Abstract: The present disclosure provides a method for analyzing a minor defect based on a progressive segmentation network, including: acquiring an original image for a surface of a component, and cropping the original image into a plurality of patches; inputting each of the patches to a minor defect feature extraction network to extract an image feature; classifying the patch into a defective image or a non-defective background image according to an extracted image feature; inputting an extracted image feature of the defective image to a defect segmentation network to obtain a segmentation mask image of a corresponding defect; and quantitatively analyzing the defect according to the segmentation mask image to obtain information such as an area, a length and a width of the defect.