Patents by Inventor Qing Qian

Qing Qian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6946667
    Abstract: An ion implantation method is disclosed in this invention. The disclosed method is for implanting a target wafer with ions extracted from an ion source traveling along an original ion beam path. The method includes steps of a) employing a set of deceleration electrodes disposed along the original ion beam path before the target wafer for decelerating and deflecting the ion beam to the target wafer; and b) employing a charged particle deflecting means disposed between the ion source and the set of deceleration electrodes for deflecting the ion beam away from original ion beam path and projecting to the set of electrodes with an incident angle for the set of electrodes to deflect the ion beam back to the original ion beam path for implanting the target wafer.
    Type: Grant
    Filed: November 19, 2002
    Date of Patent: September 20, 2005
    Assignee: Advanced Ion Beam Technology, Inc.
    Inventors: Jiong Chen, Zhming Wan, Qing Qian
  • Patent number: 6896809
    Abstract: One method for purifying a chitosan starting material includes contacting it with at least one treatment agent selected from a protein-complexing agent, a metal-chelating agent, and a metal-complexing agent under pH conditions effective for forming a water insoluble chitosan precipitate and at least one water soluble material selected from a water soluble protein complex, a water soluble metal chelate, and a water soluble metal complex. Another variant involves solubilizing the chitosan starting material in an aqueous solution to produce an intermediate chitosan material. The intermediate chitosan material is contacted with a deproteinization agent and/or a demetallization agent under pH conditions effective for forming a water insoluble chitosan precipitate and at least one water soluble material that includes the pre-existing impurity. In both methods, the water insoluble chitosan precipitate and the water soluble material are separated resulting in a purified chitosan material.
    Type: Grant
    Filed: December 20, 2002
    Date of Patent: May 24, 2005
    Assignee: Providence Health System - Oregon
    Inventors: Rui Qing Qian, Robert W. Glanville
  • Publication number: 20040118778
    Abstract: One method for purifying a chitosan starting material includes contacting it with at least one treatment agent selected from a protein-complexing agent, a metal-chelating agent, and a metal-complexing agent under pH conditions effective for forming a water insoluble chitosan precipitate and at least one water soluble material selected from a water soluble protein complex, a water soluble metal chelate, and a water soluble metal complex. Another variant involves solubilizing the chitosan starting material in an aqueous solution to produce an intermediate chitosan material. The intermediate chitosan material is contacted with a deproteinization agent and/or a demetallization agent under pH conditions effective for forming a water insoluble chitosan precipitate and at least one water soluble material that includes the pre-existing impurity. In both methods, the water insoluble chitosan precipitate and the water soluble material are separated resulting in a purified chitosan material.
    Type: Application
    Filed: December 20, 2002
    Publication date: June 24, 2004
    Applicant: Providence Health System
    Inventors: Rui Qing Qian, Robert W. Glanville
  • Publication number: 20030066976
    Abstract: An ion implantation method is disclosed in this invention. The disclosed method is for implanting a target wafer with ions extracted from an ion source traveling along an original ion beam path. The method includes steps of a) employing a set of deceleration electrodes disposed along the original ion beam path before the target wafer for decelerating and deflecting the ion beam to the target wafer; and b) employing a charged particle deflecting means disposed between the ion source and the set of deceleration electrodes for deflecting the ion beam away from original ion beam path and projecting to the set of electrodes with an incident angle for the set of electrodes to deflect the ion beam back to the original ion beam path for implanting the target wafer.
    Type: Application
    Filed: November 19, 2002
    Publication date: April 10, 2003
    Inventors: Jiong Chen, Zhmin Wan, Qing Qian