Patents by Inventor Qingying Hu

Qingying Hu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9007689
    Abstract: Disclosed are method and apparatus for forming multiple images of an object comprising a plurality of depth segments. An optical system comprises an infinity optical subsystem and a multi-image optical subsystem. The infinity optical subsystem is configured to receive light from the object and form a first image focussed at infinity. A multi-image optical subsystem is configured to receive the first image and form multiple images via multiple focussing lenses. Each multiple image can correspond to a different depth segment. A portion of the light from the first image can also be filtered before entering a focussing lens. Multiple images under different filtering conditions, corresponding to different depth segments or to the same depth segment, can be formed.
    Type: Grant
    Filed: April 4, 2011
    Date of Patent: April 14, 2015
    Assignee: General Electric Company
    Inventors: Gil Abramovich, Kevin George Harding, Robert William Tait, Mark Marshall Meyers, Qingying Hu
  • Patent number: 8406487
    Abstract: This invention provides a method for contactless fingerprint detection and verification comprising illuminating a fingerprint and directing a reflected light through an imaging system using liquid crystal panels and birefringent elements to polarize the light. A plurality of polarized images are captured and used to calculate the depth of structural features on the fingertip. A means to generate a two-dimensional rolled equivalent image of the fingerprint is also provided which may then be used for verification and authentication. The invention also provides an imaging system for carrying out the method.
    Type: Grant
    Filed: January 27, 2010
    Date of Patent: March 26, 2013
    Assignee: General Electric Company
    Inventors: Gil Abramovich, Kevin George Harding, Qingying Hu, Swaminathan Manickam, Meena Ganesh, Christopher Allen Nafis
  • Publication number: 20130057650
    Abstract: An optical gage (10) with a small field of view for three-dimensional surface profile measurement includes a projector (20) having a light source (22) and projection optics (28, 30, 42) that guide light along a projection light path. An optical grating device (34) is arranged in the projection light path and modifies the projection light distribution to project a structured light pattern (46). A phase shifting apparatus (47) shifts the structured light pattern to at least three positions with desired phase shift on said surface (80) to be measured. A viewer (50) includes viewing optics with a viewing light path that is non-parallel to the projection light path, a light sensing array (58) for sensing images of diffuse reflections of the structured light patterns from said surface, and a camera (57) for recording the images.
    Type: Application
    Filed: March 19, 2009
    Publication date: March 7, 2013
    Inventors: Guiju Song, Kevin George Harding, Ming Jia, Bo Yang, Qingying Hu, Jianming Zheng, Li Tao
  • Publication number: 20120250159
    Abstract: Disclosed are method and apparatus for forming multiple images of an object comprising a plurality of depth segments. An optical system comprises an infinity optical subsystem and a multi-image optical subsystem. The infinity optical subsystem is configured to receive light from the object and form a first image focussed at infinity. A multi-image optical subsystem is configured to receive the first image and form multiple images via multiple focussing lenses. Each multiple image can correspond to a different depth segment. A portion of the light from the first image can also be filtered before entering a focussing lens. Multiple images under different filtering conditions, corresponding to different depth segments or to the same depth segment, can be formed.
    Type: Application
    Filed: April 4, 2011
    Publication date: October 4, 2012
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Gil Abramovich, Kevin George Harding, Robert William Tait, Mark Marshall Meyers, Qingying Hu
  • Publication number: 20110064282
    Abstract: This invention provides a method for contactless fingerprint detection and verification comprising illuminating a fingerprint and directing a reflected light through an imaging system using liquid crystal panels and birefringent elements to polarize the light. A plurality of polarized images are captured and used to calculate the depth of structural features on the fingertip. A means to generate a two-dimensional rolled equivalent image of the fingerprint is also provided which may then be used for verification and authentication. The invention also provides an imaging system for carrying out the method.
    Type: Application
    Filed: January 27, 2010
    Publication date: March 17, 2011
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Gil Abramovich, Kevin George Harding, Qingying Hu, Swaminathan Manickam, Meena Ganesh, Christopher Allen Nafis
  • Patent number: 7595894
    Abstract: A profilometry apparatus is provided. The profilometry apparatus includes a fringe projection device configured to project a fringe pattern on an object and an optical unit configured to capture an image of a distorted fringe pattern modulated by the object. The profilometry apparatus also includes a signal processing unit configured to process the captured image from the optical unit to filter noise from the image and to obtain real-time estimation of parameters associated with manufacture or repair of the object.
