Patents by Inventor Qilin Zhang

Qilin Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250128409
    Abstract: A robotic system for use in installing final trim and assembly part includes an auto-labeling system that combines images of a primary component, such as a vehicle, with those of computer based model, where feature based object tracking methods are used to compare the two. In some forms a camera can be mounted to a moveable robot, while in other the camera can be fixed in position relative to the robot. An artificial marker can be used in some forms. Robot movement tracking can also be used. A runtime operation can utilize a deep learning network to augment feature-based object tracking to aid in initializing a pose of the vehicle as well as an aid in restoring tracking if lost.
    Type: Application
    Filed: June 17, 2021
    Publication date: April 24, 2025
    Applicant: ABB Schweiz AG
    Inventors: Yinwei Zhang, Qilin Zhang, Biao Zhang, Jorge Vidal-Ribas
  • Publication number: 20250014322
    Abstract: A robotic system capable of being trained with a plurality of images that are synthetically augmented from an initial image data set includes a training system toward that end. An image augmentation system includes in one form a neural network trained to generate synthetic images using a generative adversarial network which includes the ability to synthesize images having various poses with adjustments to image parameters such as light and color among potential others. In another form the image augmentation system includes a set of images projected or transformed from its original pose to a number of different poses using an affine transform, and the ability to progress across an entire dimensional space of anticipated robot movements which produce various potential poses.
    Type: Application
    Filed: June 17, 2021
    Publication date: January 9, 2025
    Applicant: ABB Schweiz AG
    Inventors: Qilin Zhang, Yinwei Zhang, Biao Zhang, Jorge Vidal-Ribas
  • Publication number: 20240278434
    Abstract: A robotic system for use in installing final trim and assembly part includes an auto-labeling system that combines images of a primary component, such as a vehicle, with those of computer based model, where feature based object tracking methods are used to compare the two. In some forms a camera can be mounted to a moveable robot, while in other the camera can be fixed in position relative to the robot. An artificial marker can be used in some forms. Robot movement tracking can also be used. A runtime operation can utilize a deep learning network to augment feature-based object tracking to aid in initializing a pose of the vehicle as well as an aid in restoring tracking if lost.
    Type: Application
    Filed: June 17, 2021
    Publication date: August 22, 2024
    Applicant: ABB Schweiz AG
    Inventors: Yinwei Zhang, Qilin Zhang, Biao Zhang, Jorge Vidal-Ribas
  • Patent number: 11766577
    Abstract: A flexible variable frequency ultrasonic therapeutic probe based on thermoacoustic effect of a carbon nanotube film comprises an ultrasonic sound production element, and a heat dissipation layer and an acoustic matching layer located on both sides thereof. The sound production element comprises a carbon nanotube film, metal electrodes and wires, and the shape and size of the sound production element can be adjusted according to the actual functional requirements. When a signal is accessed into the sound production element, the carbon nanotube film produces a corresponding temperature change, which causes the surrounding media to expand and contract and to excite ultrasonic waves. The present invention greatly improves the coupling efficiency between the probe and the subject, reduces the energy loss of ultrasonic waves, and enhances the uniformity of the sound intensity distribution in the affected part.
    Type: Grant
    Filed: November 18, 2022
    Date of Patent: September 26, 2023
    Assignee: DALIAN UNIVERSITY OF TECHNOLOGY
    Inventors: Zhenhuan Zhou, Yanxia Feng, Xinsheng Xu, Jiabin Sun, Qilin Zhang, Qianshou Qi, CheeWah Lim
  • Publication number: 20230173307
    Abstract: A flexible variable frequency ultrasonic therapeutic probe based on thermoacoustic effect of a carbon nanotube film comprises an ultrasonic sound production element, and a heat dissipation layer and an acoustic matching layer located on both sides thereof. The sound production element comprises a carbon nanotube film, metal electrodes and wires, and the shape and size of the sound production element can be adjusted according to the actual functional requirements. When a signal is accessed into the sound production element, the carbon nanotube film produces a corresponding temperature change, which causes the surrounding media to expand and contract and to excite ultrasonic waves. The present invention greatly improves the coupling efficiency between the probe and the subject, reduces the energy loss of ultrasonic waves, and enhances the uniformity of the sound intensity distribution in the affected part.
    Type: Application
    Filed: November 18, 2022
    Publication date: June 8, 2023
    Inventors: Zhenhuan ZHOU, Yanxia FENG, Xinsheng XU, Jiabin SUN, Qilin ZHANG, Qianshou QI, CheeWah LIM
  • Patent number: 10699135
    Abstract: Apparatus and methods are described for generating geometries for stripe-shaped objects. An image is identified that includes a roadway having one or more stripe-shaped objects. The stripe-shaped objects may include lane lines for road edges or lanes of the roadway. The stripe-shaped objects may include a barrier. At least one targeted region within the image is determined. The at least one targeted region is shaped to intersect the one or more stripe-shaped objects and includes a plurality of pixels. An image analysis is performed on the image to determine when the at least one target region includes a pixel in common with the one or more stripe-shaped objects. A geometry is constructed using the pixel in common. The geometry may be used to update a map or subsequently perform localization.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: June 30, 2020
    Assignee: HERE Global B.V.
