Patents by Inventor Qihuang Gong

Qihuang Gong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10088656
    Abstract: A stimulated-emission-depletion (STED) super-resolution microscope includes an excitation light source, a depletion light source, an excitation light expanded beam alignment system, a spiral-shaped phase plate, a Bessel beam generating system, a depletion light focus lens, a beam combination system, an objective lens, a piezoelectric scanning system, a filter, a signal collection system, and a single-photon detector. The depletion light can be a first-order Bessel beam. The depletion light has anti-scattering and self-healing characteristics, and is capable of keeping the spot shape at a deeper position of a sample, thereby improving image resolution in the deep region of the sample. Compared to conventional STED super resolution microscope of deep-layer imaging using an adjustable correction collar, the present invention is simpler in experimental operations and does not require active adjustments. Compared to adaptive optical systems, the present experimental apparatus is simpler and less expensive.
    Type: Grant
    Filed: November 20, 2015
    Date of Patent: October 2, 2018
    Assignee: Peking University
    Inventors: Kebin Shi, Peng Xi, Wentao Yu, Qihuang Gong
  • Publication number: 20180246308
    Abstract: “A stimulated-emission-depletion (STED) super-resolution microscope includes an excitation light source, a depletion light source , an excitation light expanded beam alignment system, a spiral-shaped phase plate, a Bessel beam generating system, a depletion light focus lens, a beam combination system , an objective lens, a piezoelectric scanning system, a filter, a signal collection system, and a single-photon detector. The depletion light can be a first-order Bessel beam. The depletion light has anti-scattering and self-healing characteristics, and is capable of keeping the spot shape at a deeper position of a sample, thereby improving image resolution in the deep region of the sample. Compared to conventional STED super resolution microscope of deep-layer imaging using an adjustable correction collar, the present invention is simpler in experimental operations and does not require active adjustments. Compared to adaptive optical systems, the present experimental apparatus is simpler and less expensive.
    Type: Application
    Filed: November 20, 2015
    Publication date: August 30, 2018
    Inventors: Kebin Shi, Peng Xi, Wentao Yu, Qihuang Gong