    Type: Grant
    Filed: June 2, 2006
    Date of Patent: September 29, 2009
    Assignee: General Electric Company
    Inventors: Qingying Hu, Magdi Naim Azer, Kevin George Harding, John Broddus Deaton, Jr., Sudhir Kumar Tewari
  • Patent number: 7365862
    Abstract: A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto an object, and an imaging sensor for receiving light reflected from the object. The method includes determining a profile of the object to be inspected, and generating an electronic mask based on the determined object profile. The electronic mask has an electronic opening having a profile defined to substantially match the determined object profile as viewed from one of the light source and the imaging sensor.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: April 29, 2008
    Assignee: General Electric Company
    Inventors: Qingying Hu, Kevin George Harding, Joseph Benjamin Ross, Donald Wagner Hamilton
  • Publication number: 20070279639
    Abstract: A profilometry apparatus is provided. The profilometry apparatus includes a fringe projection device configured to project a fringe pattern on an object and an optical unit configured to capture an image of a distorted fringe pattern modulated by the object. The profilometry apparatus also includes a signal processing unit configured to process the captured image from the optical unit to filter noise from the image and to obtain real-time estimation of parameters associated with manufacture or repair of the object.
    Type: Application
    Filed: June 2, 2006
    Publication date: December 6, 2007
    Inventors: Qingying Hu, Magdi Naim Azer, Kevin George Harding, John Broddus Deaton, Sudhir Kumar Tewari
  • Patent number: 7301165
    Abstract: A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: November 27, 2007
    Assignee: General Electric Company
    Inventors: Qingying Hu, Kevin George Harding, Joseph Benjamin Ross, Xiaoping Qian
  • Patent number: 7302109
    Abstract: An image processing method for structured light profiling includes sampling an image of a structured light pattern to obtain an intensity distribution, selecting a number of sets of sampled points from the intensity distribution. Each of the respective sets includes a number of sampled points. The image processing method further includes fitting each of the sets of sampled points to a respective distribution function and filtering the distribution functions to select a representative distribution function for the intensity distribution.
    Type: Grant
    Filed: August 28, 2003
    Date of Patent: November 27, 2007
    Assignee: General Electric Company
    Inventors: Qingying Hu, Kevin George Harding, Joseph Benjamin Ross, Peter William Lorraine
  • Publication number: 20070091321
    Abstract: A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto an object, and an imaging sensor for receiving light reflected from the object. The method includes determining a profile of the object to be inspected, and generating an electronic mask based on the determined object profile. The electronic mask has an electronic opening having a profile defined to substantially match the determined object profile as viewed from one of the light source and the imaging sensor.
    Type: Application
    Filed: October 24, 2005
    Publication date: April 26, 2007
    Inventors: Qingying Hu, Kevin Harding, Joseph Ross, Donald Hamilton
  • Publication number: 20070090309
    Abstract: A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.
    Type: Application
    Filed: October 24, 2005
    Publication date: April 26, 2007
    Inventors: Qingying Hu, Kevin Harding, Joseph Ross, Xiaoping Qian
  • Publication number: 20070090310
    Abstract: A method for inspecting an object using a structured light measurement system that includes a light source and an imaging sensor includes illuminating each of a plurality of different areas of the object with different wavelengths of light using the light source, filtering light reflected from the object into a first wavelength of the different wavelengths, and receiving the first wavelength of light reflected from the object with the imaging sensor.
    Type: Application
    Filed: October 24, 2005
    Publication date: April 26, 2007
    Inventors: Donald Hamilton, Qingying Hu, Kevin Harding, Joseph Ross
  • Publication number: 20060072122
    Abstract: In accordance with one aspect of the present technique, a system for measuring a shape of an object is provided. The system comprises a projection system operable to project a fringe pattern having a reference mark onto the object. The system further comprises an image-processing system operable to capture an image of the fringe pattern modulated by the object. The image-processing system is further operable to identify the reference mark in the image of the fringe pattern to construct a shape of the object based on the reference mark.
    Type: Application
    Filed: September 30, 2004
    Publication date: April 6, 2006
    Inventors: Qingying Hu, Kevin Harding
  • Publication number: 20050046872
    Abstract: An image processing method for structured light profiling includes sampling an image of a structured light pattern to obtain an intensity distribution, selecting a number of sets of sampled points from the intensity distribution. Each of the respective sets includes a number of sampled points. The image processing method further includes fitting each of the sets of sampled points to a respective distribution function and filtering the distribution functions to select a representative distribution function for the intensity distribution.
    Type: Application
    Filed: August 28, 2003
    Publication date: March 3, 2005
    Inventors: Qingying Hu, Kevin Harding, Joseph Ross, Peter Lorraine
  • Patent number: 6788210
    Abstract: A three dimensional surface contouring and ranging system (10) based on a digital fringe projection (18) and phase shifting technique is disclosed. In the system, three phase-shifted fringe patterns and an absolute phase mark pattern are used to determine the absolute phase map of the object (12). The phase map is then converted to the absolute x, y, and z coordinates of the object surface by a transformation algorithm. A calibration procedure is used to determine accurate values of system parameters required by the transformation algorithm. The parameters are initially indirectly measured through experiments to determine their approximate values. A calibration plate is then measured by the system at various positions. An iteration algorithm is then used to estimate the system parameters.
    Type: Grant
    Filed: August 5, 2002
    Date of Patent: September 7, 2004
    Assignee: The Research Foundation of State University of New York
    Inventors: Peisen Huang, Qingying Hu, Fu-Pen Chiang