Patents by Inventor Preston Allen Thomson

Preston Allen Thomson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11735269
    Abstract: Disclosed in some examples are systems, methods, memory devices, and machine readable mediums for a fast secure data destruction for NAND memory devices that renders data in a memory cell unreadable. Instead of going through all the erase phases, the memory device may remove sensitive data by performing only the pre-programming phase of the erase process. Thus, the NAND doesn't perform the second and third phases of the erase process. This is much faster and results in data that cannot be reconstructed. In some examples, because the erase pulse is not actually applied and because this is simply a programming operation, data may be rendered unreadable at a per-page level rather than a per-block level as in traditional erases.
    Type: Grant
    Filed: January 31, 2022
    Date of Patent: August 22, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Ting Luo, Kulachet Tanpairoj, Harish Reddy Singidi, Jianmin Huang, Preston Allen Thomson, Sebastien Andre Jean
  • Patent number: 11610632
    Abstract: Devices and techniques for NAND temperature data management are disclosed herein. A command to write data to a NAND component in the NAND device is received at a NAND controller of the NAND device. A temperature corresponding to the NAND component is obtained in response to receiving the command. The command is then executed to write data to the NAND component and to write a representation of the temperature. The data is written to a user portion and the representation of the temperature is written to a management portion that is accessible only to the controller and segregated from the user portion.
    Type: Grant
    Filed: May 26, 2021
    Date of Patent: March 21, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Kishore Kumar Muchherla, Sampath Ratnam, Preston Allen Thomson, Harish Reddy Singidi, Jung Sheng Hoei, Peter Sean Feeley, Jianmin Huang
  • Patent number: 11513889
    Abstract: A variety of applications can include apparatus and/or methods that provide parity data protection to data in a memory system for a limited period of time and not stored as permanent parity data in a non-volatile memory. Parity data can be accumulated in a volatile memory for data programmed via a group of access lies having a specified number of access lines in the group. A read verify can be issued to selected pages after programming finishes at the end of programming via the access lines of the group. With the programming of the data determined to be acceptable at the end of programming via the last of the access lines of the group, the parity data in the volatile memory can be discarded and accumulation can begin for a next group having a specified number of access lines. Additional apparatus, systems, and methods are disclosed.
    Type: Grant
    Filed: August 26, 2021
    Date of Patent: November 29, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Chun Sum Yeung, Falgun G. Trivedi, Harish Reddy Singidi, Xiangang Luo, Preston Allen Thomson, Ting Luo, Jianmin Huang
  • Patent number: 11487612
    Abstract: A variety of applications can include apparatus and/or methods that provide parity protection to data spread over multiple memory devices of a memory system. Parity is stored in a buffer, where the parity is generated from portions of data written to a page having a different portion of the page in a portion of each plane of one or more planes of the multiple memory devices. Parity is stored in the buffer for each page. In response to a determination that a transfer criterion is satisfied, the parity data in the buffer is transferred from the buffer to a temporary block. After programming data into the block to close the block, a verification of the block with respect to data errors is conducted. In response to passing the verification, the temporary block can be released for use in a next data write operation. Additional apparatus, systems, and methods are disclosed.
    Type: Grant
    Filed: September 10, 2020
    Date of Patent: November 1, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Harish Reddy Singidi, Xiangang Luo, Preston Allen Thomson, Michael G. McNeeley
  • Patent number: 11482298
    Abstract: A method of operating a memory device comprises generating a target voltage using a pump circuit of the memory device, the target voltage to be applied to a word line or pillar of a memory cell of the memory device; providing an indication of current generated by the pump circuit after the pump circuit output reaches the target voltage; and determining when the current generated by the pump circuit is greater than a specified threshold current and generating a fault indication according to the determination.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: October 25, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Jason Lee Nevill, Preston Allen Thomson, Chi Ming Chu, Sheng-Huang Lee
  • Publication number: 20220157386
    Abstract: Disclosed in some examples are systems, methods, memory devices, and machine readable mediums for a fast secure data destruction for NAND memory devices that renders data in a memory cell unreadable. Instead of going through all the erase phases, the memory device may remove sensitive data by performing only the pre-programming phase of the erase process. Thus, the NAND doesn't perform the second and third phases of the erase process. This is much faster and results in data that cannot be reconstructed. In some examples, because the erase pulse is not actually applied and because this is simply a programming operation, data may be rendered unreadable at a per-page level rather than a per-block level as in traditional erases.
