Patents by Inventor Puguo ZHANG

Puguo ZHANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for detecting defects on a display subtrate
    Patent number: 10169855
    Abstract: The present invention provides a detecting device and a detecting method thereof. The detecting device serves to detect defects on the display substrate and comprises: a detecting unit for searching for defects on the display substrate and taking pictures of areas in which the defects are located; and a control unit for comparing and analyzing the pictures sent from the detecting unit to assist the detecting unit to search for the defects on the display substrate, and classifying and counting the pictures of areas in which the defects are located. The detecting device can automatically search for and analyze defects on the display substrate, thereby time for analyzing defects on the display substrate is reduced, and defect analyzing efficiency is improved.
    Type: Grant
    Filed: April 13, 2016
    Date of Patent: January 1, 2019
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., Ordos Yuansheng Optoelectronics Co., Ltd.
    Inventors: Zhiqiang Wang, Puguo Zhang, Litao Yang, Yanwei Ren, Kunpeng Zhang
  • Detecting Device and Detecting Method Thereof
    Publication number: 20160321794
    Abstract: The present invention provides a detecting device and a detecting method thereof. The detecting device serves to detect defects on the display substrate and comprises: a detecting unit for searching for defects on the display substrate and taking pictures of areas in which the defects are located; and a control unit for comparing and analyzing the pictures sent from the detecting unit to assist the detecting unit to search for the defects on the display substrate, and classifying and counting the pictures of areas in which the defects are located. The detecting device can automatically search for and analyze defects on the display substrate, thereby time for analyzing defects on the display substrate is reduced, and defect analyzing efficiency is improved.
    Type: Application
    Filed: April 13, 2016
    Publication date: November 3, 2016
    Inventors: Zhiqiang WANG, Puguo ZHANG, Litao YANG, Yanwei REN, Kunpeng ZHANG