Abstract: The synthesis of ordered arrays of GSC's by re-growth from pre-patterned seed crystals that offer an approach for scalable fabrication of single crystal graphene devices while avoiding domain boundaries is demonstrated herein. Each graphene island is a single crystal and every graphene island is of similar size. The size of graphene island arrays can be as small as less than 1 mm2 or as large as several m2. The distance between each GSC island is also adjustable from several micrometers to millimeters. All of the graphene islands are addressable for devices and electrical circuit fabrication.

Abstract: The present disclosure demonstrates the synthesis of ordered arrays of GSC's by re-growth from pre-patterned seed crystals, offering an approach for scalable fabrication of single crystal graphene devices while avoiding domain boundaries. Each graphene island is a single crystal and every graphene island is of similar size. The size of graphene island arrays can be as small as less than 1 mm2 or as large as several m2. The distance between each GSC island is also adjustable from several micrometers to millimeters. All of the graphene islands are addressable for devices and electrical circuit fabrication.

Abstract: Thin and short cantilevers possess both a low force constant and a high resonance frequency, thus are highly desirable for atomic force microscope (AFM) imaging and force measurement. According to some embodiments, the invention provides small silicon (Si) cantilevers integrated with a Si tip, for example fabricated from SOI wafers that are used for reducing the variation of thickness of the cantilevers. In one example, the fabrication process provided SOI chips containing 40 silicon cantilevers integrating with an ultra-sharp Si tip. The resolution of images obtained with these tips was much higher than those obtained with the commercial tips, while the force constants were much less, that is, more suitable for imaging soft samples.

Abstract: Thin and short cantilevers possess both a low force constant and a high resonance frequency, thus are highly desirable for atomic force microscope (AFM) imaging and force measurement. According to some embodiments, the invention provides small silicon (Si) cantilevers integrated with a Si tip, for example fabricated from SOI wafers that are used for reducing the variation of thickness of the cantilevers. In one example, the fabrication process provided SOI chips containing 40 silicon cantilevers integrating with an ultra-sharp Si tip. The resolution of images obtained with these tips was much higher than those obtained with the commercial tips, while the force constants were much less, that is, more suitable for imaging soft samples.