Patents by Inventor Priyadarsan Patra

Priyadarsan Patra has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10198333
    Abstract: An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware hooks (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and debug of a part/platform under test.
    Type: Grant
    Filed: December 23, 2010
    Date of Patent: February 5, 2019
    Assignee: INTEL CORPORATION
    Inventors: Mark B. Trobough, Keshavan K. Tiruvallur, Chinna B. Prudvi, Christian E. Iovin, David W. Grawrock, Jay J. Nejedlo, Ashok N. Kabadi, Travis K. Goff, Evan J. Halprin, Kapila B. Udawatta, Jiun Long Foo, Wee Hoo Cheah, Vui Yong Liew, Selvakumar Raja Gopal, Yuen Tat Lee, Samie B. Samaan, Kip C. Killpack, Neil Dobler, Nagib Z. Hakim, Brian Meyer, William H. Penner, John L. Baudrexl, Russell J. Wunderlich, James J. Grealish, Kyle Markley, Timothy S. Storey, Loren J. McConnell, Lyle E. Cool, Mukesh Kataria, Rahima K. Mohammed, Tieyu Zheng, Yi Amy Xia, Ridvan A. Sahan, Arun R. Ramadorai, Priyadarsan Patra, Edwin E. Parks, Abhijit Davare, Padmakumar Gopal, Bruce Querbach, Hermann W. Gartler, Keith Drescher, Sanjay S. Salem, David C. Florey
  • Publication number: 20150127983
    Abstract: An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and de-bug of a part/platform under test.
    Type: Application
    Filed: December 23, 2010
    Publication date: May 7, 2015
    Applicant: INTEL CORPORATION
    Inventors: Mark B. Trobough, Keshavan K. Tiruvallur, Chinna B. Prudvi, Christian E. Iovin, David W. Grawrock, Jay J. Nejedlo, Ashok N. Kabadi, Travis K. Goff, Evan J. Halprin, Kapila B. Udawatta, Jiun Long Foo, Wee Hoo Cheah, Vui Yong Liew, Selvakumar Raja Gopal, Yuen Tat Lee, Samie B. Samaan, Kip C. Killpack, Neil Dobler, Nagib Z. Hakim, Briar Meyer, William H. Penner, John L. Baudrexl, Russell J. Wunderlich, James J. Grealish, Kyle Markley, Timothy S. Storey, Loren J. McConnell, Lyle E. Cool, Mukesh Kataria, Rahima K. Mohammed, Tieyu Zheng, Yi Amy Xia, Ridvan A. Sahan, Arun R. Ramadorai, Priyadarsan Patra, Edwin E. Parks, Abhijit Davare, Padmakumar Gopal, Bruce Querbach, Hermann W. Gartler, Keith Drescher, Sanjay S. Salem, David C. Florey
  • Patent number: 8055697
    Abstract: A method and device may be useful for dynamically verifying a processor architecture at runtime. The checker may more efficiently and cheaply verify at least some of the functionality provided by the execution unit of the processor architecture. The checker may verify operations such as addition, subtraction, multiplication, and division.
    Type: Grant
    Filed: March 28, 2008
    Date of Patent: November 8, 2011
    Assignee: Intel Corporation
    Inventor: Priyadarsan Patra
  • Publication number: 20090248781
    Abstract: A method and device may be useful for dynamically verifying a processor architecture at runtime. The checker may more efficiently and cheaply verify at least some of the functionality provided by the execution unit of the processor architecture. The checker may verify operations such as addition, subtraction, multiplication, and division.
    Type: Application
    Filed: March 28, 2008
    Publication date: October 1, 2009
    Inventor: Priyadarsan PATRA
  • Publication number: 20090240454
    Abstract: A method of conducting validation is provided. The method includes providing a processor that does not include a validation function and providing an auxiliary die coupled to the processor. The method also includes receiving validation data from the processor in the auxiliary die and conducting validation of the processor in the auxiliary die.
    Type: Application
    Filed: March 24, 2008
    Publication date: September 24, 2009
    Inventor: Priyadarsan Patra
  • Publication number: 20080115099
    Abstract: Spatial curvature techniques for multiple objective routing is described. In one or more embodiments, routing between components of an integrated circuit may be determined by transforming pin configurations (e.g., nets) associated with the integrated circuit into a curved space which accounts for multiple design objectives as geometric distance. In the transformed space one or more routings may be computed for a [in configuration to meet one or more specified criteria.
    Type: Application
    Filed: November 15, 2006
    Publication date: May 15, 2008
    Inventor: Priyadarsan Patra
  • Patent number: 6721924
    Abstract: A system and computer implemented method of modifying characteristics of a circuit provide enhanced performance. One embodiment of the method provides for determining a set of objective parameters for the circuit and receiving noise constraints for the circuit. Values of the objective parameters are optimized based on the noise constraints. By using noise constraints in the optimization process, a number of performance issues can be addressed.
    Type: Grant
    Filed: September 28, 2001
    Date of Patent: April 13, 2004
    Assignee: Intel Corporation
    Inventors: Priyadarsan Patra, Barbara Chappell
  • Publication number: 20040060016
    Abstract: A system and computer implemented method of modifying characteristics of a circuit provide enhanced performance. One embodiment of the method provides for determining a set of objective parameters for the circuit and receiving noise constraints for the circuit. Values of the objective parameters are optimized based on the noise constraints. By using noise constraints in the optimization process, a number of performance issues can be addressed.
    Type: Application
    Filed: September 22, 2003
    Publication date: March 25, 2004
    Inventors: Priyadarsan Patra, Barbara Chappell
  • Patent number: 6556962
    Abstract: A system and method which reduce a network cost of a domino circuit. The network costs of domino circuits can be reduced by utilizing the methods and systems disclosed. The domino circuit is represented as a mixed integer linear program. The mixed integer linear program is solved to determine an implementation that includes determining a final phase assignment that reduces the network cost.
    Type: Grant
    Filed: July 2, 1999
    Date of Patent: April 29, 2003
    Assignee: Intel Corporation
    Inventor: Priyadarsan Patra
  • Publication number: 20030066037
    Abstract: A system and computer implemented method of modifying characteristics of a circuit provide enhanced performance. One embodiment of the method provides for determining a set of objective parameters for the circuit and receiving noise constraints for the circuit. Values of the objective parameters are optimized based on the noise constraints. By using noise constraints in the optimization process, a number of performance issues can be addressed.
    Type: Application
    Filed: September 28, 2001
    Publication date: April 3, 2003
    Inventors: Priyadarsan Patra, Barbara Chappell
  • Patent number: 6529861
    Abstract: A system and method which reduce power consumption of a domino circuit. An initial phase assignment for outputs of the domino circuit is generated. A final phase assignment that reduces power consumption of the domino circuit is determined. The final phase assignment is selected from at least one additional phase assignment. The power consumption of domino circuits can be reduced by utilizing the methods and systems disclosed.
    Type: Grant
    Filed: July 2, 1999
    Date of Patent: March 4, 2003
    Assignee: Intel Corporation
    Inventors: Priyadarsan Patra, Unni K. Narayanan