode block in a single level cell (SLC) mode, perform the erase operation in the SLC mode.
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: February 21, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Kishore K. Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Sampath K. Ratnam, Renato C. Padilla, Peter Feeley
  • Publication number: 20230005548
    Abstract: A data erase operation is performed on the memory system. The directed data erase operation performed on the memory system erases blocks of the memory device including blocks that are indicated as not including user data. In some embodiments, a data erase operation may be performed on a memory system to erase those groups of memory cells (e.g., blocks) indicated as not including user data. In some embodiments, a data erase operation may be performed on a memory system to erase those groups of memory cells (e.g., blocks) indicated as valid without erasing those groups of memory cells (e.g., blocks) indicated as invalid. In some embodiments, a data erase operation that can be performed on a memory system may obtain information associated with failing scenes of groups of memory cells (e.g., blocks) prior to obtaining the information, and erase the blocks (e.g., invalid blocks) subsequently.
    Type: Application
    Filed: September 12, 2022
    Publication date: January 5, 2023
    Inventors: Kevin R. Brandt, Adam J. Hieb, Jonathan Tanguy, Preston A. Thomson
  • Patent number: 11482292
    Abstract: A non-volatile storage system includes a control circuit connected to non-volatile memory cells provides for progressive writing of data. That is, existing data is overwritten by new data without performing a traditional erase operation that changes the threshold voltage of the memory cells back to the traditional or original erase state. In one example, new data is written on top of old data using shifted threshold voltage distributions. Some embodiments include writing MLC data over SLC data, using intermediate erase threshold voltage distributions and/or automatically detecting which threshold voltage distributions are currently being used to store data.
    Type: Grant
    Filed: June 23, 2021
    Date of Patent: October 25, 2022
    Assignee: Western Digital Technologies, Inc.
    Inventors: Daniel Linnen, Kirubakaran Periyannan, Khanfer Kukkady, Preston Thomson
  • Patent number: 11443811
    Abstract: A data erase operation is performed on the memory system. The directed data erase operation performed on the memory system erases blocks of the memory device including blocks that are indicated as not including user data. In some embodiments, a data erase operation may be performed on a memory system to erase those groups of memory cells (e.g., blocks) indicated as not including user data. In some embodiments, a data erase operation may be performed on a memory system to erase those groups of memory cells (e.g., blocks) indicated as valid without erasing those groups of memory cells (e.g., blocks) indicated as invalid. In some embodiments, a data erase operation that can be performed on a memory system may obtain information associated with failing scenes of groups of memory cells (e.g., blocks) prior to obtaining the information, and erase the blocks (e.g., invalid blocks) subsequently.
    Type: Grant
    Filed: October 20, 2020
    Date of Patent: September 13, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Kevin R. Brandt, Adam J. Hieb, Jonathan Tanguy, Preston A. Thomson
  • Publication number: 20220093145
    Abstract: A programmable memory device includes a ROM block to store instructions associated with functionality of the programmable memory device, a memory array having reserved pages to store updates to be performed on the ROM block, and a controller coupled to the ROM block and the memory array. The controller is to, in response to receipt of a remote command from a vendor server via a host system, execute the instructions to perform operations including: executing a set features command to access the set of reserved pages, as an extension to one time programmable mode; programming a set of sub-feature parameters to a specified feature address of the reserved pages, where the set of sub-feature parameters are to trigger operation within a ROM-emulated memory (REM) profile mode; and programming a REM-profiled page of the reserved pages with REM data received from the vendor server via the host system.
    Type: Application
    Filed: December 2, 2021
    Publication date: March 24, 2022
    Inventors: Jonathan Wen Jian Oh, Aaron James Olson, Fulvio Rori, Qisong Lin, Preston A. Thomson
  • Publication number: 20220068422
    Abstract: A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device further designates the block as a quarantined block, performs a stress test on the block, and depending on whether the stress test on the block satisfies a testing criterion, either designates the block as usable by the memory component or retires the block of the memory component.