    Type: Application
    Filed: January 31, 2022
    Publication date: May 19, 2022
    Inventors: Ting Luo, Kulachet Tanpairoj, Harish Reddy Singidi, Jianmin Huang, Preston Allen Thomson, Sebastien Andre Jean
  • Patent number: 11288149
    Abstract: Devices and techniques for a flash memory block retirement policy are disclosed herein. In an example embodiment, a first memory block is provisionally removed from service in response to encountering read errors in the first memory block. Memory pages of the first memory block are tested in a second mode comprising reading memory pages at different read voltages. A raw bit error rate (RBER) or a read window budget (RWB) is determined for memory pages at the different read voltages and the provisionally removed first memory block is returned to service or retired based on the determined RBER or the RWB.
    Type: Grant
    Filed: October 7, 2020
    Date of Patent: March 29, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Harish Reddy Singidi, Giuseppe Cariello, Deping He, Scott Anthony Stoller, Devin Batutis, Preston Allen Thomson
  • Patent number: 11238939
    Abstract: Disclosed in some examples are systems, methods, memory devices, and machine readable mediums for a fast secure data destruction for NAND memory devices that renders data in a memory cell unreadable. Instead of going through all the erase phases, the memory device may remove sensitive data by performing only the pre-programming phase of the erase process. Thus, the NAND doesn't perform the second and third phases of the erase process. This is much faster and results in data that cannot be reconstructed. In some examples, because the erase pulse is not actually applied and because this is simply a programming operation, data may be rendered unreadable at a per-page level rather than a per-block level as in traditional erases.
    Type: Grant
    Filed: January 26, 2021
    Date of Patent: February 1, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Ting Luo, Kulachet Tanpairoj, Harish Reddy Singidi, Jianmin Huang, Preston Allen Thomson, Sebastien Andre Jean
  • Publication number: 20210390014
    Abstract: A variety of applications can include apparatus and/or methods that provide parity data protection to data in a memory system for a limited period of time and not stored as permanent parity data in a non-volatile memory. Parity data can be accumulated in a volatile memory for data programmed via a group of access lies having a specified number of access lines in the group. A read verify can be issued to selected pages after programming finishes at the end of programming via the access lines of the group. With the programming of the data determined to be acceptable at the end of programming via the last of the access lines of the group, the parity data in the volatile memory can be discarded and accumulation can begin for a next group having a specified number of access lines. Additional apparatus, systems, and methods are disclosed.
    Type: Application
    Filed: August 26, 2021
    Publication date: December 16, 2021
    Inventors: Chun Sum Yeung, Falgun G. Trivedi, Harish Reddy Singidi, Xiangang Luo, Preston Allen Thomson, Ting Luo, Jianmin Huang
  • Publication number: 20210375387
    Abstract: A method of operating a memory device comprises generating a target voltage using a pump circuit of the memory device, the target voltage to be applied to a word line or pillar of a memory cell of the memory device; providing an indication of current generated by the pump circuit after the pump circuit output reaches the target voltage; and determining when the current generated by the pump circuit is greater than a specified threshold current and generating a fault indication according to the determination.
