Abstract: Fabrication methods for magnetic recording media that use a plasma polish are disclosed. For one exemplary method, a film of a magnetic recording medium is deposited, and a top surface of the film is polished utilizing a plasma formed by a noble gas to smoothen the top surface of the film. A subsequent layer is then deposited onto the polished top surface of the film. A top surface of the subsequent layer has a reduced roughness by being deposited on the polished top surface of the film.

Abstract: A method for applying a protective layer to an electronic device such as the ABS of a slider, magnetic head, etc. for reducing paramagnetic deadlayer thickness includes selecting an etching angle for minimizing formation of a paramagnetic deadlayer at an interface of an electronic device and an adhesive layer subsequently formed on the electronic device, etching a surface of an electronic device at the selected angle, the selected angle being less than about 75 degrees from an imaginary line extending perpendicular to the surface, forming an adhesive layer on the etched surface of the electronic device, and forming a protective layer on the adhesive layer. A magnetic head formed by the process is also disclosed.

Abstract: A magnetic media disk has a substrate; a recording magnetic media on the substrate; and an overcoat on the recording magnetic media, the overcoat comprising a Si-based layer on the recording magnetic media, and a Ti-based layer on the Si-based layer. The magnetic media disk may be rotatably mounted to an enclosure in a hard disk drive.

Abstract: Fabrication methods for magnetic recording media that use a plasma polish are disclosed. For one exemplary method, a film of a magnetic recording medium is deposited, and a top surface of the film is polished utilizing a plasma formed by a noble gas to smoothen the top surface of the film. A subsequent layer is then deposited onto the polished top surface of the film. A top surface of the subsequent layer has a reduced roughness by being deposited on the polished top surface of the film.

Abstract: An embodiment of the invention provides an apparatus that includes: a perpendicular magnetic recording medium including a substrate, a soft under layer above the substrate, a seed layer structure above the soft under layer, wherein the seed layer structure contains Ruthenium; and a magnetic recording layer above the seed layer structure.

Abstract: A magnetic media disk has a substrate; a recording magnetic media on the substrate; and an overcoat on the recording magnetic media, the overcoat comprising a Si-based layer on the recording magnetic media, and a Ti-based layer on the Si-based layer.

Abstract: A method of fabricating media comprises forming recording media on a substrate. An overcoat is deposited on the recording media opposite the substrate. The overcoat has a first surface finish. The overcoat is etched to remove material and provide the overcoat with a second surface finish that is smoother than the first surface finish. The depositing and etching may occur sequentially in an in-situ, dry vacuum process. The second surface finish may not be mechanically processed after etching to further planarize the overcoat.

Abstract: A method of fabricating media comprises forming recording media on a substrate. An overcoat is deposited on the recording media opposite the substrate. The overcoat has a first surface finish. The overcoat is etched to remove material and provide the overcoat with a second surface finish that is smoother than the first surface finish. The depositing and etching may occur sequentially in an in-situ, dry vacuum process. The second surface finish may not be mechanically processed after etching to further planarize the overcoat.

Abstract: A slider for an information storage system. The slider comprising a single overcoat layer, wherein the layer is deposited onto an ABS of the slider by a filtered cathodic arc process, the layer having a Si/C ratio less than about 10% and a thickness of less than about 15 ?.

Abstract: An improved structure for the construction of perpendicular recording media is disclosed. The structure includes a perpendicular recording layer with at least two oxide sublayers or a lower sublayer of a non-oxide. One structure includes an upper sublayer comprised of a Silicon-oxide, while a lower sublayer is comprised of a Tantalum-oxide. The structures provide for increased coercivity and corrosion resistance.

Abstract: Perpendicular magnetic recording media and methods of fabricating perpendicular magnetic recording media are described. The perpendicular magnetic recording medium of one embodiment includes an interlayer, an underlayer, and a perpendicular magnetic recording layer. The interlayer is comprised of a Ni-alloy having the characteristics of being nonmagnetic and having an FCC structure. The alloying element for the Ni-alloy may comprise one of V or Cr, or may comprise one of V, Cr, or W. The concentration of the alloying element is set such that the concentration of the alloying element is high enough to make the Ni-alloy non-magnetic, while low enough to maintain an FCC structure for the Ni-alloy.

