Abstract: The present invention discloses a highly reliable implantable device of an implantable biological sensor. Before use, the fixed seat cannot move relative to the slidable seat, achieving reliable transportation. In use, the lower end face of the slidable seat is pressed against the skin; the lower end face of the first snap-fit protrusion squeezes the upper end face of the vertical snap-fit plate; the first snap-fit protrusion is gradually away from the support of the vertical snap-fit plate, whereby the inside vertical face of the vertical snap-fit plate pushes the first snap-fit protrusion inward, and the fixed seat moves downward relative to the slidable seat, achieving good controllability.

Abstract: A storage circuit stores secret information. A software processing circuit obtains an operation task and generates scheduling instructions corresponding to the operation task. After receiving the scheduling instructions, a hardware processing circuit obtains the secret information from the storage circuit when the flag bit in the scheduling instruction is a valid value, determines, based on the secret information, data addresses of one or more pieces of operation data required for completing the operation corresponding to the scheduling instruction, and obtains the one or more pieces of operation data based on the data addresses to complete the operation corresponding to each scheduling instruction.

Abstract: Provided is a method for determining a rotation speed of a gantry. The method includes: acquiring control information of the gantry, wherein the control information of the gantry includes: leaf information and dose information of control points; determining the rotation speed of the gantry and dose rates at the control points based on the leaf information and the dose information of the control points; and adjusting the rotation speed of the gantry based on the dose rates at the control points and a maximum equipment dose rate.

Abstract: A storage circuit stores secret information. A software processing circuit obtains an operation task and generates scheduling instructions corresponding to the operation task. After receiving the scheduling instructions, a hardware processing circuit obtains the secret information from the storage circuit when the flag bit in the scheduling instruction is a valid value, determines, based on the secret information, data addresses of one or more pieces of operation data required for completing the operation corresponding to the scheduling instruction, and obtains the one or more pieces of operation data based on the data addresses to complete the operation corresponding to each scheduling instruction.

Abstract: A method for transmitting data comprising a data requester sends, to a data sender, a data request that carries an identifier of the data requester and a category of requested data. After receiving the data request, the data sender generates an identifier public key using the identifier of the data requester and the category of the data. The data sender encrypts the data requested by the data requester using the identity public key, and sends the encrypted data and identity public key indication information to the data requester. The data requester decrypts the encrypted data using an identifier private key corresponding to the identifier public key to obtain the requested data, and the data requester performs decryption using the identifier private key.

Abstract: A tunnel boring robot includes a tunnel boring machine, a sensing unit, an intelligent decision unit, and a controller unit. The sensing unit, the intelligent decision unit and the controller unit are disposed at the tunnel boring machine. The sensing unit is configured to sense, in real time, boring operation data of a current cycle during which the tunnel boring machine is working according to set boring parameter information. The intelligent decision unit is configured to receive the boring operation data sent by the sensing unit, and generate the set boring parameter information for a next cycle according to a preset prediction algorithm, the boring operation data and a desired boring effect. The controller unit is configured to receive the set boring parameter information, and control the tunnel boring machine to perform a boring operation for the next cycle according to the set boring parameter information.

Abstract: A tunnel boring robot includes a tunnel boring machine, a sensing unit, an intelligent decision unit, and a controller unit. The sensing unit, the intelligent decision unit and the controller unit are disposed at the tunnel boring machine. The sensing unit is configured to sense, in real time, boring operation data of a current cycle during which the tunnel boring machine is working according to set boring parameter information. The intelligent decision unit is configured to receive the boring operation data sent by the sensing unit, and generate the set boring parameter information for a next cycle according to a preset prediction algorithm, the boring operation data and a desired boring effect. The controller unit is configured to receive the set boring parameter information, and control the tunnel boring machine to perform a boring operation for the next cycle according to the set boring parameter information.

Abstract: A data collection method, apparatus, and system to reduce a degree of coupling between an application and processing and configuration operations related to data collection. In the data collection method, information of an application is obtained based on an application framework layer of an operating system, application data collection configuration information is queried based on the information to obtain data collection configuration information of the application, and application data of the application is collected based on the data collection configuration information of the application using an interface provided by the application framework layer of the operating system. The information is used to identify the application.

Abstract: A device and method of testing the dual-frequency nonlinear vector network parameters. In view of the challenge of the nonlinear behavioral model characterization of the microwave device components, and the current situation of the nonlinear vector network parameter testing, the disclosed device and method of testing the dual-frequency nonlinear vector network parameters redefines the nonlinear model parameters of the nonlinear device components, gives the definition of the test parameter (W-parameter), solves the challenges of the dual-frequency nonlinear behavioral model characterization and testing for the microwave device components, and makes it more convenient to measure the nonlinear characteristics of the mixer, amplifier and passive device components.

Abstract: A device and method of testing the dual-frequency nonlinear vector network parameters. In view of the challenge of the nonlinear behavioral model characterization of the microwave device components, and the current situation of the nonlinear vector network parameter testing, the disclosed device and method of testing the dual-frequency nonlinear vector network parameters redefines the nonlinear model parameters of the nonlinear device components, gives the definition of the test parameter (W-parameter), solves the challenges of the dual-frequency nonlinear behavioral model characterization and testing for the microwave device components, and makes it more convenient to measure the nonlinear characteristics of the mixer, amplifier and passive device components.

Abstract: A method of feeding underfill material to fill a space between a semiconductor die and a substrate onto which the semiconductor die has been bonded, the method comprises positioning a stencil over the semiconductor die. The stencil has an elongated slot extending adjacent to an edge of the semiconductor die. Underfill material is printed through the slot such that the underfill material falls through the slot onto the substrate next to the edge of the semiconductor die. Thereafter, the underfill material is heated such that the underfill material flows across the space between the semiconductor die and the substrate from the edge of the semiconductor die to an opposite edge thereof through capillary action.

Abstract: A method of feeding underfill material to fill a space between a semiconductor die and a substrate onto which the semiconductor die has been bonded, the method comprises positioning a stencil over the semiconductor die. The stencil has an elongated slot extending adjacent to an edge of the semiconductor die. Underfill material is printed through the slot such that the underfill material falls through the slot onto the substrate next to the edge of the semiconductor die. Thereafter, the underfill material is heated such that the underfill material flows across the space between the semiconductor die and the substrate from the edge of the semiconductor die to an opposite edge thereof through capillary action.