    Inventors: Qilin Zhang, Xiang Ma, Xin Chen, Sanjay Sood, Mark Tabb, Chen Luo
  • Publication number: 20190156128
    Abstract: Apparatus and methods are described for generating geometries for stripe-shaped objects. An image is identified that includes a roadway having one or more stripe-shaped objects. The stripe-shaped objects may include lane lines for road edges or lanes of the roadway. The stripe-shaped objects may include a barrier. At least one targeted region within the image is determined. The at least one targeted region is shaped to intersect the one or more stripe-shaped objects and includes a plurality of pixels. An image analysis is performed on the image to determine when the at least one target region includes a pixel in common with the one or more stripe-shaped objects. A geometry is constructed using the pixel in common. The geometry may be used to update a map or subsequently perform localization.
    Type: Application
    Filed: November 20, 2017
    Publication date: May 23, 2019
    Inventors: Qilin Zhang, Xiang Ma, Xin Chen, Sanjay Sood, Mark Tabb, Chen Luo
  • Patent number: 9733302
    Abstract: An integrated circuit (IC) having a heat-generating element, such as a power MOSFET, a current-carrying conductor coupled to the heat-generating element, a sense conductor adjacent the current-carrying conductor, and a failure-detection circuit coupled to the sense conductor. When thermal cycling of the IC causes the resistance of the sense conductor to become greater than a temperature-dependent threshold value, the failure-detection circuit generates a signal indicating that the integrated circuit will soon fail. The resistance of the sense conductor is determined by injecting a current into the sense conductor to generate a voltage. The temperature-dependent threshold value is a voltage generated by injecting a current into a reference conductor disposed away from the current-carrying and sense conductors. A voltage comparator compares the two voltages to generate the output.
    Type: Grant
    Filed: September 6, 2015
    Date of Patent: August 15, 2017
    Assignee: NXP USA, INC.
    Inventors: Zhichen Zhang, John M. Pigott, Chuanzheng Wang, Qilin Zhang, Michael J. Zunino
  • Publication number: 20160216318
    Abstract: An integrated circuit (IC) having a heat-generating element, such as a power MOSFET, a current-carrying conductor coupled to the heat-generating element, a sense conductor adjacent the current-carrying conductor, and a failure-detection circuit coupled to the sense conductor. When thermal cycling of the IC causes the resistance of the sense conductor to become greater than a temperature-dependent threshold value, the failure-detection circuit generates a signal indicating that the integrated circuit will soon fail. The resistance of the sense conductor is determined by injecting a current into the sense conductor to generate a voltage. The temperature-dependent threshold value is a voltage generated by injecting a current into a reference conductor disposed away from the current-carrying and sense conductors. A voltage comparator compares the two voltages to generate the output.
    Type: Application
    Filed: September 6, 2015
    Publication date: July 28, 2016
    Inventors: Zhichen Zhang, John M. Pigott, Chuanzheng Wang, Qilin Zhang, Michael J. Zunino
  • Patent number: 9222968
    Abstract: A monitoring system for detecting stress degradation of a semiconductor integrated circuit has an amplifier circuit and degradation test transistors. Multiplexers are provided that have an output coupled to a respective electrode of the degradation test transistor. Each of the multiplexers has an input coupled to one of the monitor nodes and a respective node of the amplifier circuit. In operation, the multiplexers selectively insert the degradation test transistor into either the integrated circuit or the amplifier circuit so that when inserted into the integrated circuit the degradation test transistor is subjected to stress degradation voltages in the integrated circuit. When the degradation test transistor is inserted into the amplifier circuit, an output signal is generated that is indicative of stress degradation of the integrated circuit.
    Type: Grant
    Filed: November 11, 2013
    Date of Patent: December 29, 2015
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Zhichen Zhang, Chuanzheng Wang, Qilin Zhang
  • Publication number: 20150234961
    Abstract: A method for integrated circuit reliability aging simulation includes dividing a target time period into N stages including a first stage and a second stage; obtaining first parameter values of a reliability model for the first stage; performing a first simulation on the circuit based on the reliability model and the first parameter values to obtain first aging results; obtaining second parameter values of the reliability model for the second stage; and performing a second simulation on the circuit based on the reliability model and the second parameter values to obtain second aging results.
    Type: Application
    Filed: December 2, 2014
    Publication date: August 20, 2015
    Inventors: Zhichen Zhang, Xavier Hours, Mehul D. Shroff, Chuanzheng Wang, Qilin Zhang
  • Publication number: 20140191777
    Abstract: A monitoring system for detecting stress degradation of a semiconductor integrated circuit has an amplifier circuit and degradation test transistors. Multiplexers are provided that have an output coupled to a respective electrode of the degradation test transistor. Each of the multiplexers has an input coupled to one of the monitor nodes and a respective node of the amplifier circuit. In operation, the multiplexers selectively insert the degradation test transistor into either the integrated circuit or the amplifier circuit so that when inserted into the integrated circuit the degradation test transistor is subjected to stress degradation voltages in the integrated circuit. When the degradation test transistor is inserted into the amplifier circuit, an output signal is generated that is indicative of stress degradation of the integrated circuit.
    Type: Application
    Filed: November 11, 2013
    Publication date: July 10, 2014
    Inventors: Zhichen Zhang, Chuanzheng Wang, Qilin Zhang