Abstract: An improved structure for the construction of perpendicular recording media is disclosed. The structure includes a perpendicular recording layer with at least two oxide sublayers or a lower sublayer of a non-oxide. One structure includes an upper sublayer comprised of a Silicon-oxide, while a lower sublayer is comprised of a Tantalum-oxide. The structures provide for increased coercivity and corrosion resistance.

Abstract: Perpendicular magnetic recording media and methods of fabricating perpendicular magnetic recording media are described. The perpendicular magnetic recording medium of one embodiment includes an interlayer, an underlayer, and a perpendicular magnetic recording layer. The interlayer is comprised of a Ni-alloy having the characteristics of being nonmagnetic and having an FCC structure. The alloying element for the Ni-alloy may comprise one of V or Cr, or may comprise one of V, Cr, or W. The concentration of the alloying element is set such that the concentration of the alloying element is high enough to make the Ni-alloy non-magnetic, while low enough to maintain an FCC structure for the Ni-alloy.

Abstract: A thin film structure for a magnetic thin film recording medium including a dual seed layer of RuAl/NiAlB is disclosed. The use of the RuAl/NiAlB structure provides reduced grain size, an increased Mrt orientation ratio (OR), increased SNR and lower PW50 at higher amplitude. The RuAl and NiAlB seed layers each have a B2 crystallographic structure. The RuAl/NiAlB dual seed layer can be used to obtain an underlayer with a preferred in-plane orientation of (200) and a cobalt alloy magnetic film with the preferred in-plane orientation of (11?20).

Abstract: The applicants disclose a thin film magnetic media structure with a pre-seed layer of CrTiAl. The CrTiAl pre-seed layer presents an amorphous or nanocrystalline structure. The CrTiAl pre-seed layer improves in-plane c-axis orientation while maintaining a good orientation ratio. The pulse transition width (PW50) is narrowed and the soft error rate is improved. The preferred seed layer is RuAl.

Abstract: A thin film structure for a magnetic thin film recording medium including a dual seed layer of RuAl/NiAlB is disclosed. The use of the RuAl/NiAlB structure provides reduced grain size, an increased Mrt orientation ratio (OR), increased SNR and lower PW50 at higher amplitude. The RuAl and NiAlB seed layers each have a B2 crystallographic structure. The RuAl/NiAlB dual seed layer can be used to obtain an underlayer with a preferred in-plane orientation of (200) and a cobalt alloy magnetic film with the preferred in-plane orientation of (11{overscore ( )}20).

Abstract: A thin film magnetic media structure with a bi-layer structure of amorphous chromium titanium (CrTi) followed by an amorphous layer of nickel phosphorus (NiP) is disclosed. After the NiP has been deposited it is exposed to oxygen to form an oxidized surface. Preferably the underlayer is deposited directly onto the oxidized NiP surface. The bi-layer structure of CrTi/NiP promotes excellent in-plane crystallographic orientation in the cobalt alloy magnetic layer(s) and allows: an ultra-thin chromium underlayer to be used which provides better control over grain size and distribution. When the CrTi/NiP bi-layer structure is combined with a circumferentially textured substrate, preferably glass, a high Mrt orientation ratio (OR) results.

Abstract: A thin film magnetic media structure with a bi-layer structure of amorphous chromium titanium (CrTi) followed by an amorphous layer of nickel phosphorus (NiP) is disclosed. After the NiP has been deposited it is exposed to oxygen to form an oxidized surface. Preferably the underlayer is deposited directly onto the oxidized NiP surface. The bi-layer structure of CrTi/NiP promotes excellent in-plane crystallographic orientation in the cobalt alloy magnetic layer(s) and allows an ultra-thin chromium underlayer to be used which provides better control over grain size and distribution. When the CrTi/NiP bi-layer structure is combined with a circumferentially textured substrate, preferably glass, a high Mrt orientation ratio (OR) results.

Abstract: The applicants disclose a thin film magnetic media structure with a pre-seed layer of CrTiAl. The CrTiAl pre-seed layer presents an amorphous or nanocrystalline structure. The CrTiAl pre-seed layer improves in-plane c-axis orientation while maintaining a good orientation ratio. The pulse transition width (PW50) is narrowed and the soft error rate is improved. The preferred seed layer is RuAl.

Abstract: A magnetic recording disk is provided having an amorphous preseed layer of chromium, titanium, and yttrium. The use of the preseed layer improves the magnetic performance of the disk including signal to noise, inplane orientation, and readback pulsewidth.