    Type: Application
    Filed: May 29, 2020
    Publication date: December 2, 2021
    Inventors: Jason Lee Nevill, Preston Allen Thomson, Chi Ming Chu, Sheng-Huang Lee
  • Publication number: 20210287748
    Abstract: Devices and techniques for NAND temperature data management are disclosed herein. A command to write data to a NAND component in the NAND device is received at a NAND controller of the NAND device. A temperature corresponding to the NAND component is obtained in response to receiving the command. The command is then executed to write data to the NAND component and to write a representation of the temperature. The data is written to a user portion and the representation of the temperature is written to a management portion that is accessible only to the controller and segregated from the user portion.
    Type: Application
    Filed: May 26, 2021
    Publication date: September 16, 2021
    Inventors: Kishore Kumar Muchherla, Sampath Ratnam, Preston Allen Thomson, Harish Reddy Singidi, Jung Sheng Hoei, Peter Sean Feeley, Jianmin Huang
  • Patent number: 11106530
    Abstract: A variety of applications can include apparatus and/or methods that provide parity data protection to data in a memory system for a limited period of time and not stored as permanent parity data in a non-volatile memory. Parity data can be accumulated in a volatile memory for data programmed via a group of access lies having a specified number of access lines in the group. A read verify can be issued to selected pages after programming finishes at the end of programming via the access lines of the group. With the programming of the data determined to be acceptable at the end of programming via the last of the access lines of the group, the parity data in the volatile memory can be discarded and accumulation can begin for a next group having a specified number of access lines. Additional apparatus, systems, and methods are disclosed.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: August 31, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Chun Sum Yeung, Falgun G. Trivedi, Harish Reddy Singidi, Xiangang Luo, Preston Allen Thomson, Ting Luo, Jianmin Huang
  • Publication number: 20210191807
    Abstract: A variety of applications can include apparatus and/or methods that provide parity data protection to data in a memory system for a limited period of time and not stored as permanent parity data in a non-volatile memory. Parity data can be accumulated in a volatile memory for data programmed via a group of access lies having a specified number of access lines in the group. A read verify can be issued to selected pages after programming finishes at the end of programming via the access lines of the group. With the programming of the data determined to be acceptable at the end of programming via the last of the access lines of the group, the parity data in the volatile memory can be discarded and accumulation can begin for a next group having a specified number of access lines. Additional apparatus, systems, and methods are disclosed.
    Type: Application
    Filed: December 20, 2019
    Publication date: June 24, 2021
    Inventors: Chun Sum Yeung, Falgun G. Trivedi, Harish Reddy Singidi, Xiangang Luo, Preston Allen Thomson, Ting Luo, Jianmin Huang
  • Patent number: 11037630
    Abstract: Devices and techniques for NAND temperature data management are disclosed herein. A command to write data to a NAND component in the NAND device is received at a NAND controller of the NAND device. A temperature corresponding to the NAND component is obtained in response to receiving the command. The command is then executed to write data to the NAND component and to write a representation of the temperature. The data is written to a user portion and the representation of the temperature is written to a management portion that is accessible only to the controller and segregated from the user portion.
    Type: Grant
    Filed: April 23, 2020
    Date of Patent: June 15, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Kishore Kumar Muchherla, Sampath Ratnam, Preston Allen Thomson, Harish Reddy Singidi, Jung Sheng Hoei, Peter Sean Feeley, Jianmin Huang
  • Publication number: 20210151111
    Abstract: Disclosed in some examples are systems, methods, memory devices, and machine readable mediums for a fast secure data destruction for NAND memory devices that renders data in a memory cell unreadable. Instead of going through all the erase phases, the memory device may remove sensitive data by performing only the pre-programming phase of the erase process. Thus, the NAND doesn't perform the second and third phases of the erase process. This is much faster and results in data that cannot be reconstructed. In some examples, because the erase pulse is not actually applied and because this is simply a programming operation, data may be rendered unreadable at a per-page level rather than a per-block level as in traditional erases.