    Type: Application
    Filed: November 8, 2021
    Publication date: March 3, 2022
    Inventors: Kishore Kumar Muchherla, Sampath K. Ratnam, Scott A. Stoller, Preston A. Thomson, Kevin R. Brandt, Marc S. Hamilton, Christopher S. Hale
  • Publication number: 20220013182
    Abstract: Apparatuses and methods for operating mixed mode blocks. One example method can include tracking single level cell (SLC) mode cycles and extra level cell (XLC) mode cycles performed on the mixed mode blocks, maintaining a mixed mode cycle count corresponding to the mixed mode blocks, and adjusting the mixed mode cycle count differently for mixed mode blocks operated in a SLC mode than for mixed blocks operated in a XLC mode.
    Type: Application
    Filed: September 24, 2021
    Publication date: January 13, 2022
    Inventors: Kishore K. Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Gary F. Besinga, Scott A. Stoller, Sampath K. Ratnam, Renato C. Padilla, Peter Feeley
  • Patent number: 11200925
    Abstract: A programmable memory device includes a read only memory (ROM) block to store instructions associated with functionality of the programmable memory device. The device includes a memory array having a set of reserved pages to store updates to be performed on the ROM block. The device includes a controller coupled to the ROM block and the memory array. The controller is to execute the instructions to: execute a set features command; program, in execution of the set features command, a set of sub-feature parameters to a specified feature address of the set of reserved pages, wherein the set of sub-feature parameters are to trigger operation within a ROM-emulated memory (REM) profile mode; and program a REM-profiled page of the set of reserved pages with REM data received from a host system.
    Type: Grant
    Filed: June 16, 2020
    Date of Patent: December 14, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Jonathan Wen Jian Oh, Aaron James Olson, Fulvio Rori, Qisong Lin, Preston A. Thomson
  • Patent number: 11170866
    Abstract: A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device identifies a behavioral criterion associated with the data loss occurrence in the block of the memory component. The processing device further increments a counter associated with the block in response to an occurrence of the behavioral criterion, wherein a value of the counter corresponds to a number of occurrences of a plurality of behavioral criteria associated with data loss occurrences in the block. Responsive to determining that the value of the counter satisfies a first threshold criterion, the processing device designates the block as a quarantined block, performs a stress test of a plurality of stress tests of the block, and responsive to the block failing a first stress test, the processing device retires the block of the memory component.
    Type: Grant
    Filed: October 22, 2019
    Date of Patent: November 9, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Kishore Kumar Muchherla, Sampath K. Ratnam, Scott A. Stoller, Preston A. Thomson, Kevin R. Brandt, Marc S. Hamilton, Christopher S. Hale
  • Patent number: 11158392
    Abstract: Apparatuses and methods for operating mixed mode blocks. One example method can include tracking single level cell (SLC) mode cycles and extra level cell (XLC) mode cycles performed on the mixed mode blocks, maintaining a mixed mode cycle count corresponding to the mixed mode blocks, and adjusting the mixed mode cycle count differently for mixed mode blocks operated in a SLC mode than for mixed blocks operated in a XLC mode.
    Type: Grant
    Filed: May 15, 2019
    Date of Patent: October 26, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Kishore K. Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Gary F. Besinga, Scott A. Stoller, Sampath K. Ratnam, Renato C. Padilla, Peter Feeley
  • Publication number: 20210286525
    Abstract: The present disclosure includes memory blocks erasable in a single level cell mode. A number of embodiments include a memory comprising a plurality of mixed mode blocks and a controller. The controller may be configured to identify a particular mixed mode block for an erase operation and, responsive to a determined intent to subsequently write the particular mixed mode block in a single level cell (SLC) mode, perform the erase operation in the SLC mode.
