Abstract: A transistor device may include a substrate that has a recess and a substrate surface, wherein the recess is recessed with respect to the substrate surface. The transistor device may further include a source and a drain that overlap the substrate. The transistor device may further include a gate structure that has a first gate structure portion and a second gate structure portion, wherein the first gate structure portion is positioned inside the recess, and wherein the second gate structure portion is connected to the first gate structure and is positioned outside the first recess.

Abstract: A transistor device may include a substrate that has a recess and a substrate surface, wherein the recess is recessed with respect to the substrate surface. The transistor device may further include a source and a drain that overlap the substrate. The transistor device may further include a gate structure that has a first gate structure portion and a second gate structure portion, wherein the first gate structure portion is positioned inside the recess, and wherein the second gate structure portion is connected to the first gate structure and is positioned outside the first recess.

Abstract: In a method for managing warning information of a computing device, when an equipment fault is detected, the method determines whether or not a unique identification code of the detected equipment fault is recorded in a list. If the unique identification code of the detected equipment fault is recorded in the list, the method determines whether or not a frequency of occurrences of the detected equipment fault exceeds a preset value. If the frequency of occurrences of the detected equipment fault does not exceed a preset value, warning information of the detected equipment fault is generated. Otherwise, if the frequency of occurrences of the detected equipment fault exceeds a preset value, the method stops generating the warning information.