Patents by Inventor Qingze Zou

Qingze Zou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10041970
    Abstract: A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.
    Type: Grant
    Filed: July 14, 2015
    Date of Patent: August 7, 2018
    Assignee: RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
    Inventors: Qingze Zou, Juan Ren, Jiangbo Liu
  • Publication number: 20170199219
    Abstract: A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.
    Type: Application
    Filed: July 14, 2015
    Publication date: July 13, 2017
    Applicant: Rutgers, The State University of New Jersey
    Inventors: Qingze Zou, Juan Ren, Jiangbo Liu
  • Patent number: 8973161
    Abstract: A control-based approach is provided for achieving accurate indentation quantification in broadband and in-liquid nanomechanical property measurements using atomic force microscope (AFM). Accurate indentation measurement is desirable for probe-based material property characterization because the force applied and the indentation generated are the fundamental physical variables that are measured in the characterization process. Large measurement errors, however, occur when the measurement frequency range becomes large (i.e., broadband), or the indentation is measured in liquid on soft materials. Such large measurement errors are generated due to the inability of the conventional method to account for the convolution of the instrument dynamics with the viscoelastic response of the soft sample when the measurement frequency becomes large, and the random-like thermal drift and the distributive hydrodynamic force effects when measuring the indentation in liquid.
    Type: Grant
    Filed: June 24, 2013
    Date of Patent: March 3, 2015
    Assignee: Rutgers, The State University of New Jersey
    Inventors: Qingze Zou, Juan Ren
  • Publication number: 20130347147
    Abstract: A control-based approach is provided for achieving accurate indentation quantification in broadband and in-liquid nanomechanical property measurements using atomic force microscope (AFM). Accurate indentation measurement is desirable for probe-based material property characterization because the force applied and the indentation generated are the fundamental physical variables that are measured in the characterization process. Large measurement errors, however, occur when the measurement frequency range becomes large (i.e., broadband), or the indentation is measured in liquid on soft materials. Such large measurement errors are generated due to the inability of the conventional method to account for the convolution of the instrument dynamics with the viscoelastic response of the soft sample when the measurement frequency becomes large, and the random-like thermal drift and the distributive hydrodynamic force effects when measuring the indentation in liquid.
    Type: Application
    Filed: June 24, 2013
    Publication date: December 26, 2013
    Inventors: Qingze Zou, Juan Ren
  • Patent number: 8590061
    Abstract: An optimal input design method and apparatus to achieve rapid broadband nanomechanical measurements of soft materials using the indentation-based method for the investigation of fast evolving phenomenon, such as the crystallization process of polymers, the nanomechanical measurement of live cell during cell movement, and force volume mapping of nonhomogeneous materials, are presented. The indentation-based nanomechanical measurement provides unique quantification of material properties at specified locations. Particularly, an input force profile with discrete spectrum is optimized to maximize the Fisher information matrix of the linear compliance model of the soft material.
    Type: Grant
    Filed: March 21, 2012
    Date of Patent: November 19, 2013
    Assignee: Iowa State University Research Foundation, Inc.
    Inventors: Qingze Zou, Zhonghua Xu
  • Patent number: 7035042
    Abstract: A method useful to change a system's output from one value to another within a prescribed time-interval in an optimal manner using optimization criteria such as minimal time (e.g., to increase throughput) or minimal energy (e.g., to reduce heat dissipation and reduce induced vibrations). Optimal design of maneuvers (such as fast seek and scanning) that rapidly change the output from one value to another, arise in flexible structure applications, including rapidly positioning the end-point of large-scale space manipulators, positioning of read/write heads of disk-drive servo systems, which are relatively medium-scale flexible structures, and nano-scale positioning and manipulation using relatively small-scale piezo actuators. Maintaining a position of an element constant outside of the transition time-interval is critical in many applications.
    Type: Grant
    Filed: November 21, 2003
    Date of Patent: April 25, 2006
    Assignee: University of Washington
    Inventors: Santosh Devasia, Qingze Zou, Dhanakorn Iamratanakul, Héctor Ramiro Pérez Rodriguez
  • Publication number: 20040233570
    Abstract: A method useful to change a system's output from one value to another within a prescribed time-interval in an optimal manner using optimization criteria such as minimal time (e.g., to increase throughput) or minimal energy (e.g., to reduce heat dissipation and reduce induced vibrations). Optimal design of maneuvers (such as fast seek and scanning) that rapidly change the output from one value to another, arise in flexible structure applications, including rapidly positioning the end-point of large-scale space manipulators, positioning of read/write heads of disk-drive servo systems, which are relatively medium-scale flexible structures, and nano-scale positioning and manipulation using relatively small-scale piezo actuators. Maintaining a position of an element constant outside of the transition time-interval is critical in many applications.
    Type: Application
    Filed: November 21, 2003
    Publication date: November 25, 2004
    Applicant: University of Washington
    Inventors: Santosh Devasia, Qingze Zou, Dhanakorn Iamratanakul, Hector Ramiro Perez Rodriguez