    Type: Application
    Filed: January 26, 2021
    Publication date: May 20, 2021
    Inventors: Ting Luo, Kulachet Tanpairoj, Harish Reddy Singidi, Jianmin Huang, Preston Allen Thomson, Sebastien Andre Jean
  • Patent number: 10950310
    Abstract: Disclosed in some examples are systems, methods, memory devices, and machine readable mediums for a fast secure data destruction for NAND memory devices that renders data in a memory cell unreadable. Instead of going through all the erase phases, the memory device may remove sensitive data by performing only the pre-programming phase of the erase process. Thus, the NAND doesn't perform the second and third phases of the erase process. This is much faster and results in data that cannot be reconstructed. In some examples, because the erase pulse is not actually applied and because this is simply a programming operation, data may be rendered unreadable at a per-page level rather than a per-block level as in traditional erases.
    Type: Grant
    Filed: December 26, 2019
    Date of Patent: March 16, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Ting Luo, Kulachet Tanpairoj, Harish Reddy Singidi, Jianmin Huang, Preston Allen Thomson, Sebastien Andre Jean
  • Publication number: 20210019241
    Abstract: Devices and techniques for a flash memory block retirement policy are disclosed herein. In an example embodiment, a first memory block is provisionally removed from service in response to encountering read errors in the first memory block. Memory pages of the first memory block are tested in a second mode comprising reading memory pages at different read voltages. A raw bit error rate (RBER) or a read window budget (RWB) is determined for memory pages at the different read voltages and the provisionally removed first memory block is returned to service or retired based on the determined RBER or the RWB.
    Type: Application
    Filed: October 7, 2020
    Publication date: January 21, 2021
    Inventors: Harish Reddy Singidi, Giuseppe Cariello, Deping He, Scott Anthony Stoller, Devin Batutis, Preston Allen Thomson
  • Publication number: 20200409789
    Abstract: A variety of applications can include apparatus and/or methods that provide parity protection to data spread over multiple memory devices of a memory system. Parity is stored in a buffer, where the parity is generated from portions of data written to a page having a different portion of the page in a portion of each plane of one or more planes of the multiple memory devices. Parity is stored in the buffer for each page. In response to a determination that a transfer criterion is satisfied, the parity data in the buffer is transferred from the buffer to a temporary block. After programming data into the block to close the block, a verification of the block with respect to data errors is conducted. In response to passing the verification, the temporary block can be released for use in a next data write operation. Additional apparatus, systems, and methods are disclosed.
    Type: Application
    Filed: September 10, 2020
    Publication date: December 31, 2020
    Inventors: Harish Reddy Singidi, Xiangang Luo, Preston Allen Thomson, Michael G. McNeeley
  • Patent number: 10824527
    Abstract: Devices and techniques for a flash memory block retirement policy are disclosed herein. In an example embodiment, a first memory block is removed from service in response to encountering a read error in the first memory block that exceeds a first error threshold. Recoverable data is copied from the first memory block to a second memory block. During each of multiple iterations, the first memory block is erased and programmed, and each page of the first memory block is read. In response to none of the pages exhibiting a read error that exceeds a second error threshold during the multiple iterations, the first memory block is returned to service.
    Type: Grant
    Filed: July 5, 2019
    Date of Patent: November 3, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Harish Reddy Singidi, Giuseppe Cariello, Deping He, Scott Anthony Stoller, Devin Batutis, Preston Allen Thomson
  • Publication number: 20200258578
    Abstract: Devices and techniques for NAND temperature data management are disclosed herein. A command to write data to a NAND component in the NAND device is received at a NAND controller of the NAND device. A temperature corresponding to the NAND component is obtained in response to receiving the command. The command is then executed to write data to the NAND component and to write a representation of the temperature. The data is written to a user portion and the representation of the temperature is written to a management portion that is accessible only to the controller and segregated from the user portion.
    Type: Application
    Filed: April 23, 2020
    Publication date: August 13, 2020
    Inventors: Kishore Kumar Muchherla, Sampath Ratnam, Preston Allen Thomson, Harish Reddy Singidi, Jung Sheng Hoei, Peter Sean Feeley, Jianmin Huang