    Type: Application
    Filed: May 27, 2021
    Publication date: September 16, 2021
    Inventors: Kishore K. Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Sampath K. Ratnam, Renato C. Padilla, Peter Feeley
  • Patent number: 11101015
    Abstract: A target vector representing a usage parameter corresponding to a test of a memory component is generated. A test sample is assigned to the target vector and a set of path variables are generated for the test sample. A test process of the test is executed using the test sample in accordance with the set of path variables to generate a test result. A failure associated with the test result is identified.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: August 24, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Aswin Thiruvengadam, Sivagnanam Parthasarathy, Preston Thomson
  • Publication number: 20210193199
    Abstract: A programmable memory device includes a read only memory (ROM) block to store instructions associated with functionality of the programmable memory device. The device includes a memory array having a set of reserved pages to store updates to be performed on the ROM block. The device includes a controller coupled to the ROM block and the memory array. The controller is to execute the instructions to: execute a set features command; program, in execution of the set features command, a set of sub-feature parameters to a specified feature address of the set of reserved pages, wherein the set of sub-feature parameters are to trigger operation within a ROM-emulated memory (REM) profile mode; and program a REM-profiled page of the set of reserved pages with REM data received from a host system.
    Type: Application
    Filed: June 16, 2020
    Publication date: June 24, 2021
    Inventors: Jonathan Wen Jian Oh, Aaron James Olson, Fulvio Rori, Qisong Lin, Preston A. Thomson
  • Patent number: 11042306
    Abstract: The present disclosure includes memory blocks erasable in a single level cell mode. A number of embodiments include a memory comprising a plurality of mixed mode blocks and a controller. The controller may be configured to identify a particular mixed mode block for an erase operation and, responsive to a determined intent to subsequently write the particular mixed mode block in a single level cell (SLC) mode, perform the erase operation in the SLC mode.
    Type: Grant
    Filed: May 23, 2019
    Date of Patent: June 22, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Kishore K. Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Sampath K. Ratnam, Renato C. Padilla, Peter Feeley
  • Publication number: 20210118519
    Abstract: A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device identifies a behavioral criterion associated with the data loss occurrence in the block of the memory component. The processing device further increments a counter associated with the block in response to an occurrence of the behavioral criterion, wherein a value of the counter corresponds to a number of occurrences of a plurality of behavioral criteria associated with data loss occurrences in the block. Responsive to determining that the value of the counter satisfies a first threshold criterion, the processing device designates the block as a quarantined block, performs a stress test of a plurality of stress tests of the block, and responsive to the block failing a first stress test, the processing device retires the block of the memory component.
    Type: Application
    Filed: October 22, 2019
    Publication date: April 22, 2021
    Inventors: Kishore Kumar Muchherla, Sampath K. Ratnam, Scott A. Stoller, Preston A. Thomson, Kevin R. Brandt, Marc S. Hamilton, Christopher S. Hale
  • Publication number: 20210035645
    Abstract: A data erase operation is performed on the memory system. The directed data erase operation performed on the memory system erases blocks of the memory device including blocks that are indicated as not including user data. In some embodiments, a data erase operation may be performed on a memory system to erase those groups of memory cells (e.g., blocks) indicated as not including user data. In some embodiments, a data erase operation may be performed on a memory system to erase those groups of memory cells (e.g., blocks) indicated as valid without erasing those groups of memory cells (e.g., blocks) indicated as invalid. In some embodiments, a data erase operation that can be performed on a memory system may obtain information associated with failing scenes of groups of memory cells (e.g., blocks) prior to obtaining the information, and erase the blocks (e.g., invalid blocks) subsequently.
    Type: Application
    Filed: October 20, 2020
    Publication date: February 4, 2021
    Inventors: Kevin R. Brandt, Adam J. Hieb, Jonathan Tanguy, Preston A. Thomson
  • Patent number: 10854299
    Abstract: A data erase operation is performed on the memory system. The directed data erase operation performed on the memory system erases blocks of the memory device including blocks that are indicated as not including user data. In some embodiments, a data erase operation may be performed on a memory system to erase those groups of memory cells (e.g., blocks) indicated as not including user data. In some embodiments, a data erase operation may be performed on a memory system to erase those groups of memory cells (e.g., blocks) indicated as valid without erasing those groups of memory cells (e.g., blocks) indicated as invalid. In some embodiments, a data erase operation that can be performed on a memory system may obtain information associated with failing scenes of groups of memory cells (e.g., blocks) prior to obtaining the information, and erase the blocks (e.g., invalid blocks) subsequently.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: December 1, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Kevin R. Brandt, Adam J. Hieb, Jonathan Tanguy, Preston A. Thomson