Abstract: In a described example, a device includes: a semiconductor substrate; a memory array on the semiconductor substrate, the memory array comprising rows and columns of memory cells in a Manhattan pattern, the memory cells having a pitch in a direction along the columns; and an array of micromirrors in a diamond pattern over the memory cells, the micromirrors coupled to corresponding memory cells, the micromirrors having a diagonal pitch length in the direction along the columns that is between 1.8 times the pitch and 2.2 times the pitch.

Abstract: In a described example, a device includes: a semiconductor substrate; a memory array on the semiconductor substrate, the memory array comprising rows and columns of memory cells in a Manhattan pattern, the memory cells having a pitch in a direction along the columns; and an array of micromirrors in a diamond pattern over the memory cells, the micromirrors coupled to corresponding memory cells, the micromirrors having a diagonal pitch length in the direction along the columns that is between 1.8 times the pitch and 2.2 times the pitch.

Abstract: A self-gating flip-flop circuit includes a flip-flop circuit and a clock circuit. The flip-flop circuit includes a clock input. The clock circuit is coupled to the clock input. The clock circuit includes a latch circuit, a reset circuit, and a gate circuit. The reset circuit is coupled to the latch circuit. The gate circuit is coupled to the latch circuit and the clock input.

Abstract: In an aspect of the disclosure, a method and an apparatus are provided. The apparatus may be a memory. The memory may include a first memory portion configured to store a first bit and generate a first data bit output. The first data bit output may be a function of the first bit when a first read enable is active. The memory may also include a second memory portion configured to store a second bit and generate a second data bit output. The second data bit output may be a function of the second bit when a second read enable is active. The memory may include a switch configured to select between the first and second bits for a read operation based on the first and second data bit outputs.

Abstract: A first bitline driver includes a multiplexer for outputting data and write mask signals in functional mode, and test vector signal in test mode; a latch to latch the data signal in functional mode and the test vector signal in test mode; a latch to latch the write mask signal in functional mode and the test vector signal in test mode; a latch to latch the test vector signal and provide it to a scan output; and a write circuit for writing data to a memory cell based on the data signal. A second bitline driver includes a latch to latch a data signal in functional mode if a write mask signal is deasserted and to latch a test vector signal in test mode; a latch to latch the test vector signal and provide it to a scan output; and a write circuit for writing data to a memory cell.

Abstract: Maskable level shifter circuits and memories are provided. Memories may include a plurality of memory cells and a bitline coupled to the plurality of memory cells. The memories includes a maskable level shifter configured to receive write data and a mask signal. A maskable level shifter includes a level shifter configured to level shift the write data and output the level shifted write data to the bitline when the mask signal is inactive and a masking circuit configured to remove power from the level shifter when the mask signal is active. Another maskable level shifter includes a level shifter configured to level shift the write data and output the level shifted write data to the bitline when the mask signal is inactive and a masking circuit configured to output a predetermined state to the bitline when the mask signal is active.

Abstract: A negative bit line boost circuit for a memory is configured to control a write multiplexer and a write assist transistor so that charge from a boost capacitor positively charges a bit line following a write assist period.

Abstract: In an aspect of the disclosure, a method and an apparatus are provided. The apparatus may be a memory. The memory may include a first memory portion configured to store a first bit and generate a first data bit output. The first data bit output may be a function of the first bit when a first read enable is active. The memory may also include a second memory portion configured to store a second bit and generate a second data bit output. The second data bit output may be a function of the second bit when a second read enable is active. The memory may include a switch configured to select between the first and second bits for a read operation based on the first and second data bit outputs.

Abstract: An integrated circuit (IC) is disclosed herein for accelerating memory access with an output latch. In an example aspect, the output latch includes a data storage unit, first circuitry, and second circuitry. The data storage unit includes a first input node configured to receive a first input voltage, a second input node configured to receive a second input voltage, a first output node configured to provide a first output voltage, and a second output node configured to provide a second output voltage. The first circuitry is configured to accelerate a voltage level transition of the first output voltage at the first output node responsive to the first input voltage at the first input node. The second circuitry is configured to accelerate a voltage level transition of the second output voltage at the second output node responsive to the second input voltage at the second input node.

Abstract: An electronic device includes a pulsed latch circuit configured to latch a data input signal to an output based upon receipt of a pulse signal. A pulse generation circuit is configured to compare the data input signal and an output signal at the output of the pulsed latch circuit, and to generate the pulse signal based upon a mismatch therebetween in response to a clock signal.